{"id":"https://openalex.org/W1990296406","doi":"https://doi.org/10.1038/srep02482","title":"Coexistence of high performance resistance and capacitance memory based on multilayered metal-oxide structures","display_name":"Coexistence of high performance resistance and capacitance memory based on multilayered metal-oxide structures","publication_year":2013,"publication_date":"2013-08-21","ids":{"openalex":"https://openalex.org/W1990296406","doi":"https://doi.org/10.1038/srep02482","mag":"1990296406","pmid":"https://pubmed.ncbi.nlm.nih.gov/23963467","pmcid":"https://www.ncbi.nlm.nih.gov/pmc/articles/3748856"},"language":"en","primary_location":{"id":"doi:10.1038/srep02482","doi":"https://doi.org/10.1038/srep02482","is_oa":true,"landing_page_url":"https://doi.org/10.1038/srep02482","pdf_url":"https://www.nature.com/articles/srep02482.pdf","source":{"id":"https://openalex.org/S196734849","display_name":"Scientific Reports","issn_l":"2045-2322","issn":["2045-2322"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","cwts-core","doaj","dongbi-c","doyens","jufo-1","ki-jl-1","medline","norway-1","poland-140","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319908","host_organization_name":"Nature Portfolio","host_organization_lineage":["https://openalex.org/P4310319908","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Nature Portfolio","Springer Nature"],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Scientific Reports","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.nature.com/articles/srep02482.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069492500","display_name":"Z. B. Yan","orcid":"https://orcid.org/0000-0002-2306-0239","observed_orcids":["https://orcid.org/0000-0002-2306-0239"]},"institutions":[{"id":"https://openalex.org/I881766915","display_name":"Nanjing University","ror":"https://ror.org/01rxvg760","country_code":"CN","type":"education","lineage":["https://openalex.org/I881766915"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Z. B. Yan","raw_affiliation_strings":["Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, P R China. zbyan37@gmail.com","Laboratory of Solid State Microstructures, Nanjing University, Nanjing, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, P R China. zbyan37@gmail.com","institution_ids":["https://openalex.org/I881766915"]},{"raw_affiliation_string":"Laboratory of Solid State Microstructures, Nanjing University, Nanjing, P. R. China","institution_ids":["https://openalex.org/I881766915"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025127998","display_name":"Jun\u2010Ming Liu","orcid":"https://orcid.org/0000-0001-8988-8429","observed_orcids":["https://orcid.org/0000-0001-8988-8429"]},"institutions":[{"id":"https://openalex.org/I881766915","display_name":"Nanjing University","ror":"https://ror.org/01rxvg760","country_code":"CN","type":"education","lineage":["https://openalex.org/I881766915"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"J. -M. Liu","raw_affiliation_strings":["Laboratory of Solid State Microstructures, Nanjing University, Nanjing, 210093, P.R. China","Laboratory of Solid State Microstructures, Nanjing University, Nanjing, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of Solid State Microstructures, Nanjing University, Nanjing, 210093, P.R. China","institution_ids":["https://openalex.org/I881766915"]},{"raw_affiliation_string":"Laboratory of Solid State Microstructures, Nanjing University, Nanjing, P. R. China","institution_ids":["https://openalex.org/I881766915"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5025127998","https://openalex.org/A5069492500"],"corresponding_institution_ids":["https://openalex.org/I881766915"],"apc_list":{"value":2690,"currency":"USD","value_usd":2690},"apc_paid":{"value":2690,"currency":"USD","value_usd":2690},"fwci":2.5961,"has_fulltext":true,"cited_by_count":89,"citation_normalized_percentile":{"value":0.89658137,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":100},"biblio":{"volume":"3","issue":"1","first_page":"2482","last_page":"2482"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.0026000000070780516,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/memristors","display_name":"memristors","score":0.8820000290870667},{"id":"https://openalex.org/keywords/memcapacitor","display_name":"memcapacitor","score":1.0},{"id":"https://openalex.org/keywords/dymno3","display_name":"DyMnO3","score":0.8180000185966492},{"id":"https://openalex.org/keywords/nb-doped-srtio3","display_name":"Nb-doped SrTiO3","score":0.9610000252723694},{"id":"https://openalex.org/keywords/resistive-switching","display_name":"resistive switching","score":0.6470000147819519},{"id":"https://openalex.org/keywords/ferroelectric-polarization-switching","display_name":"ferroelectric switching","score":0.6850000023841858},{"id":"https://openalex.org/keywords/au-electrodes","display_name":"Au