{"id":"https://openalex.org/W1987928951","doi":"https://doi.org/10.1063/1.3529434","title":"Atom chips on direct bonded copper substrates","display_name":"Atom chips on direct bonded copper substrates","publication_year":2011,"publication_date":"2011-02-01","ids":{"openalex":"https://openalex.org/W1987928951","doi":"https://doi.org/10.1063/1.3529434","mag":"1987928951","pmid":"https://pubmed.ncbi.nlm.nih.gov/21361567"},"language":"en","primary_location":{"id":"doi:10.1063/1.3529434","doi":"https://doi.org/10.1063/1.3529434","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.3529434","pdf_url":null,"source":{"id":"https://openalex.org/S31010182","display_name":"Review of Scientific Instruments","issn_l":"0034-6748","issn":["0034-6748","1089-7623","1527-2400"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","ki-jl-1","medline","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Review of Scientific Instruments","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["arxiv","crossref","datacite","pubmed"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://arxiv.org/pdf/1007.4851","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Matthew B. Squires","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1280414376","display_name":"United States Air Force Research Laboratory","ror":"https://ror.org/02e2egq70","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Matthew B. Squires","raw_affiliation_strings":["Air Force Research Laboratory , Hanscom AFB, Massachusetts 01731, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Air Force Research Laboratory , Hanscom AFB, Massachusetts 01731, USA","institution_ids":["https://openalex.org/I1280414376"]}]},{"author_position":"middle","author":{"id":null,"display_name":"James A. Stickney","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1280414376","display_name":"United States Air Force Research Laboratory","ror":"https://ror.org/02e2egq70","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James A. Stickney","raw_affiliation_strings":["Air Force Research Laboratory , Hanscom AFB, Massachusetts 01731, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Air Force Research Laboratory , Hanscom AFB, Massachusetts 01731, USA","institution_ids":["https://openalex.org/I1280414376"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Evan J. Carlson","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1280414376","display_name":"United States Air Force Research Laboratory","ror":"https://ror.org/02e2egq70","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Evan J. Carlson","raw_affiliation_strings":["Air Force Research Laboratory , Hanscom AFB, Massachusetts 01731, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Air Force Research Laboratory , Hanscom AFB, Massachusetts 01731, USA","institution_ids":["https://openalex.org/I1280414376"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Paul M. Baker","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1280414376","display_name":"United States Air Force Research Laboratory","ror":"https://ror.org/02e2egq70","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Paul M. Baker","raw_affiliation_strings":["Air Force Research Laboratory , Hanscom AFB, Massachusetts 01731, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Air Force Research Laboratory , Hanscom AFB, Massachusetts 01731, USA","institution_ids":["https://openalex.org/I1280414376"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058838692","display_name":"Walter R. Buchwald","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1280414376","display_name":"United States Air Force Research Laboratory","ror":"https://ror.org/02e2egq70","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Walter R. Buchwald","raw_affiliation_strings":["Air Force Research Laboratory , Hanscom AFB, Massachusetts 01731, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Air Force Research Laboratory , Hanscom AFB, Massachusetts 01731, USA","institution_ids":["https://openalex.org/I1280414376"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Sandra Wentzell","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1280414376","display_name":"United States Air Force Research Laboratory","ror":"https://ror.org/02e2egq70","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sandra Wentzell","raw_affiliation_strings":["Air Force Research