{"id":"https://openalex.org/W1982996360","doi":"https://doi.org/10.1016/j.nima.2010.04.040","title":"Demonstration of a silicon photomultiplier with bulk integrated quenching resistors on epitaxial silicon","display_name":"Demonstration of a silicon photomultiplier with bulk integrated quenching resistors on epitaxial silicon","publication_year":2010,"publication_date":"2010-04-21","ids":{"openalex":"https://openalex.org/W1982996360","doi":"https://doi.org/10.1016/j.nima.2010.04.040","mag":"1982996360"},"language":"en","primary_location":{"id":"doi:10.1016/j.nima.2010.04.040","doi":"https://doi.org/10.1016/j.nima.2010.04.040","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.nima.2010.04.040","pdf_url":null,"source":{"id":"https://openalex.org/S145630073","display_name":"Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment","issn_l":"0168-9002","issn":["0168-9002","1872-9576"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084743133","display_name":"G.Q. Zhang","orcid":"https://orcid.org/0009-0001-7862-9832","observed_orcids":["https://orcid.org/0009-0001-7862-9832"]},"institutions":[{"id":"https://openalex.org/I25254941","display_name":"Beijing Normal University","ror":"https://ror.org/022k4wk35","country_code":"CN","type":"education","lineage":["https://openalex.org/I25254941"]},{"id":"https://openalex.org/I4210132047","display_name":"Beijing Radiation Center","ror":"https://ror.org/030t7nd77","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210132047"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"G.Q. Zhang","raw_affiliation_strings":["The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing Radiation Center, Beijing 100875, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing Radiation Center, Beijing 100875, China","institution_ids":["https://openalex.org/I25254941","https://openalex.org/I4210132047"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100680133","display_name":"Xiaobo Hu","orcid":"https://orcid.org/0000-0003-4278-4600","observed_orcids":["https://orcid.org/0000-0003-4278-4600"]},"institutions":[{"id":"https://openalex.org/I25254941","display_name":"Beijing Normal University","ror":"https://ror.org/022k4wk35","country_code":"CN","type":"education","lineage":["https://openalex.org/I25254941"]},{"id":"https://openalex.org/I4210132047","display_name":"Beijing Radiation Center","ror":"https://ror.org/030t7nd77","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210132047"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"X.B. Hu","raw_affiliation_strings":["The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing Radiation Center, Beijing 100875, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing Radiation Center, Beijing 100875, China","institution_ids":["https://openalex.org/I25254941","https://openalex.org/I4210132047"]}]},{"author_position":"middle","author":{"id":null,"display_name":"C.Z. Hu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I25254941","display_name":"Beijing Normal University","ror":"https://ror.org/022k4wk35","country_code":"CN","type":"education","lineage":["https://openalex.org/I25254941"]},{"id":"https://openalex.org/I4210132047","display_name":"Beijing Radiation Center","ror":"https://ror.org/030t7nd77","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210132047"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"C.Z. Hu","raw_affiliation_strings":["The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing Radiation Center, Beijing 100875, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing Radiation Center, Beijing 100875, China","institution_ids":["https://openalex.org/I25254941","https://openalex.org/I4210132047"]}]},{"author_position":"middle","author":{"id":null,"display_name":"D.P. Yin","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I25254941","display_name":"Beijing Normal University","ror":"https://ror.org/022k4wk35","country_code":"CN","type":"education","lineage":["https://openalex.org/I25254941"]},{"id":"https://openalex.org/I4210132047","display_name":"Beijing Radiation Center","ror":"https://ror.org/030t7nd77","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210132047"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"D.P. Yin","raw_affiliation_strings":["The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing Radiation Center, Beijing 100875, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing Radiation Center, Beijing 100875, China","institution_ids":["https://openalex.org/I25254941","https://openalex.org/I4210132047"]}]},{"author_position":"middle","author":{"id":null,"display_name":"K. Liang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I25254941","display_name":"Beijing Normal University","ror":"https://ror.org/022k4wk35","country_code":"CN","type":"education","lineage":["https://openalex.org/I25254941"]},{"id":"https://openalex.org/I4210132047","display_name":"Beijing Radiation Center","ror":"https://ror.org/030t7nd77","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210132047"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"K. Liang","raw_affiliation_strings":["The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing Radiation Center, Beijing 100875, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing Radiation Center, Beijing 100875, China","institution_ids":["https://openalex.org/I25254941","https://openalex.org/I4210132047"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089742133","display_name":"Ronghua Yang","orcid":"https://orcid.org/0000-0001-7873-6892","observed_orcids":["https://orcid.org/0000-0001-7873-6892","https://orcid.org/0000-0002-4162-582X","https://orcid.org/0009-0005-7345-098X"]},"institutions":[{"id":"https://openalex.org/I25254941","display_name":"Beijing Normal University","ror":"https://ror.org/022k4wk35","country_code":"CN","type":"education","lineage":["https://openalex.org/I25254941"]},{"id":"https://openalex.org/I4210132047","display_name":"Beijing Radiation