{"id":"https://openalex.org/W1986387488","doi":"https://doi.org/10.1016/j.apsusc.2006.02.240","title":"Static secondary ion mass spectrometry (S-SIMS) analysis of atmospheric plasma treated polypropylene films","display_name":"Static secondary ion mass spectrometry (S-SIMS) analysis of atmospheric plasma treated polypropylene films","publication_year":2006,"publication_date":"2006-05-11","ids":{"openalex":"https://openalex.org/W1986387488","doi":"https://doi.org/10.1016/j.apsusc.2006.02.240","mag":"1986387488"},"language":"en","primary_location":{"id":"doi:10.1016/j.apsusc.2006.02.240","doi":"https://doi.org/10.1016/j.apsusc.2006.02.240","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.apsusc.2006.02.240","pdf_url":null,"source":{"id":"https://openalex.org/S42323631","display_name":"Applied Surface Science","issn_l":"0169-4332","issn":["0169-4332","1873-5584"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-2","ki-jl-1","norway-1","poland-140","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Surface Science","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://biblio.ugent.be/publication/348137/file/1128644.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024467228","display_name":"Bart Boschmans","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I149213910","display_name":"University of Antwerp","ror":"https://ror.org/008x57b05","country_code":"BE","type":"education","lineage":["https://openalex.org/I149213910"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Bart Boschmans","raw_affiliation_strings":["Department of Chemistry, University of Antwerp (CDE), Universiteitsplein 1, B-2610 Wilrijk, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Chemistry, University of Antwerp (CDE), Universiteitsplein 1, B-2610 Wilrijk, Belgium","institution_ids":["https://openalex.org/I149213910"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044231095","display_name":"Myriam Vanneste","orcid":"https://orcid.org/0000-0001-9224-4333","observed_orcids":["https://orcid.org/0000-0001-9224-4333"]},"institutions":[{"id":"https://openalex.org/I4210097779","display_name":"Centexbel","ror":"https://ror.org/00tjjak64","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210097779"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Myriam Vanneste","raw_affiliation_strings":["Centexbel, Technologiepark 7, B-9052 Zwijnaarde, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centexbel, Technologiepark 7, B-9052 Zwijnaarde, Belgium","institution_ids":["https://openalex.org/I4210097779"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032830866","display_name":"Luc Ruys","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210097779","display_name":"Centexbel","ror":"https://ror.org/00tjjak64","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210097779"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Luc Ruys","raw_affiliation_strings":["Centexbel, Technologiepark 7, B-9052 Zwijnaarde, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centexbel, Technologiepark 7, B-9052 Zwijnaarde, Belgium","institution_ids":["https://openalex.org/I4210097779"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110093119","display_name":"Eef Temmerman","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I32597200","display_name":"Ghent University","ror":"https://ror.org/00cv9y106","country_code":"BE","type":"education","lineage":["https://openalex.org/I32597200"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Eef Temmerman","raw_affiliation_strings":["University of Ghent, Department of Applied Physics, Rozier 44, B-9000 Ghent, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Ghent, Department of Applied Physics, Rozier 44, B-9000 Ghent, Belgium","institution_ids":["https://openalex.org/I32597200"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079448315","display_name":"Christophe Leys","orcid":"https://orcid.org/0000-0003-1363-0768","observed_orcids":["https://orcid.org/0000-0003-1363-0768"]},"institutions":[{"id":"https://openalex.org/I32597200","display_name":"Ghent University","ror":"https://ror.org/00cv9y106","country_code":"BE","type":"education","lineage":["https://openalex.org/I32597200"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Christophe Leys","raw_affiliation_strings":["University of Ghent, Department of Applied Physics, Rozier 44, B-9000 Ghent, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Ghent, Department of Applied Physics, Rozier 44, B-9000 Ghent, Belgium","institution_ids":["https://openalex.org/I32597200"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5086399915","display_name":"Luc Van Vaeck","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I149213910","display_name":"University of Antwerp","ror":"https://ror.org/008x57b05","country_code":"BE","type":"education","lineage":["https://openalex.org/I149213910"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Luc Van Vaeck","raw_affiliation_strings":["Department of Chemistry, University of Antwerp (CDE), Universiteitsplein 1, B-2610 Wilrijk, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Chemistry, University of Antwerp (CDE), Universiteitsplein 1, B-2610 Wilrijk, Belgium","institution_ids":["https://openalex.org/I149213910"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5024467228"],"corresponding_institution_ids":["https://openalex.org/I149213910"],"apc_list":{"value":3930,"currency":"USD","value_usd":3930},"apc_paid":null,"fwci":0.4826,"has_fulltext":true,"cited_by_count":8,"citation_normalized_percentile":{"value":0.57393016,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":93},"biblio":{"volume":"252","issue":"19","first_page":"6660","last_page":"6663"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","score":0.9848999977111816,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","score":0.9848999977111816,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10683","display_name":"Mass