{"id":"https://openalex.org/W1985035015","doi":"https://doi.org/10.1007/s00170-011-3329-z","title":"Automatic 3D measuring system for optical scanning of axial fan blades","display_name":"Automatic 3D measuring system for optical scanning of axial fan blades","publication_year":2011,"publication_date":"2011-04-18","ids":{"openalex":"https://openalex.org/W1985035015","doi":"https://doi.org/10.1007/s00170-011-3329-z","mag":"1985035015"},"language":"en","primary_location":{"id":"doi:10.1007/s00170-011-3329-z","doi":"https://doi.org/10.1007/s00170-011-3329-z","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00170-011-3329-z","pdf_url":null,"source":{"id":"https://openalex.org/S77056576","display_name":"The International Journal of Advanced Manufacturing Technology","issn_l":"0268-3768","issn":["0268-3768","1433-3015"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-c","jufo-1","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The International Journal of Advanced Manufacturing Technology","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046972178","display_name":"Alan C. Lin","orcid":"https://orcid.org/0000-0002-9824-5684","observed_orcids":["https://orcid.org/0000-0002-9824-5684"]},"institutions":[{"id":"https://openalex.org/I154864474","display_name":"National Taiwan University of Science and Technology","ror":"https://ror.org/00q09pe49","country_code":"TW","type":"education","lineage":["https://openalex.org/I154864474"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Alan C. Lin","raw_affiliation_strings":["Department of Mechanical Engineering, National Taiwan University of Science and Technology, 43, Keelung Road, Section 4, Taipei, Taiwan, Republic of China","National Taiwan Univ of Science & Tech"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, National Taiwan University of Science and Technology, 43, Keelung Road, Section 4, Taipei, Taiwan, Republic of China","institution_ids":["https://openalex.org/I154864474"]},{"raw_affiliation_string":"National Taiwan Univ of Science & Tech","institution_ids":["https://openalex.org/I154864474"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018961694","display_name":"Hui-Chin Chang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I38007976","display_name":"De Lin Institute of Technology","ror":"https://ror.org/00y3by878","country_code":"TW","type":"education","lineage":["https://openalex.org/I38007976"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Chang Hui-Chin","raw_affiliation_strings":["Department of Mechanical Engineering, De Lin Institute of Technology, No. 1, Lane 380, Ching-Yun Road, Tu-Cheng, Taipei, Taiwan, Republic of China","DE LIN Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, De Lin Institute of Technology, No. 1, Lane 380, Ching-Yun Road, Tu-Cheng, Taipei, Taiwan, Republic of China","institution_ids":["https://openalex.org/I38007976"]},{"raw_affiliation_string":"DE LIN Institute of Technology","institution_ids":["https://openalex.org/I38007976"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5018961694"],"corresponding_institution_ids":["https://openalex.org/I38007976"],"apc_list":{"value":3990,"currency":"USD","value_usd":3990},"apc_paid":null,"fwci":0.8792,"has_fulltext":false,"cited_by_count":28,"citation_normalized_percentile":{"value":0.76075691,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":100},"biblio":{"volume":"57","issue":"5-8","first_page":"701","last_page":"717"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9262999892234802,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9262999892234802,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.03420000150799751,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.033799998462200165,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/freeform-surface-measurement","display_name":"freeform surface measurement","score":0.828000009059906},{"id":"https://openalex.org/keywords/optical-scanning","display_name":"optical scanning","score":0.7509999871253967},{"id":"https://openalex.org/keywords/non-contact-measurement","display_name":"non-contact measurement","score":0.8069999814033508}],"concepts":[{"id":"https://openalex.org/C16345878","wikidata":"https://www.wikidata.org/wiki/Q107472979","display_name":"Orientation (vector space)","level":2,"score":0.6688582897186279},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.6212893724441528},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.599282443523407},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48361268639564514},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.48161500692367554},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4682760238647461},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.4403284788131714},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.413411945104599},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.41256529092788696},{"id":"https://openalex.org/C2776132848","wikidata":"https://www.wikidata.org/wiki/Q3045036","display_name":"Blade (archaeology)","level":2,"score":0.41166141629219055},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.3537119925022125},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.3373412489891052},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.3293691873550415},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3217727541923523},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3035176694393158},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.16107138991355896},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.13540014624595642},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08218967914581299},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s00170-011-3329-z","doi":"https://doi.org/10.1007/s00170-011-3329-z","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00170-011-3329-z","pdf_url":null,"source":{"id":"https://openalex.org/S77056576","display_name":"The International Journal of Advanced Manufacturing Technology","issn_l":"0268-3768","issn":["0268-3768","1433-3015"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-c","jufo-1","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The International Journal of Advanced Manufacturing Technology","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1544854574","https://openalex.org/W1909564973","https://openalex.org/W1996409371","https://openalex.org/W2001061673","https://openalex.org/W2001224122","https://openalex.org/W2008913713","https://openalex.org/W2028083222","https://openalex.org/W2031963958","https://openalex.org/W2032970922","https://openalex.org/W2049958121","https://openalex.org/W2067016937","https://openalex.org/W2070708370","https://openalex.org/W2083499145","https://openalex.org/W2086856145","https://openalex.org/W2312922082","https://openalex.org/W2362808110","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W2323652966","https://openalex.org/W1988536062","https://openalex.org/W4404443113","https://openalex.org/W2765699916","https://openalex.org/W2092801859","https://openalex.org/W7096272676","https://openalex.org/W1981146632","https://openalex.org/W1556639731","https://openalex.org/W2072620309","https://openalex.org/W2123482882"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":17},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}