{"id":"https://openalex.org/W1989673000","doi":"https://doi.org/10.1016/j.tsf.2010.07.081","title":"Mechanical properties of ZnO thin films deposited on polyester substrates used in flexible device applications","display_name":"Mechanical properties of ZnO thin films deposited on polyester substrates used in flexible device applications","publication_year":2010,"publication_date":"2010-07-26","ids":{"openalex":"https://openalex.org/W1989673000","doi":"https://doi.org/10.1016/j.tsf.2010.07.081","mag":"1989673000"},"language":"en","primary_location":{"id":"doi:10.1016/j.tsf.2010.07.081","doi":"https://doi.org/10.1016/j.tsf.2010.07.081","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.tsf.2010.07.081","pdf_url":null,"source":{"id":"https://openalex.org/S84339699","display_name":"Thin Solid Films","issn_l":"0040-6090","issn":["0040-6090","1879-2731"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thin Solid Films","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009510766","display_name":"Konstantinos A. Sierros","orcid":"https://orcid.org/0000-0002-6984-6376","observed_orcids":["https://orcid.org/0000-0002-6984-6376"]},"institutions":[{"id":"https://openalex.org/I12097938","display_name":"West Virginia University","ror":"https://ror.org/011vxgd24","country_code":"US","type":"education","lineage":["https://openalex.org/I12097938"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Konstantinos A. Sierros","raw_affiliation_strings":["West Virginia University, Department of Mechanical & Aerospace Engineering, Evansdale Campus, Morgantown, WV, 26506, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"West Virginia University, Department of Mechanical & Aerospace Engineering, Evansdale Campus, Morgantown, WV, 26506, USA","institution_ids":["https://openalex.org/I12097938"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051902831","display_name":"Derrick A. Banerjee","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I12097938","display_name":"West Virginia University","ror":"https://ror.org/011vxgd24","country_code":"US","type":"education","lineage":["https://openalex.org/I12097938"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Derrick A. Banerjee","raw_affiliation_strings":["West Virginia University, Department of Mechanical & Aerospace Engineering, Evansdale Campus, Morgantown, WV, 26506, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"West Virginia University, Department of Mechanical & Aerospace Engineering, Evansdale Campus, Morgantown, WV, 26506, USA","institution_ids":["https://openalex.org/I12097938"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007949854","display_name":"Nicholas J. Morris","orcid":"https://orcid.org/0000-0001-7233-4032","observed_orcids":["https://orcid.org/0000-0001-7233-4032"]},"institutions":[{"id":"https://openalex.org/I12097938","display_name":"West Virginia University","ror":"https://ror.org/011vxgd24","country_code":"US","type":"education","lineage":["https://openalex.org/I12097938"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nicholas J. Morris","raw_affiliation_strings":["West Virginia University, Department of Mechanical & Aerospace Engineering, Evansdale Campus, Morgantown, WV, 26506, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"West Virginia University, Department of Mechanical & Aerospace Engineering, Evansdale Campus, Morgantown, WV, 26506, USA","institution_ids":["https://openalex.org/I12097938"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077773585","display_name":"Darran R. Cairns","orcid":"https://orcid.org/0009-0000-5615-6870","observed_orcids":["https://orcid.org/0009-0000-5615-6870"]},"institutions":[{"id":"https://openalex.org/I12097938","display_name":"West Virginia University","ror":"https://ror.org/011vxgd24","country_code":"US","type":"education","lineage":["https://openalex.org/I12097938"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Darran R. Cairns","raw_affiliation_strings":["West Virginia University, Department of Mechanical & Aerospace Engineering, Evansdale Campus, Morgantown, WV, 26506, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"West Virginia University, Department of Mechanical & Aerospace Engineering, Evansdale Campus, Morgantown, WV, 26506, USA","institution_ids":["https://openalex.org/I12097938"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085924901","display_name":"Ioannis Kortidis","orcid":"https://orcid.org/0000-0002-7889-2649","observed_orcids":["https://orcid.org/0000-0002-7889-2649"]},"institutions":[{"id":"https://openalex.org/I8901234","display_name":"Foundation for Research and Technology Hellas","ror":"https://ror.org/052rphn09","country_code":"GR","type":"facility","lineage":["https://openalex.org/I8901234"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Ioannis Kortidis","raw_affiliation_strings":["Institute of Electronic Structure and Laser, Foundation for Research and Technology, Hellas, P.O. Box\u00a01527, 71110 Heraklion, Crete, Greece"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Electronic Structure and Laser, Foundation for Research and Technology, Hellas, P.O. Box\u00a01527, 71110 Heraklion, Crete, Greece","institution_ids":["https://openalex.org/I8901234"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5035498550","display_name":"G. Kiriakidis","orcid":"https://orcid.org/0000-0003-2997-643X","observed_orcids":["https://orcid.org/0000-0003-2997-643X"]},"institutions":[{"id":"https://openalex.org/I142617266","display_name":"University of Crete","ror":"https://ror.org/00dr28g20","country_code":"GR","type":"education","lineage":["https://openalex.org/I142617266"]},{"id":"https://openalex.org/I8901234","display_name":"Foundation for Research and Technology Hellas","ror":"https://ror.org/052rphn09","country_code":"GR","type":"facility","lineage":["https://openalex.org/I8901234"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"George Kiriakidis","raw_affiliation_strings":["Institute of Electronic Structure and Laser, Foundation for