Laboratory , Hanscom AFB, Massachusetts 01731, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Air Force Research Laboratory , Hanscom AFB, Massachusetts 01731, USA","institution_ids":["https://openalex.org/I1280414376"]}]},{"author_position":"last","author":{"id":null,"display_name":"Steven M. Miller","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1280414376","display_name":"United States Air Force Research Laboratory","ror":"https://ror.org/02e2egq70","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Steven M. Miller","raw_affiliation_strings":["Air Force Research Laboratory , Hanscom AFB, Massachusetts 01731, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Air Force Research Laboratory , Hanscom AFB, Massachusetts 01731, USA","institution_ids":["https://openalex.org/I1280414376"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1280414376"],"apc_list":null,"apc_paid":null,"fwci":0.1555,"has_fulltext":true,"cited_by_count":12,"citation_normalized_percentile":{"value":0.42753722,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"82","issue":"2","first_page":"023101","last_page":"023101"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10425","display_name":"Cold Atom Physics and Bose-Einstein Condensates","score":0.8163999915122986,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10425","display_name":"Cold Atom Physics and Bose-Einstein Condensates","score":0.8163999915122986,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11808","display_name":"Superconducting Materials and Applications","score":0.030400000512599945,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11367","display_name":"Particle accelerators and beam dynamics","score":0.017100000753998756,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/atom-chip","display_name":"atom chip","score":0.9919999837875366},{"id":"https://openalex.org/keywords/direct-bonded-copper","display_name":"direct bonded copper","score":0.9819999933242798},{"id":"https://openalex.org/keywords/thermal-impedance","display_name":"thermal impedance","score":0.7170000076293945},{"id":"https://openalex.org/keywords/magnetic-field-gradient","display_name":"magnetic field gradient","score":0.5950000286102295},{"id":"https://openalex.org/keywords/power-dissipation","display_name":"power dissipation","score":0.6520000100135803}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8646000027656555},{"id":"https://openalex.org/C193523891","wikidata":"https://www.wikidata.org/wiki/Q1771950","display_name":"dBc","level":3,"score":0.711899995803833},{"id":"https://openalex.org/C544778455","wikidata":"https://www.wikidata.org/wiki/Q753","display_name":"Copper","level":2,"score":0.7092000246047974},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.6258999705314636},{"id":"https://openalex.org/C58312451","wikidata":"https://www.wikidata.org/wiki/Q4817200","display_name":"Atom (system on chip)","level":2,"score":0.5889000296592712},{"id":"https://openalex.org/C100460472","wikidata":"https://www.wikidata.org/wiki/Q2368605","display_name":"Etching (microfabrication)","level":3,"score":0.5473999977111816},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4050999879837036},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.35359999537467957},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.33739998936653137},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.3239000141620636},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.30000001192092896},{"id":"https://openalex.org/C33220542","wikidata":"https://www.wikidata.org/wiki/Q6086567","display_name":"Isotropic etching","level":4,"score":0.28130000829696655},{"id":"https://openalex.org/C1291036","wikidata":"https://www.wikidata.org/wiki/Q1191918","display_name":"Dry etching","level":4,"score":0.2727999985218048},{"id":"https://openalex.org/C19474535","wikidata":"https://www.wikidata.org/wiki/Q131172","display_name":"Welding","level":2,"score":0.26649999618530273},{"id":"https://openalex.org/C130472188","wikidata":"https://www.wikidata.org/wiki/Q1640159","display_name":"Reactive-ion etching","level":4,"score":0.2603999972343445},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.2502000033855438}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1063/1.3529434","doi":"https://doi.org/10.1063/1.3529434","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.3529434","pdf_url":null,"source":{"id":"https://openalex.org/S31010182","display_name":"Review