{"id":"https://openalex.org/W1986809581","doi":"https://doi.org/10.1063/1.2828860","title":"Valence band offset of ZnO\u2215GaAs heterojunction measured by x-ray photoelectron spectroscopy","display_name":"Valence band offset of ZnO\u2215GaAs heterojunction measured by x-ray photoelectron spectroscopy","publication_year":2008,"publication_date":"2008-01-02","ids":{"openalex":"https://openalex.org/W1986809581","doi":"https://doi.org/10.1063/1.2828860","mag":"1986809581"},"language":"en","primary_location":{"id":"doi:10.1063/1.2828860","doi":"https://doi.org/10.1063/1.2828860","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.2828860","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"},"parent_works":[],"lineage":["https://openalex.org/W1986809581"],"child_works_count":0,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052581476","display_name":"P. F. Zhang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"P. F. Zhang","raw_affiliation_strings":["Institute of Semiconductors Key Laboratory of Semiconductor Materials Science, , Chinese Academy of Sciences, P.O. Box 912 Beijing 100083, People\u2019s Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors Key Laboratory of Semiconductor Materials Science, , Chinese Academy of Sciences, P.O. Box 912 Beijing 100083, People\u2019s Republic of China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036277468","display_name":"Xinyu Liu","orcid":"https://orcid.org/0009-0001-9481-5758","observed_orcids":["https://orcid.org/0009-0001-9481-5758"]},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"X. L. Liu","raw_affiliation_strings":["Institute of Semiconductors Key Laboratory of Semiconductor Materials Science, , Chinese Academy of Sciences, P.O. Box 912 Beijing 100083, People\u2019s Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors Key Laboratory of Semiconductor Materials Science, , Chinese Academy of Sciences, P.O. Box 912 Beijing 100083, People\u2019s Republic of China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011327371","display_name":"R. Q. Zhang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"R. Q. Zhang","raw_affiliation_strings":["Institute of Semiconductors Key Laboratory of Semiconductor Materials Science, , Chinese Academy of Sciences, P.O. Box 912 Beijing 100083, People\u2019s Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors Key Laboratory of Semiconductor Materials Science, , Chinese Academy of Sciences, P.O. Box 912 Beijing 100083, People\u2019s Republic of China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003220159","display_name":"Haibo Fan","orcid":"https://orcid.org/0000-0003-4982-9250","observed_orcids":["https://orcid.org/0000-0003-4982-9250"]},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"H. B. Fan","raw_affiliation_strings":["Institute of Semiconductors Key Laboratory of Semiconductor Materials Science, , Chinese Academy of Sciences, P.O. Box 912 Beijing 100083, People\u2019s Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors Key Laboratory of Semiconductor Materials Science, , Chinese Academy of Sciences, P.O. Box 912 Beijing 100083, People\u2019s Republic of China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058070302","display_name":"Anli Yang","orcid":"https://orcid.org/0000-0003-3285-1080","observed_orcids":["https://orcid.org/0000-0003-3285-1080"]},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"A. L. Yang","raw_affiliation_strings":["Institute of Semiconductors Key Laboratory of Semiconductor Materials Science, , Chinese Academy of Sciences, P.O. Box 912 Beijing 100083, People\u2019s Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors Key Laboratory of Semiconductor Materials Science, , Chinese Academy of Sciences, P.O. Box 912 Beijing 100083, People\u2019s Republic of China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053687630","display_name":"Hongyuan Wei","orcid":"https://orcid.org/0000-0003-2069-1841","observed_orcids":["https://orcid.org/0000-0003-2069-1841"]},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"H. Y. Wei","raw_affiliation_strings":["Institute of Semiconductors Key Laboratory of Semiconductor Materials Science, , Chinese Academy of Sciences, P.O. Box 912 Beijing 100083, People\u2019s Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors Key Laboratory of Semiconductor Materials Science, , Chinese Academy of Sciences, P.O. Box 912 Beijing 100083, People\u2019s Republic of