electrodes","score":0.34200000762939453},{"id":"https://openalex.org/keywords/nonlinear-resistors","display_name":"nonlinear resistors","score":0.5659999847412109},{"id":"https://openalex.org/keywords/switching-time","display_name":"switching time","score":0.6050000190734863},{"id":"https://openalex.org/keywords/intermediate-state","display_name":"intermediate state","score":0.3889999985694885}],"concepts":[{"id":"https://openalex.org/C9395851","wikidata":"https://www.wikidata.org/wiki/Q177929","display_name":"Stack (abstract data type)","level":2,"score":0.8370527029037476},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.8123540878295898},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.7424508929252625},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7291157841682434},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.6946907639503479},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5901819467544556},{"id":"https://openalex.org/C150072547","wikidata":"https://www.wikidata.org/wiki/Q212923","display_name":"Memristor","level":2,"score":0.5833700299263},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.561639130115509},{"id":"https://openalex.org/C544153396","wikidata":"https://www.wikidata.org/wiki/Q11426","display_name":"Metal","level":2,"score":0.46336835622787476},{"id":"https://openalex.org/C3020444241","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"High resistance","level":2,"score":0.4534556567668915},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3901628851890564},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3002963662147522},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.2377881109714508},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.15078780055046082},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.13504314422607422},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.07089340686798096},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C6557445","wikidata":"https://www.wikidata.org/wiki/Q173113","display_name":"Agronomy","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0}],"mesh":[{"descriptor_ui":"D004581","descriptor_name":"Electronics","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":true},{"descriptor_ui":"D004867","descriptor_name":"Equipment Design","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D008422","descriptor_name":"Materials Testing","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D008670","descriptor_name":"Metals","qualifier_ui":"Q000737","qualifier_name":"chemistry","is_major_topic":true},{"descriptor_ui":"D010087","descriptor_name":"Oxides","qualifier_ui":"Q000737","qualifier_name":"chemistry","is_major_topic":true},{"descriptor_ui":"D016248","descriptor_name":"Computer Storage Devices","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D019544","descriptor_name":"Equipment Failure Analysis","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D025802","descriptor_name":"Electric Capacitance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D055672","descriptor_name":"Static Electricity","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false}],"locations_count":4,"locations":[{"id":"doi:10.1038/srep02482","doi":"https://doi.org/10.1038/srep02482","is_oa":true,"landing_page_url":"https://doi.org/10.1038/srep02482","pdf_url":"https://www.nature.com/articles/srep02482.pdf","source":{"id":"https://openalex.org/S196734849","display_name":"Scientific Reports","issn_l":"2045-2322","issn":["2045-2322"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","cwts-core","doaj","dongbi-c","doyens","jufo-1","ki-jl-1","medline","norway-1","poland-140","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319908","host_organization_name":"Nature Portfolio","host_organization_lineage":["https://openalex.org/P4310319908","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Nature Portfolio","Springer Nature"],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Scientific Reports","raw_type":"journal-article"},{"id":"pmh:oai:europepmc.org:2740165","doi":null,"is_oa":true,"landing_page_url":"http://europepmc.org/articles/PMC3748856","pdf_url":null,"source":{"id":"https://openalex.org/S4306400806","display_name":"Europe PMC (PubMed Central)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1303153112","host_organization_name":"European Bioinformatics Institute","host_organization_lineage":["https://openalex.org/I1303153112"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"","raw_type":"Text"},{"id":"pmh:oai:pubmedcentral.nih.gov:3748856","doi":null,"is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/3748856","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sci Rep","raw_type":"Text"},{"id":"pmid:23963467","doi":null,"is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/23963467","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Scientific reports","raw_type":"Journal