Center","ror":"https://ror.org/030t7nd77","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210132047"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"R. Yang","raw_affiliation_strings":["The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing Radiation Center, Beijing 100875, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing Radiation Center, Beijing 100875, China","institution_ids":["https://openalex.org/I25254941","https://openalex.org/I4210132047"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101438620","display_name":"Dejun Han","orcid":"https://orcid.org/0000-0002-7776-2359","observed_orcids":["https://orcid.org/0000-0002-7776-2359"]},"institutions":[{"id":"https://openalex.org/I25254941","display_name":"Beijing Normal University","ror":"https://ror.org/022k4wk35","country_code":"CN","type":"education","lineage":["https://openalex.org/I25254941"]},{"id":"https://openalex.org/I4210132047","display_name":"Beijing Radiation Center","ror":"https://ror.org/030t7nd77","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210132047"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"D.J. Han","raw_affiliation_strings":["The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing Radiation Center, Beijing 100875, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing Radiation Center, Beijing 100875, China","institution_ids":["https://openalex.org/I25254941","https://openalex.org/I4210132047"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5101438620"],"corresponding_institution_ids":["https://openalex.org/I25254941","https://openalex.org/I4210132047"],"apc_list":{"value":2620,"currency":"USD","value_usd":2620},"apc_paid":null,"fwci":3.895,"has_fulltext":false,"cited_by_count":35,"citation_normalized_percentile":{"value":0.92847284,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":"621","issue":"1-3","first_page":"116","last_page":"120"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11216","display_name":"Radiation Detection and Scintillator Technologies","score":0.7943999767303467,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11216","display_name":"Radiation Detection and Scintillator Technologies","score":0.7943999767303467,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.13220000267028809,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.03020000085234642,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/silicon-photomultipliers","display_name":"silicon photomultipliers","score":0.9990000128746033},{"id":"https://openalex.org/keywords/epitaxial-silicon","display_name":"epitaxial silicon","score":0.9049999713897705},{"id":"https://openalex.org/keywords/photon-detection-efficiency","display_name":"photon detection efficiency","score":0.8820000290870667},{"id":"https://openalex.org/keywords/dark-count-rate","display_name":"dark count rate","score":0.9369999766349792},{"id":"https://openalex.org/keywords/single-photon-detection","display_name":"single-photon detection","score":0.9639999866485596},{"id":"https://openalex.org/keywords/optical-crosstalk","display_name":"optical crosstalk","score":0.925000011920929},{"id":"https://openalex.org/keywords/gain","display_name":"gain","score":0.6439999938011169}],"concepts":[{"id":"https://openalex.org/C104335537","wikidata":"https://www.wikidata.org/wiki/Q1085747","display_name":"Silicon photomultiplier","level":4,"score":0.9677743315696716},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.7371503710746765},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7276138067245483},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6850316524505615},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.6376737356185913},{"id":"https://openalex.org/C121745418","wikidata":"https://www.wikidata.org/wiki/Q585536","display_name":"Quenching (fluorescence)","level":3,"score":0.5681619644165039},{"id":"https://openalex.org/C110738630","wikidata":"https://www.wikidata.org/wiki/Q1135540","display_name":"Epitaxy","level":3,"score":0.4909997284412384},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.4330994486808777},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2982136607170105},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.27188822627067566},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15510845184326172},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11946377158164978},{"id":"https://openalex.org/C161694136","wikidata":"https://www.wikidata.org/wiki/Q910990","display_name":"Scintillator","level":3,"score":0.11116880178451538},{"id":"https://openalex.org/C91881484","wikidata":"https://www.wikidata.org/wiki/Q191807","display_name":"Fluorescence","level":2,"score":0.0914430022239685},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.08247372508049011},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.06660008430480957},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.051376134157180786},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.nima.2010.04.040","doi":"https://doi.org/10.1016/j.nima.2010.04.040","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.nima.2010.04.040","pdf_url":null,"source":{"id":"https://openalex.org/S145630073","display_name":"Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment","issn_l":"0168-9002","issn":["0168-9002","1872-9576"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1975496472","https://openalex.org/W2002267979","https://openalex.org/W2022339979","https://openalex.org/W2034937129","https://openalex.org/W2043474845","https://openalex.org/W2048005863","https://openalex.org/W2049606753","https://openalex.org/W2063969958","https://openalex.org/W2094300645","https://openalex.org/W2097599716"],"related_works":["https://openalex.org/W1995241411","https://openalex.org/W2546178917","https://openalex.org/W2464375230","https://openalex.org/W2008775969","https://openalex.org/W2745370597","https://openalex.org/W2002267979","https://openalex.org/W2048005863","https://openalex.org/W6913074586","https://openalex.org/W6987248410","https://openalex.org/W2017800586"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":6},{"year":2012,"cited_by_count":4}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}