{"id":"https://openalex.org/W1985605052","doi":"https://doi.org/10.1149/1.2407405","title":"Observations on Imperfections in Silicon Material Using the Spreading Resistance Probe","display_name":"Observations on Imperfections in Silicon Material Using the Spreading Resistance Probe","publication_year":1970,"publication_date":"1970-01-01","ids":{"openalex":"https://openalex.org/W1985605052","doi":"https://doi.org/10.1149/1.2407405","mag":"1985605052"},"language":"en","primary_location":{"id":"doi:10.1149/1.2407405","doi":"https://doi.org/10.1149/1.2407405","is_oa":false,"landing_page_url":"https://doi.org/10.1149/1.2407405","pdf_url":null,"source":{"id":"https://openalex.org/S138759888","display_name":"Journal of The Electrochemical Society","issn_l":"0013-4651","issn":["0013-4651","1945-7111"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310311669","host_organization_name":"Institute of Physics","host_organization_lineage":["https://openalex.org/P4310311669"],"host_organization_lineage_names":["Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of The Electrochemical Society","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102891899","display_name":"Dinesh C. Gupta","orcid":"https://orcid.org/0000-0002-5284-8623","observed_orcids":["https://orcid.org/0000-0002-5284-8623"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"D. C. Gupta","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":null,"display_name":"J. Y. Chan","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. Y. Chan","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5051812810","display_name":"P. Wang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. Wang","raw_affiliation_strings":["Texas Instruments, Inc., Dallas, Texas 75222"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Instruments, Inc., Dallas, Texas 75222","institution_ids":["https://openalex.org/I74760111"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1950,"currency":"USD","value_usd":1950},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"117","issue":"12","first_page":"1611","last_page":"1611"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.9330999851226807,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.9330999851226807,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.0551999993622303,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.005200000014156103,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/silicon","display_name":"silicon","score":0.5210000276565552},{"id":"https://openalex.org/keywords/material-imperfections","display_name":"material imperfections","score":0.7860000133514404},{"id":"https://openalex.org/keywords/spreading-resistance-probe","display_name":"spreading resistance probe","score":0.9789999723434448},{"id":"https://openalex.org/keywords/surface-resistivity","display_name":"surface resistivity","score":0.5199999809265137},{"id":"https://openalex.org/keywords/semiconductor-defects","display_name":"semiconductor defects","score":0.3409999907016754}],"concepts":[{"id":"https://openalex.org/C207521374","wikidata":"https://www.wikidata.org/wiki/Q7580282","display_name":"Spreading resistance profiling","level":3,"score":0.7771968245506287},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.6968370676040649},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6058557629585266},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.42324337363243103},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3210366368293762},{"id":"https://openalex.org/C199289684","wikidata":"https://www.wikidata.org/wiki/Q83353","display_name":"Mineralogy","level":1,"score":0.32090693712234497},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.2788718342781067}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1149/1.2407405","doi":"https://doi.org/10.1149/1.2407405","is_oa":false,"landing_page_url":"https://doi.org/10.1149/1.2407405","pdf_url":null,"source":{"id":"https://openalex.org/S138759888","display_name":"Journal of The Electrochemical Society","issn_l":"0013-4651","issn":["0013-4651","1945-7111"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310311669","host_organization_name":"Institute of Physics","host_organization_lineage":["https://openalex.org/P4310311669"],"host_organization_lineage_names":["Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of The Electrochemical Society","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2022648998","https://openalex.org/W1988017910","https://openalex.org/W4250092434","https://openalex.org/W4244131191","https://openalex.org/W2949497550","https://openalex.org/W4249162383","https://openalex.org/W1984063973","https://openalex.org/W2079517938","https://openalex.org/W1986561623","https://openalex.org/W2085788633"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-11-08T12:12:28.789561","created_date":"2016-06-24T00:00:00"}