Article"}],"best_oa_location":{"id":"doi:10.1038/srep02482","doi":"https://doi.org/10.1038/srep02482","is_oa":true,"landing_page_url":"https://doi.org/10.1038/srep02482","pdf_url":"https://www.nature.com/articles/srep02482.pdf","source":{"id":"https://openalex.org/S196734849","display_name":"Scientific Reports","issn_l":"2045-2322","issn":["2045-2322"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","cwts-core","doaj","dongbi-c","doyens","jufo-1","ki-jl-1","medline","norway-1","poland-140","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319908","host_organization_name":"Nature Portfolio","host_organization_lineage":["https://openalex.org/P4310319908","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Nature Portfolio","Springer Nature"],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Scientific Reports","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G523502583","display_name":null,"funder_award_id":"2009CB623303","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G598416370","display_name":"\u7b2cII\u7c7b\u65b0\u578b\u591a\u94c1\u6027\u5fae\u89c2\u673a\u5236\u4e0e\u94c1\u6027\u5e8f\u8026\u5408\u7814\u7a76","funder_award_id":"11234005","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6347774642","display_name":null,"funder_award_id":"11074113","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321543","display_name":"China Postdoctoral Science Foundation","ror":"https://ror.org/0426zh255"},{"id":"https://openalex.org/F4320327518","display_name":"Priority Academic Program Development of Jiangsu Higher Education Institutions","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W1990296406.pdf","grobid_xml":"https://content.openalex.org/works/W1990296406.grobid-xml"},"referenced_works_count":30,"referenced_works":["https://openalex.org/W1486845324","https://openalex.org/W1515451673","https://openalex.org/W1536735025","https://openalex.org/W1602563302","https://openalex.org/W1972418424","https://openalex.org/W1979881347","https://openalex.org/W1989725244","https://openalex.org/W1990522939","https://openalex.org/W1992529265","https://openalex.org/W1993717184","https://openalex.org/W1994319933","https://openalex.org/W2000687216","https://openalex.org/W2002691507","https://openalex.org/W2002909294","https://openalex.org/W2005135813","https://openalex.org/W2013055927","https://openalex.org/W2014396468","https://openalex.org/W2030549417","https://openalex.org/W2040083498","https://openalex.org/W2049653986","https://openalex.org/W2060460743","https://openalex.org/W2060814411","https://openalex.org/W2069717653","https://openalex.org/W2074357625","https://openalex.org/W2080337490","https://openalex.org/W2082622134","https://openalex.org/W2087960968","https://openalex.org/W2091405790","https://openalex.org/W2799167959","https://openalex.org/W2952160415"],"related_works":["https://openalex.org/W4311224697","https://openalex.org/W4398173599","https://openalex.org/W3164992956","https://openalex.org/W2672772357","https://openalex.org/W2898561595","https://openalex.org/W3006043269","https://openalex.org/W2324683755","https://openalex.org/W3110962361","https://openalex.org/W2895677923","https://openalex.org/W4383220112"],"abstract_inverted_index":{"The":[0,18,85],"Au/DyMnO\u2083/Nb:SrTiO\u2083/Au":[1],"stack":[2,51,89],"was":[3],"demonstrated":[4],"to":[5],"be":[6],"not":[7],"only":[8],"a":[9,15,53,92,98],"high":[10,93],"performance":[11],"memristor":[12],"but":[13],"also":[14],"good":[16],"memcapacitor.":[17],"switching":[19,47],"time":[20],"is":[21,27,40,67,82],"below":[22],"10":[23],"ns,":[24],"the":[25,33,45,63,70,75,79,102,108,112],"retention":[26],"longer":[28],"than":[29,42],"10(5)":[30],"s,":[31],"and":[32,106],"change":[34,104],"ratio":[35,105],"of":[36,56,111],"resistance":[37],"(or":[38],"capacitance)":[39],"larger":[41],"100":[43],"over":[44],"10(8)":[46],"cycles.":[48],"Moreover,":[49],"this":[50],"has":[52],"broad":[54],"range":[55],"intermediate":[57],"states":[58],"that":[59,69],"are":[60],"tunable":[61],"by":[62],"operating":[64],"voltages.":[65],"It":[66],"indicated":[68],"memory":[71,109],"effects":[72],"originate":[73],"from":[74],"Nb:SrTiO\u2083/Au":[76],"junction":[77],"where":[78],"barrier":[80],"profile":[81],"electrically":[83],"modulated.":[84],"serial":[86],"connected":[87],"Au/DyMnO\u2083/Nb:SrTiO\u2083":[88],"behaves":[90],"as":[91],"nonlinear":[94],"resistor":[95],"paralleling":[96],"with":[97],"capacitor,":[99],"which":[100],"raises":[101],"capacitance":[103],"enhances":[107],"stability":[110],"device.":[113]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":8},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":9},{"year":2020,"cited_by_count":10},{"year":2019,"cited_by_count":10},{"year":2018,"cited_by_count":7},{"year":2017,"cited_by_count":15},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":5}],"updated_date":"2026-10-31T12:09:11.096373","created_date":"2016-06-24T00:00:00"}