Spectrometry Techniques and Applications","score":0.00430000014603138,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.003800000064074993,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/polypropylene-film","display_name":"polypropylene film","score":0.9710000157356262},{"id":"https://openalex.org/keywords/atmospheric-pressure-plasma-treatment","display_name":"atmospheric plasma treatment","score":0.9290000200271606},{"id":"https://openalex.org/keywords/surface-modification","display_name":"surface modification","score":0.8790000081062317},{"id":"https://openalex.org/keywords/oxygen-containing-species","display_name":"oxygen-containing species","score":0.7250000238418579},{"id":"https://openalex.org/keywords/surface-composition","display_name":"surface composition","score":0.6880000233650208},{"id":"https://openalex.org/keywords/charge-accumulation","display_name":"charge accumulation","score":0.6000000238418579},{"id":"https://openalex.org/keywords/plasma-treatment-time","display_name":"plasma treatment time","score":0.6050000190734863}],"concepts":[{"id":"https://openalex.org/C2777973245","wikidata":"https://www.wikidata.org/wiki/Q146174","display_name":"Polypropylene","level":2,"score":0.7563288807868958},{"id":"https://openalex.org/C77671233","wikidata":"https://www.wikidata.org/wiki/Q556046","display_name":"Secondary ion mass spectrometry","level":3,"score":0.7322450876235962},{"id":"https://openalex.org/C187529661","wikidata":"https://www.wikidata.org/wiki/Q3943651","display_name":"Static secondary-ion mass spectrometry","level":4,"score":0.698569655418396},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.6936215162277222},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.6734484434127808},{"id":"https://openalex.org/C162356407","wikidata":"https://www.wikidata.org/wiki/Q180809","display_name":"Mass spectrometry","level":2,"score":0.6406182646751404},{"id":"https://openalex.org/C40325409","wikidata":"https://www.wikidata.org/wiki/Q2360668","display_name":"Mass spectrum","level":3,"score":0.5735748410224915},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.5154396295547485},{"id":"https://openalex.org/C82706917","wikidata":"https://www.wikidata.org/wiki/Q10251","display_name":"Plasma","level":2,"score":0.5140936970710754},{"id":"https://openalex.org/C98960154","wikidata":"https://www.wikidata.org/wiki/Q3983322","display_name":"Time of flight","level":2,"score":0.5001182556152344},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.48592010140419006},{"id":"https://openalex.org/C540031477","wikidata":"https://www.wikidata.org/wiki/Q629","display_name":"Oxygen","level":2,"score":0.45614808797836304},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3991687595844269},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.1549803912639618},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.14231055974960327},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07393041253089905},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.05355319380760193},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/j.apsusc.2006.02.240","doi":"https://doi.org/10.1016/j.apsusc.2006.02.240","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.apsusc.2006.02.240","pdf_url":null,"source":{"id":"https://openalex.org/S42323631","display_name":"Applied Surface Science","issn_l":"0169-4332","issn":["0169-4332","1873-5584"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-2","ki-jl-1","norway-1","poland-140","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Surface Science","raw_type":"journal-article"},{"id":"pmh:oai:archive.ugent.be:348137","doi":null,"is_oa":true,"landing_page_url":"https://biblio.ugent.be/publication/348137","pdf_url":"https://biblio.ugent.be/publication/348137/file/1128644.pdf","source":{"id":"https://openalex.org/S4306400478","display_name":"Ghent University Academic Bibliography (Ghent University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I32597200","host_organization_name":"Ghent University","host_organization_lineage":["https://openalex.org/I32597200"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ISSN: 0169-4332","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:archive.ugent.be:348137","doi":null,"is_oa":true,"landing_page_url":"https://biblio.ugent.be/publication/348137","pdf_url":"https://biblio.ugent.be/publication/348137/file/1128644.pdf","source":{"id":"https://openalex.org/S4306400478","display_name":"Ghent University Academic Bibliography (Ghent University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I32597200","host_organization_name":"Ghent University","host_organization_lineage":["https://openalex.org/I32597200"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ISSN: 0169-4332","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W1986387488.pdf","grobid_xml":"https://content.openalex.org/works/W1986387488.grobid-xml"},"referenced_works_count":8,"referenced_works":["https://openalex.org/W1966204385","https://openalex.org/W1997791500","https://openalex.org/W2016916469","https://openalex.org/W2048979590","https://openalex.org/W2073295929","https://openalex.org/W2090549807","https://openalex.org/W2101907092","https://openalex.org/W2117796393"],"related_works":["https://openalex.org/W2115338791","https://openalex.org/W2084886499","https://openalex.org/W2101907092","https://openalex.org/W2803671695","https://openalex.org/W2782330912","https://openalex.org/W2040634080","https://openalex.org/W2112393644","https://openalex.org/W2165777611","https://openalex.org/W2138786591","https://openalex.org/W1510343572"],"abstract_inverted_index":null,"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}