{"id":"https://openalex.org/W1986484484","doi":"https://doi.org/10.1109/66.484295","title":"Applications of the upside-down normal loss function","display_name":"Applications of the upside-down normal loss function","publication_year":1996,"publication_date":"1996-01-01","ids":{"openalex":"https://openalex.org/W1986484484","doi":"https://doi.org/10.1109/66.484295","mag":"1986484484"},"language":"en","primary_location":{"id":"doi:10.1109/66.484295","doi":"https://doi.org/10.1109/66.484295","is_oa":false,"landing_page_url":"https://doi.org/10.1109/66.484295","pdf_url":null,"source":{"id":"https://openalex.org/S14676311","display_name":"IEEE Transactions on Semiconductor Manufacturing","issn_l":"0894-6507","issn":["0894-6507","1558-2345"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Semiconductor Manufacturing","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062373318","display_name":"David C. Drain","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. Drain","raw_affiliation_strings":["Intel Corporation, Chandler, AZ, USA","Intel Corp., Chandler, AZ USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corporation, Chandler, AZ, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel Corp., Chandler, AZ USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036357247","display_name":"Andrew M. Gough","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A.M. Gough","raw_affiliation_strings":["Intel Corporation, Chandler, AZ, USA","Intel Corp., Chandler, AZ USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corporation, Chandler, AZ, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel Corp., Chandler, AZ USA","institution_ids":["https://openalex.org/I1343180700"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1343180700"],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.19948112,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"9","issue":"1","first_page":"143","last_page":"145"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9437999725341797,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9437999725341797,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T13706","display_name":"Management and Optimization Techniques","score":0.016100000590085983,"subfield":{"id":"https://openalex.org/subfields/1408","display_name":"Strategy and Management"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.010700000450015068,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/expected-loss","display_name":"expected loss","score":0.6779999732971191},{"id":"https://openalex.org/keywords/process-optimization","display_name":"process optimization","score":0.5120000243186951},{"id":"https://openalex.org/keywords/semiconductor-manufacturing","display_name":"semiconductor manufacturing","score":0.6890000104904175},{"id":"https://openalex.org/keywords/product-engineering","display_name":"product engineering","score":0.421999990940094},{"id":"https://openalex.org/keywords/loss-prediction","display_name":"loss prediction","score":0.4050000011920929}],"concepts":[{"id":"https://openalex.org/C199163554","wikidata":"https://www.wikidata.org/wiki/Q1681619","display_name":"Univariate","level":3,"score":0.7373893857002258},{"id":"https://openalex.org/C161584116","wikidata":"https://www.wikidata.org/wiki/Q1952580","display_name":"Multivariate statistics","level":2,"score":0.564276933670044},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.5059661269187927},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.4982461929321289},{"id":"https://openalex.org/C132010649","wikidata":"https://www.wikidata.org/wiki/Q189222","display_name":"Intuition","level":2,"score":0.4920060336589813},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.414508581161499},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.4087507724761963},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.3540879487991333},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3357023000717163},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.3199199438095093},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/66.484295","doi":"https://doi.org/10.1109/66.484295","is_oa":false,"landing_page_url":"https://doi.org/10.1109/66.484295","pdf_url":null,"source":{"id":"https://openalex.org/S14676311","display_name":"IEEE Transactions on Semiconductor Manufacturing","issn_l":"0894-6507","issn":["0894-6507","1558-2345"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Semiconductor Manufacturing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320310160","display_name":"University of Arizona","ror":"https://ror.org/03m2x1q45"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W80183268","https://openalex.org/W156343950","https://openalex.org/W1984820781","https://openalex.org/W2062489380","https://openalex.org/W2087937369","https://openalex.org/W4253147876"],"related_works":["https://openalex.org/W2063452764","https://openalex.org/W2049089525","https://openalex.org/W2955562186","https://openalex.org/W2955276113","https://openalex.org/W2954364568","https://openalex.org/W7113748140","https://openalex.org/W7046083489","https://openalex.org/W2109579881","https://openalex.org/W2264822181","https://openalex.org/W3160157479"],"abstract_inverted_index":{"The":[0,21],"upside-down":[1],"normal":[2],"loss":[3,9,57,76,104],"function":[4,10,45,77],"(UDNLF)":[5],"is":[6,95],"a":[7,17,62,85],"weighted":[8],"that":[11],"has":[12,70],"accurately":[13],"modeled":[14],"losses":[15],"in":[16,91,114],"product":[18],"engineering":[19,93],"context.":[20],"function's":[22],"scale":[23],"parameter":[24],"can":[25,80],"be":[26,81],"adjusted":[27],"to":[28,37,83],"account":[29],"for":[30,73,102],"the":[31,44,51,74,115],"actual":[32],"percentage":[33],"of":[34,43,53,65],"material":[35],"failing":[36],"work":[38],"at":[39],"specification":[40],"limits.":[41],"Use":[42],"along":[46],"with":[47,87],"process":[48,67,86,108],"history":[49],"allows":[50],"prediction":[52],"expected":[54,103],"loss-the":[55],"average":[56],"one":[58],"would":[59],"expect":[60],"over":[61],"long":[63],"period":[64],"stable":[66],"operation.":[68],"Theory":[69],"been":[71],"developed":[72],"multivariate":[75,118],"(MUDNLF),":[78],"which":[79,92],"applied":[82],"optimize":[84],"many":[88],"parameters-a":[89],"situation":[90],"intuition":[94],"often":[96],"ineffective.":[97],"Computational":[98],"formulae":[99],"are":[100],"presented":[101],"given":[105],"normally":[106],"distributed":[107],"parameters":[109],"(correlated":[110],"or":[111],"uncorrelated),":[112],"both":[113],"univariate":[116],"and":[117],"cases.":[119]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-10-12T09:40:04.860316","created_date":"2016-06-24T00:00:00"}