{"id":"https://openalex.org/W1987952145","doi":"https://doi.org/10.1016/j.ijleo.2010.10.022","title":"Application of wavelet filtering techniques to Lau interferometric fringe analysis for measurement of small tilt angles","display_name":"Application of wavelet filtering techniques to Lau interferometric fringe analysis for measurement of small tilt angles","publication_year":2011,"publication_date":"2011-01-18","ids":{"openalex":"https://openalex.org/W1987952145","doi":"https://doi.org/10.1016/j.ijleo.2010.10.022","mag":"1987952145"},"language":"en","primary_location":{"id":"doi:10.1016/j.ijleo.2010.10.022","doi":"https://doi.org/10.1016/j.ijleo.2010.10.022","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.ijleo.2010.10.022","pdf_url":null,"source":{"id":"https://openalex.org/S201441698","display_name":"Optik","issn_l":"0030-4026","issn":["0030-4026","1618-1336"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","poland-40","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optik","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000460063","display_name":"Sumitra Singh","orcid":"https://orcid.org/0000-0002-5854-3353","observed_orcids":["https://orcid.org/0000-0002-5854-3353","https://orcid.org/0009-0000-6082-6558"]},"institutions":[{"id":"https://openalex.org/I41763900","display_name":"Central Electronics Engineering Research Institute","ror":"https://ror.org/01hh45364","country_code":"IN","type":"facility","lineage":["https://openalex.org/I2799351866","https://openalex.org/I41763900","https://openalex.org/I4210134808","https://openalex.org/I66760702"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Sumitra Singh","raw_affiliation_strings":["Optoelectronics Devices Group, Central Electronics Engineering Research Institute, Pilani 333031, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Optoelectronics Devices Group, Central Electronics Engineering Research Institute, Pilani 333031, India","institution_ids":["https://openalex.org/I41763900"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111522980","display_name":"Santosh Rana","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I138272832","display_name":"Devi Ahilya Vishwavidyalaya","ror":"https://ror.org/05c2p1f98","country_code":"IN","type":"education","lineage":["https://openalex.org/I138272832"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Santosh Rana","raw_affiliation_strings":["Photonics Laboratory, Department of Electronics and Instrumentation, Institute of Engineering and Technology, Devi Ahilya University, Khandwa Road, Indore, MP 452 001, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Photonics Laboratory, Department of Electronics and Instrumentation, Institute of Engineering and Technology, Devi Ahilya University, Khandwa Road, Indore, MP 452 001, India","institution_ids":["https://openalex.org/I138272832"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101437746","display_name":"Shashi Prakash","orcid":"https://orcid.org/0000-0002-6793-767X","observed_orcids":["https://orcid.org/0000-0002-6793-767X"]},"institutions":[{"id":"https://openalex.org/I138272832","display_name":"Devi Ahilya Vishwavidyalaya","ror":"https://ror.org/05c2p1f98","country_code":"IN","type":"education","lineage":["https://openalex.org/I138272832"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Shashi Prakash","raw_affiliation_strings":["Photonics Laboratory, Department of Electronics and Instrumentation, Institute of Engineering and Technology, Devi Ahilya University, Khandwa Road, Indore, MP 452 001, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Photonics Laboratory, Department of Electronics and Instrumentation, Institute of Engineering and Technology, Devi Ahilya University, Khandwa Road, Indore, MP 452 001, India","institution_ids":["https://openalex.org/I138272832"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037032871","display_name":"Osami Sasaki","orcid":"https://orcid.org/0000-0001-6268-6384","observed_orcids":["https://orcid.org/0000-0001-6268-6384"]},"institutions":[{"id":"https://openalex.org/I71395657","display_name":"Niigata University","ror":"https://ror.org/04ww21r56","country_code":"JP","type":"education","lineage":["https://openalex.org/I71395657"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Osami Sasaki","raw_affiliation_strings":["Faculty of Engineering, Department of Electrical and Electronics Engineering, Niigata University, 8050 Igarashi 2, Niigata 950-2181, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Engineering, Department of Electrical and Electronics Engineering, Niigata University, 8050 Igarashi 2, Niigata 950-2181, Japan","institution_ids":["https://openalex.org/I71395657"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5101437746"],"corresponding_institution_ids":["https://openalex.org/I138272832"],"apc_list":{"value":2650,"currency":"USD","value_usd":2650},"apc_paid":null,"fwci":0.6261,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.73229937,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"122","issue":"18","first_page":"1666","last_page":"1671"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/wavelet-filtering","display_name":"wavelet