Research and Technology, Hellas, P.O. Box\u00a01527, 71110 Heraklion, Crete, Greece","University of Crete, Department of Physics, 71003, Heraklion, Crete, Greece"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Electronic Structure and Laser, Foundation for Research and Technology, Hellas, P.O. Box\u00a01527, 71110 Heraklion, Crete, Greece","institution_ids":["https://openalex.org/I8901234"]},{"raw_affiliation_string":"University of Crete, Department of Physics, 71003, Heraklion, Crete, Greece","institution_ids":["https://openalex.org/I142617266"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5009510766"],"corresponding_institution_ids":["https://openalex.org/I12097938"],"apc_list":{"value":3120,"currency":"USD","value_usd":3120},"apc_paid":null,"fwci":2.5189,"has_fulltext":false,"cited_by_count":68,"citation_normalized_percentile":{"value":0.89687418,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":99},"biblio":{"volume":"519","issue":"1","first_page":"325","last_page":"330"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.836899995803833,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.836899995803833,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10377","display_name":"Metal and Thin Film Mechanics","score":0.16040000319480896,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/zno-thin-films","display_name":"ZnO thin films","score":0.9879999756813049},{"id":"https://openalex.org/keywords/flexible-electronics","display_name":"flexible electronics","score":0.6520000100135803},{"id":"https://openalex.org/keywords/polyethylene-terephthalate","display_name":"polyethylene terephthalate","score":0.828000009059906},{"id":"https://openalex.org/keywords/polyethylene-naphthalate","display_name":"polyethylene naphthalate","score":1.0},{"id":"https://openalex.org/keywords/sputtered-thin-films","display_name":"sputtered thin films","score":0.6359999775886536},{"id":"https://openalex.org/keywords/mechanical-properties","display_name":"mechanical properties","score":0.7879999876022339},{"id":"https://openalex.org/keywords/compression-test","display_name":"compression testing","score":0.5789999961853027},{"id":"https://openalex.org/keywords/scratch-resistance","display_name":"scratch resistance","score":0.8289999961853027},{"id":"https://openalex.org/keywords/thickness-dependence","display_name":"thickness dependence","score":0.7149999737739563},{"id":"https://openalex.org/keywords/crack-onset-strain","display_name":"crack onset strain","score":0.8529999852180481}],"concepts":[{"id":"https://openalex.org/C2777503765","wikidata":"https://www.wikidata.org/wiki/Q411472","display_name":"Polyethylene naphthalate","level":3,"score":0.9276224374771118},{"id":"https://openalex.org/C2781235140","wikidata":"https://www.wikidata.org/wiki/Q275131","display_name":"Scratch","level":2,"score":0.8608684539794922},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8603984713554382},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.6899722814559937},{"id":"https://openalex.org/C2780017307","wikidata":"https://www.wikidata.org/wiki/Q145863","display_name":"Polyethylene terephthalate","level":2,"score":0.677895188331604},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.595681369304657},{"id":"https://openalex.org/C22423302","wikidata":"https://www.wikidata.org/wiki/Q898444","display_name":"Sputtering","level":3,"score":0.5901235342025757},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.46741795539855957},{"id":"https://openalex.org/C119394753","wikidata":"https://www.wikidata.org/wiki/Q188245","display_name":"Polyester","level":2,"score":0.43897801637649536},{"id":"https://openalex.org/C99595764","wikidata":"https://www.wikidata.org/wiki/Q486802","display_name":"Toughness","level":2,"score":0.43396201729774475},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.1910533607006073},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.14852789044380188}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.tsf.2010.07.081","doi":"https://doi.org/10.1016/j.tsf.2010.07.081","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.tsf.2010.07.081","pdf_url":null,"source":{"id":"https://openalex.org/S84339699","display_name":"Thin Solid Films","issn_l":"0040-6090","issn":["0040-6090","1879-2731"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thin Solid Films","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W625204185","https://openalex.org/W1573264325","https://openalex.org/W1976250511","https://openalex.org/W1980249368","https://openalex.org/W1982128165","https://openalex.org/W1991929842","https://openalex.org/W1996865642","https://openalex.org/W2013881835","https://openalex.org/W2019128905","https://openalex.org/W2026189403","https://openalex.org/W2027891550","https://openalex.org/W2040781715","https://openalex.org/W2047461579","https://openalex.org/W2049250413","https://openalex.org/W2055464044","https://openalex.org/W2059236643","https://openalex.org/W2063835901","https://openalex.org/W2076302303","https://openalex.org/W2083223400","https://openalex.org/W2094106733","https://openalex.org/W2099818819","https://openalex.org/W2104629159","https://openalex.org/W2106109031","https://openalex.org/W2152777079","https://openalex.org/W2167500979","https://openalex.org/W2321742129","https://openalex.org/W2329622377","https://openalex.org/W2499638446"],"related_works":["https://openalex.org/W2089978565","https://openalex.org/W2267491127","https://openalex.org/W2310345338","https://openalex.org/W2127154914","https://openalex.org/W2751787177","https://openalex.org/W975333641","https://openalex.org/W2069447356","https://openalex.org/W2067264130","https://openalex.org/W2059706661","https://openalex.org/W2133932065"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":12},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":10},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":9},{"year":2012,"cited_by_count":6}],"updated_date":"2026-11-10T11:39:43.021295","created_date":"2016-06-24T00:00:00"}