China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101760202","display_name":"Ping Jin","orcid":"https://orcid.org/0000-0001-7655-1077","observed_orcids":["https://orcid.org/0000-0001-7655-1077"]},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"P. Jin","raw_affiliation_strings":["Institute of Semiconductors Key Laboratory of Semiconductor Materials Science, , Chinese Academy of Sciences, P.O. Box 912 Beijing 100083, People\u2019s Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors Key Laboratory of Semiconductor Materials Science, , Chinese Academy of Sciences, P.O. Box 912 Beijing 100083, People\u2019s Republic of China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101486670","display_name":"Song Yang","orcid":"https://orcid.org/0000-0002-8418-0808","observed_orcids":["https://orcid.org/0000-0002-8418-0808"]},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"S. Y. Yang","raw_affiliation_strings":["Institute of Semiconductors Key Laboratory of Semiconductor Materials Science, , Chinese Academy of Sciences, P.O. Box 912 Beijing 100083, People\u2019s Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors Key Laboratory of Semiconductor Materials Science, , Chinese Academy of Sciences, P.O. Box 912 Beijing 100083, People\u2019s Republic of China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017803187","display_name":"Qin\u2010Feng Zhu","orcid":"https://orcid.org/0000-0001-6877-1838","observed_orcids":["https://orcid.org/0000-0001-6877-1838"]},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Q. S. Zhu","raw_affiliation_strings":["Institute of Semiconductors Key Laboratory of Semiconductor Materials Science, , Chinese Academy of Sciences, P.O. Box 912 Beijing 100083, People\u2019s Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors Key Laboratory of Semiconductor Materials Science, , Chinese Academy of Sciences, P.O. Box 912 Beijing 100083, People\u2019s Republic of China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066771573","display_name":"Z. G. Wang","orcid":"https://orcid.org/0000-0001-8256-2848","observed_orcids":["https://orcid.org/0000-0001-8256-2848"]},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Z. G. Wang","raw_affiliation_strings":["Institute of Semiconductors Key Laboratory of Semiconductor Materials Science, , Chinese Academy of Sciences, P.O. Box 912 Beijing 100083, People\u2019s Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors Key Laboratory of Semiconductor Materials Science, , Chinese Academy of Sciences, P.O. Box 912 Beijing 100083, People\u2019s Republic of China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8575,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.71751792,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"92","issue":"1","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.7304999828338623,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.7304999828338623,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.15479999780654907,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.03359999880194664,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/valence-band-offset","display_name":"valence band offset","score":0.8899999856948853},{"id":"https://openalex.org/keywords/type-ii-heterojunction","display_name":"type-II heterojunction","score":0.9440000057220459},{"id":"https://openalex.org/keywords/conduction-band-offset","display_name":"conduction band offset","score":0.9929999709129333},{"id":"https://openalex.org/keywords/band-alignment","display_name":"band alignment","score":0.46700000762939453}],"concepts":[{"id":"https://openalex.org/C79794668","wikidata":"https://www.wikidata.org/wiki/Q1616270","display_name":"Heterojunction","level":2,"score":0.8746438026428223},{"id":"https://openalex.org/C175708663","wikidata":"https://www.wikidata.org/wiki/Q899559","display_name":"X-ray photoelectron spectroscopy","level":2,"score":0.7172412872314453},{"id":"https://openalex.org/C177293861","wikidata":"https://www.wikidata.org/wiki/Q78974","display_name":"Electronegativity","level":2,"score":0.6832807660102844},{"id":"https://openalex.org/C47592295","wikidata":"https://www.wikidata.org/wiki/Q4854276","display_name":"Band offset","level":4,"score":0.6715285778045654},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.578703761100769},{"id":"https://openalex.org/C103272658","wikidata":"https://www.wikidata.org/wiki/Q528769","display_name":"Valence