filtering","score":0.8679999709129333},{"id":"https://openalex.org/keywords/interferometric-fringes","display_name":"interferometric fringes","score":0.8600000143051147},{"id":"https://openalex.org/keywords/tilt-angle-measurement","display_name":"tilt angle measurement","score":0.8930000066757202},{"id":"https://openalex.org/keywords/symlet-wavelet","display_name":"Symlet wavelet","score":0.8619999885559082},{"id":"https://openalex.org/keywords/daubechies-wavelet","display_name":"Daubechies wavelet","score":0.9240000247955322},{"id":"https://openalex.org/keywords/haar-wavelet","display_name":"Haar wavelet","score":1.0},{"id":"https://openalex.org/keywords/signal-to-noise-ratio","display_name":"signal-to-noise ratio","score":0.843999981880188},{"id":"https://openalex.org/keywords/interferogram-analysis","display_name":"interferogram analysis","score":0.6169999837875366}],"concepts":[{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.7446280717849731},{"id":"https://openalex.org/C2779844322","wikidata":"https://www.wikidata.org/wiki/Q2919140","display_name":"Tilt (camera)","level":2,"score":0.7105506062507629},{"id":"https://openalex.org/C2779855323","wikidata":"https://www.wikidata.org/wiki/Q1172774","display_name":"Daubechies wavelet","level":5,"score":0.6239858865737915},{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.585701584815979},{"id":"https://openalex.org/C187029792","wikidata":"https://www.wikidata.org/wiki/Q2179112","display_name":"Haar","level":3,"score":0.5799183249473572},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5339037179946899},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5041903257369995},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.44960975646972656},{"id":"https://openalex.org/C2780423554","wikidata":"https://www.wikidata.org/wiki/Q766198","display_name":"Haar wavelet","level":5,"score":0.44921213388442993},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.4274555444717407},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.42000892758369446},{"id":"https://openalex.org/C46286280","wikidata":"https://www.wikidata.org/wiki/Q2414958","display_name":"Discrete wavelet transform","level":4,"score":0.2649582326412201},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2418232262134552},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.21675148606300354},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.19522613286972046},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.15045484900474548},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14494556188583374},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.05489456653594971}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.ijleo.2010.10.022","doi":"https://doi.org/10.1016/j.ijleo.2010.10.022","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.ijleo.2010.10.022","pdf_url":null,"source":{"id":"https://openalex.org/S201441698","display_name":"Optik","issn_l":"0030-4026","issn":["0030-4026","1618-1336"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","poland-40","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optik","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W130619479","https://openalex.org/W191129667","https://openalex.org/W1607631114","https://openalex.org/W1976258264","https://openalex.org/W1984528947","https://openalex.org/W1984657721","https://openalex.org/W1986376499","https://openalex.org/W1987064304","https://openalex.org/W1987489130","https://openalex.org/W1992551526","https://openalex.org/W1999198036","https://openalex.org/W2004801079","https://openalex.org/W2007230002","https://openalex.org/W2014053273","https://openalex.org/W2015581663","https://openalex.org/W2024468035","https://openalex.org/W2026735723","https://openalex.org/W2028936635","https://openalex.org/W2037790692","https://openalex.org/W2039231007","https://openalex.org/W2039374652","https://openalex.org/W2040985825","https://openalex.org/W2057402583","https://openalex.org/W2057709656","https://openalex.org/W2058878976","https://openalex.org/W2062024414","https://openalex.org/W2064054522","https://openalex.org/W2067572796","https://openalex.org/W2075868291","https://openalex.org/W2076563532","https://openalex.org/W2082445003","https://openalex.org/W2112419842","https://openalex.org/W2115755118","https://openalex.org/W2123106421","https://openalex.org/W2125527601","https://openalex.org/W2156447271","https://openalex.org/W2158940042","https://openalex.org/W2163612361","https://openalex.org/W4238299102","https://openalex.org/W4255272544"],"related_works":["https://openalex.org/W2050601860","https://openalex.org/W1987064304","https://openalex.org/W2068017556","https://openalex.org/W1984392504","https://openalex.org/W1983924520","https://openalex.org/W2086222827","https://openalex.org/W2581295992","https://openalex.org/W2067044401","https://openalex.org/W2021796992","https://openalex.org/W2766276215"],"abstract_inverted_index":null,"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-11-10T11:39:43.021295","created_date":"2016-06-24T00:00:00"}