of Scientific Instruments","issn_l":"0034-6748","issn":["0034-6748","1089-7623","1527-2400"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","ki-jl-1","medline","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Review of Scientific Instruments","raw_type":"journal-article"},{"id":"pmid:21361567","doi":null,"is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/21361567","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The Review of scientific instruments","raw_type":"Journal Article"},{"id":"pmh:oai:arXiv.org:1007.4851","doi":null,"is_oa":true,"landing_page_url":"http://arxiv.org/abs/1007.4851","pdf_url":"https://arxiv.org/pdf/1007.4851","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},{"id":"doi:10.48550/arxiv.1007.4851","doi":"https://doi.org/10.48550/arxiv.1007.4851","is_oa":true,"landing_page_url":"https://doi.org/10.48550/arxiv.1007.4851","pdf_url":null,"source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article-journal"}],"best_oa_location":{"id":"pmh:oai:arXiv.org:1007.4851","doi":null,"is_oa":true,"landing_page_url":"http://arxiv.org/abs/1007.4851","pdf_url":"https://arxiv.org/pdf/1007.4851","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W1987928951.pdf","grobid_xml":"https://content.openalex.org/works/W1987928951.grobid-xml"},"referenced_works_count":26,"referenced_works":["https://openalex.org/W560918766","https://openalex.org/W1488847324","https://openalex.org/W1555773641","https://openalex.org/W1965738555","https://openalex.org/W1966268258","https://openalex.org/W1981685599","https://openalex.org/W1985118043","https://openalex.org/W1991230891","https://openalex.org/W1992708532","https://openalex.org/W2002415290","https://openalex.org/W2008082809","https://openalex.org/W2012607516","https://openalex.org/W2013812210","https://openalex.org/W2018085165","https://openalex.org/W2020924923","https://openalex.org/W2024182480","https://openalex.org/W2031011114","https://openalex.org/W2048775851","https://openalex.org/W2058798211","https://openalex.org/W2063274222","https://openalex.org/W2067174613","https://openalex.org/W2080812469","https://openalex.org/W2088562199","https://openalex.org/W2091070443","https://openalex.org/W2110366112","https://openalex.org/W2115209601"],"related_works":["https://openalex.org/W332627448","https://openalex.org/W2610375945","https://openalex.org/W1976166634","https://openalex.org/W2567364647","https://openalex.org/W2096731639","https://openalex.org/W2079076205","https://openalex.org/W4321507328","https://openalex.org/W2286979706","https://openalex.org/W2168719451","https://openalex.org/W2001325135"],"abstract_inverted_index":{"We":[0],"present":[1],"the":[2,10,43,75,97,101,125],"use":[3],"of":[4,13,86,100,132],"direct":[5],"bonded":[6],"copper":[7,33,76],"(DBC)":[8],"for":[9,45,58,70,88],"straightforward":[11],"fabrication":[12,62],"high":[14,28,35,39],"power":[15,133],"atom":[16,52,60,108],"chips.":[17],"Atom":[18],"chips":[19,109],"using":[20,105],"DBC":[21,59,107],"have":[22],"several":[23],"benefits:":[24],"excellent":[25],"copper/substrate":[26],"adhesion,":[27],"purity,":[29],"thick":[30],"(>100":[31],"\u03bcm)":[32],"layers,":[34],"substrate":[36],"thermal":[37,98],"conductivity,":[38],"aspect":[40,121],"ratio":[41,122],"wires,":[42],"potential":[44],"rapid":[46],"(<8":[47],"h)":[48],"fabrication,":[49],"and":[50],"three-dimensional":[51],"chip":[53,61],"structures.":[54],"Two":[55],"mask":[56],"options":[57],"are":[63],"presented,":[64],"as":[65,67,129],"well":[66],"two":[68,106],"methods":[69],"etching":[71],"wire":[72,120],"patterns":[73],"into":[74],"layer.":[77],"A":[78,85],"test":[79],"chip,":[80],"able":[81],"to":[82,95,112,137],"support":[83],"100":[84],"current":[87],"2":[89],"s":[90],"without":[91],"failing,":[92],"is":[93,110,135],"used":[94,111],"determine":[96],"impedance":[99],"DBC.":[102],"An":[103],"assembly":[104],"magnetically":[113],"trap":[114],"laser":[115],"cooled":[116],"(87)Rb":[117],"atoms.":[118],"The":[119],"that":[123],"optimizes":[124],"magnetic":[126],"field":[127],"gradient":[128],"a":[130],"function":[131],"dissipation":[134],"determined":[136],"be":[138],"0.84:1":[139],"(height:width).":[140]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-11-09T13:22:03.289127","created_date":"2016-06-24T00:00:00"}