band","level":3,"score":0.5318089723587036},{"id":"https://openalex.org/C27067764","wikidata":"https://www.wikidata.org/wiki/Q528769","display_name":"Conduction band","level":3,"score":0.5252330303192139},{"id":"https://openalex.org/C168900304","wikidata":"https://www.wikidata.org/wiki/Q171407","display_name":"Valence (chemistry)","level":2,"score":0.5126696825027466},{"id":"https://openalex.org/C177909632","wikidata":"https://www.wikidata.org/wiki/Q2033925","display_name":"Semimetal","level":3,"score":0.47835415601730347},{"id":"https://openalex.org/C181966813","wikidata":"https://www.wikidata.org/wiki/Q806352","display_name":"Band gap","level":2,"score":0.4416941702365875},{"id":"https://openalex.org/C32891209","wikidata":"https://www.wikidata.org/wiki/Q483666","display_name":"Spectroscopy","level":2,"score":0.4321995973587036},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.41943567991256714},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.4078201949596405},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.34957438707351685},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3061683773994446},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.14329394698143005},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1179787814617157},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.0958753228187561},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1063/1.2828860","doi":"https://doi.org/10.1063/1.2828860","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.2828860","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"},{"id":"pmh:oai:ir.semi.ac.cn:172111/6910","doi":null,"is_oa":false,"landing_page_url":"http://ir.semi.ac.cn/handle/172111/6910","pdf_url":null,"source":{"id":"https://openalex.org/S7407064283","display_name":"SEMI-IR","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Zhang, PF ; Liu, XL ; Zhang, RQ ; Fan, HB ; Yang, AL ; Wei, HY ; Jin, P ; Yang, SY ; Zhu, QS ; Wang, ZG .Valence band offset of ZnO/GaAs heterojunction measured by x-ray photoelectron spectroscopy ,APPLIED PHYSICS LETTERS,2008 ,92(1): Art. No. 012104","raw_type":"\u671f\u520a\u8bba\u6587"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1680173404","https://openalex.org/W1966075462","https://openalex.org/W1967652077","https://openalex.org/W1977194693","https://openalex.org/W1978554010","https://openalex.org/W1980338905","https://openalex.org/W1987120637","https://openalex.org/W1990212990","https://openalex.org/W1997549407","https://openalex.org/W2009409320","https://openalex.org/W2011608957","https://openalex.org/W2012763184","https://openalex.org/W2020254510","https://openalex.org/W2020270349","https://openalex.org/W2023777883","https://openalex.org/W2024236197","https://openalex.org/W2026147826","https://openalex.org/W2029374845","https://openalex.org/W2033744030","https://openalex.org/W2053890446","https://openalex.org/W2058061908","https://openalex.org/W2061142364","https://openalex.org/W2061613838","https://openalex.org/W2064382916","https://openalex.org/W2070750678","https://openalex.org/W2075547595","https://openalex.org/W2150163217"],"related_works":["https://openalex.org/W2016944869","https://openalex.org/W1653011765","https://openalex.org/W2070527345","https://openalex.org/W2002021174","https://openalex.org/W2062345087","https://openalex.org/W2281500860","https://openalex.org/W1980313925","https://openalex.org/W4249878673","https://openalex.org/W1680173404","https://openalex.org/W1971954133"],"abstract_inverted_index":{"X-ray":[0],"photoelectron":[1],"spectroscopy":[2],"has":[3],"been":[4],"used":[5],"to":[6,23],"measure":[7],"the":[8,13,50,57,62],"valence":[9,18],"band":[10,19,35],"offset":[11,20,36],"at":[12],"ZnO\u2215GaAs":[14],"heterojunction":[15,31],"interface.":[16],"The":[17,41],"is":[21,39,45],"determined":[22],"be":[24],"2.39\u00b10.23eV.":[25],"As":[26],"a":[27,29,33],"consequence,":[28],"type-II":[30],"with":[32,49],"conduction":[34],"of":[37,52],"\u22120.44\u00b10.23eV":[38],"found.":[40],"directly":[42],"obtained":[43],"value":[44],"in":[46],"good":[47],"agreement":[48],"result":[51],"theoretical":[53],"calculations":[54],"based":[55],"on":[56],"interface-induced":[58],"gap":[59],"states":[60],"and":[61],"chemical":[63],"electronegativity":[64],"theory.":[65]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2014,"cited_by_count":4},{"year":2012,"cited_by_count":4}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}