{"id":"https://openalex.org/W1986270167","doi":"https://doi.org/10.1063/1.1717975","title":"Improved Design and Method of Operation of Low Energy Electron Diffraction Equipment","display_name":"Improved Design and Method of Operation of Low Energy Electron Diffraction Equipment","publication_year":1962,"publication_date":"1962-07-01","ids":{"openalex":"https://openalex.org/W1986270167","doi":"https://doi.org/10.1063/1.1717975","mag":"1986270167"},"language":"en","primary_location":{"id":"doi:10.1063/1.1717975","doi":"https://doi.org/10.1063/1.1717975","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.1717975","pdf_url":null,"source":{"id":"https://openalex.org/S31010182","display_name":"Review of Scientific Instruments","issn_l":"0034-6748","issn":["0034-6748","1089-7623","1527-2400"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","ki-jl-1","medline","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Review of Scientific Instruments","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109281742","display_name":"John J. Lander","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. J. Lander","raw_affiliation_strings":["Bell Telephone Laboratories, Inc., Murray Hill, New Jersey"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bell Telephone Laboratories, Inc., Murray Hill, New Jersey","institution_ids":[]}]},{"author_position":"middle","author":{"id":null,"display_name":"J. Morrison","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. Morrison","raw_affiliation_strings":["Bell Telephone Laboratories, Inc., Murray Hill, New Jersey"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bell Telephone Laboratories, Inc., Murray Hill, New Jersey","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087759146","display_name":"F. C. Unterwald","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"F. Unterwald","raw_affiliation_strings":["Bell Telephone Laboratories, Inc., Murray Hill, New Jersey"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bell Telephone Laboratories, Inc., Murray Hill, New Jersey","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":8.1988,"has_fulltext":false,"cited_by_count":80,"citation_normalized_percentile":{"value":0.96960486,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"33","issue":"7","first_page":"782","last_page":"783"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.9911999702453613,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.9911999702453613,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.003100000089034438,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T10523","display_name":"Atomic and Molecular Physics","score":0.0027000000700354576,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/low-energy-electron-diffraction","display_name":"low-energy electron diffraction","score":0.996999979019165},{"id":"https://openalex.org/keywords/instrument-design","display_name":"instrument design","score":0.7239999771118164},{"id":"https://openalex.org/keywords/operating-methods","display_name":"operating methods","score":0.5490000247955322}],"concepts":[{"id":"https://openalex.org/C77557913","wikidata":"https://www.wikidata.org/wiki/Q864822","display_name":"Electron diffraction","level":3,"score":0.6452294588088989},{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.5465819239616394},{"id":"https://openalex.org/C100083437","wikidata":"https://www.wikidata.org/wiki/Q905977","display_name":"Low-energy electron diffraction","level":4,"score":0.4885212182998657},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4485536515712738},{"id":"https://openalex.org/C200096950","wikidata":"https://www.wikidata.org/wiki/Q455003","display_name":"Reflection high-energy electron diffraction","level":4,"score":0.44311606884002686},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.43690192699432373},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.407156378030777},{"id":"https://openalex.org/C116915560","wikidata":"https://www.wikidata.org/wiki/Q83504","display_name":"Nuclear engineering","level":1,"score":0.3673197031021118},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.33076879382133484},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18310368061065674},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.06434586644172668},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.1717975","doi":"https://doi.org/10.1063/1.1717975","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.1717975","pdf_url":null,"source":{"id":"https://openalex.org/S31010182","display_name":"Review of Scientific Instruments","issn_l":"0034-6748","issn":["0034-6748","1089-7623","1527-2400"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","ki-jl-1","medline","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Review of Scientific Instruments","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1978506526","https://openalex.org/W2005440032","https://openalex.org/W2065889874"],"related_works":["https://openalex.org/W2065889874","https://openalex.org/W1993678975","https://openalex.org/W1985942125","https://openalex.org/W4239435829","https://openalex.org/W4252502359","https://openalex.org/W4233288904","https://openalex.org/W2788839856","https://openalex.org/W4250679891","https://openalex.org/W4213113768","https://openalex.org/W4252572750"],"abstract_inverted_index":null,"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2026-09-27T08:07:27.782135","created_date":"2016-06-24T00:00:00"}