{"id":"https://openalex.org/W1987118366","doi":"https://doi.org/10.1049/el:19920844","title":"Highly stable operation of AlGaInP/GaInP strained multiquantum well visible laser diodes","display_name":"Highly stable operation of AlGaInP/GaInP strained multiquantum well visible laser diodes","publication_year":1992,"publication_date":"1992-07-02","ids":{"openalex":"https://openalex.org/W1987118366","doi":"https://doi.org/10.1049/el:19920844","mag":"1987118366"},"language":"en","primary_location":{"id":"doi:10.1049/el:19920844","doi":"https://doi.org/10.1049/el:19920844","is_oa":false,"landing_page_url":"https://doi.org/10.1049/el:19920844","pdf_url":null,"source":{"id":"https://openalex.org/S149016011","display_name":"Electronics Letters","issn_l":"0013-5194","issn":["0013-5194","1350-911X"],"is_oa":false,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-d","jufo-1","norway-1","oarl","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronics Letters","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103100184","display_name":"Jun-ichi Hashimoto","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210166210","display_name":"Sumitomo Electric Industries (Japan)","ror":"https://ror.org/05rnkb382","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210166210"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"J. Hashimoto","raw_affiliation_strings":["Optoelectronics R&D Laboratories, Sumitomo Electric Industries Ltd., 1 Taya-cho, Sakae-ku, Yokohama, WKanagawa 244, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Optoelectronics R&D Laboratories, Sumitomo Electric Industries Ltd., 1 Taya-cho, Sakae-ku, Yokohama, WKanagawa 244, Japan","institution_ids":["https://openalex.org/I4210166210"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112279029","display_name":"Tomokazu Katsuyama","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210166210","display_name":"Sumitomo Electric Industries (Japan)","ror":"https://ror.org/05rnkb382","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210166210"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Katsuyama","raw_affiliation_strings":["Optoelectronics R&D Laboratories, Sumitomo Electric Industries Ltd., 1 Taya-cho, Sakae-ku, Yokohama, WKanagawa 244, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Optoelectronics R&D Laboratories, Sumitomo Electric Industries Ltd., 1 Taya-cho, Sakae-ku, Yokohama, WKanagawa 244, Japan","institution_ids":["https://openalex.org/I4210166210"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003643266","display_name":"J. Shinkai","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210166210","display_name":"Sumitomo Electric Industries (Japan)","ror":"https://ror.org/05rnkb382","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210166210"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"J. Shinkai","raw_affiliation_strings":["Optoelectronics R&D Laboratories, Sumitomo Electric Industries Ltd., 1 Taya-cho, Sakae-ku, Yokohama, WKanagawa 244, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Optoelectronics R&D Laboratories, Sumitomo Electric Industries Ltd., 1 Taya-cho, Sakae-ku, Yokohama, WKanagawa 244, Japan","institution_ids":["https://openalex.org/I4210166210"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031772934","display_name":"Ichiro Yoshida","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210166210","display_name":"Sumitomo Electric Industries (Japan)","ror":"https://ror.org/05rnkb382","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210166210"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"I. Yoshida","raw_affiliation_strings":["Optoelectronics R&D Laboratories, Sumitomo Electric Industries Ltd., 1 Taya-cho, Sakae-ku, Yokohama, WKanagawa 244, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Optoelectronics R&D Laboratories, Sumitomo Electric Industries Ltd., 1 Taya-cho, Sakae-ku, Yokohama, WKanagawa 244, Japan","institution_ids":["https://openalex.org/I4210166210"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005778977","display_name":"Hideki Hayashi","orcid":"https://orcid.org/0000-0003-4585-6542","observed_orcids":["https://orcid.org/0000-0003-4585-6542"]},"institutions":[{"id":"https://openalex.org/I4210166210","display_name":"Sumitomo Electric Industries (Japan)","ror":"https://ror.org/05rnkb382","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210166210"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Hayashi","raw_affiliation_strings":["Optoelectronics R&D Laboratories, Sumitomo Electric Industries Ltd., 1 Taya-cho, Sakae-ku, Yokohama, WKanagawa 244, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Optoelectronics R&D Laboratories, Sumitomo Electric Industries Ltd., 1 Taya-cho, Sakae-ku, Yokohama, WKanagawa 244, Japan","institution_ids":["https://openalex.org/I4210166210"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210166210"],"apc_list":{"value":2590,"currency":"USD","value_usd":2590},"apc_paid":null,"fwci":2.3178,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.85710305,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"28","issue":"14","first_page":"1329","last_page":"1330"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9814000129699707,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9814000129699707,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","score":0.012500000186264515,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12309","display_name":"solar cell performance optimization","score":0.0019000000320374966,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/visible-laser-diodes","display_name":"visible laser diodes","score":0.9020000100135803},{"id":"https://openalex.org/keywords/long-term-reliability","display_name":"long-term reliability","score":0.9269999861717224},{"id":"https://openalex.org/keywords/mean-time-to-failure","display_name":"mean time to failure","score":0.8640000224113464},{"id":"https://openalex.org/keywords/strain-induced-defects","display_name":"strain-induced defects","score":0.7929999828338623},{"id":"https://openalex.org/keywords/device-stability","display_name":"device stability","score":0.3529999852180481}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7391086220741272},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.7078975439071655},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7038254141807556},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.6877303123474121},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6705164313316345},{"id":"https://openalex.org/C44154001","wikidata":"https://www.wikidata.org/wiki/Q754940","display_name":"Mean time between failures","level":3,"score":0.6691133975982666},{"id":"https://openalex.org/C121477167","wikidata":"https://www.wikidata.org/wiki/Q17154002","display_name":"Semiconductor laser theory","level":3,"score":0.4568091928958893},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.38143670558929443},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.21479740738868713},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.16823869943618774},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1049/el:19920844","doi":"https://doi.org/10.1049/el:19920844","is_oa":false,"landing_page_url":"https://doi.org/10.1049/el:19920844","pdf_url":null,"source":{"id":"https://openalex.org/S149016011","display_name":"Electronics Letters","issn_l":"0013-5194","issn":["0013-5194","1350-911X"],"is_oa":false,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-d","jufo-1","norway-1","oarl","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronics Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2000212430","https://openalex.org/W2033168613","https://openalex.org/W2042804107","https://openalex.org/W2094111903","https://openalex.org/W2094775198","https://openalex.org/W2545244368"],"related_works":["https://openalex.org/W1546332474","https://openalex.org/W1887012117","https://openalex.org/W2166579172","https://openalex.org/W2148185961","https://openalex.org/W2099840571","https://openalex.org/W2119949878","https://openalex.org/W3198634667","https://openalex.org/W1992872709","https://openalex.org/W2010530755","https://openalex.org/W121351586"],"abstract_inverted_index":{"The":[0,43],"long-term":[1],"reliability":[2],"of":[3,57],"AlGalnP/GaInP":[4],"strained":[5],"multiquantum":[6],"well":[7],"(SMQW)":[8],"lasers":[9],"has":[10,25],"been":[11,26],"investigated.":[12],"Highly":[13],"stable":[14],"operation":[15,18],"with":[16],"low":[17],"current":[19],"for":[20,65],"more":[21],"than":[22],"5500":[23],"h":[24],"achieved":[27],"under":[28],"50\u00b0C,":[29],"3mW":[30],"test":[31],"conditions,":[32],"without":[33],"sudden":[34],"or":[35],"rapid":[36],"failures":[37],"due":[38],"to":[39,47,55],"strain":[40],"induced":[41],"defects.":[42],"estimated":[44],"mean":[45],"time":[46],"failure":[48],"(MTTF)":[49],"is":[50,53],"10900h,":[51],"which":[52],"comparable":[54],"that":[56],"the":[58],"conventional":[59],"DH":[60],"laser":[61],"and":[62],"long":[63],"enough":[64],"practical":[66],"use.":[67]},"counts_by_year":[],"updated_date":"2026-11-13T13:42:25.865203","created_date":"2016-06-24T00:00:00"}