{"id":"https://openalex.org/W1982935379","doi":"https://doi.org/10.1109/t-pas.1975.31820","title":"Common mode failure analysis","display_name":"Common mode failure analysis","publication_year":1975,"publication_date":"1975-01-01","ids":{"openalex":"https://openalex.org/W1982935379","doi":"https://doi.org/10.1109/t-pas.1975.31820","mag":"1982935379"},"language":"en","primary_location":{"id":"doi:10.1109/t-pas.1975.31820","doi":"https://doi.org/10.1109/t-pas.1975.31820","is_oa":false,"landing_page_url":"https://doi.org/10.1109/t-pas.1975.31820","pdf_url":null,"source":{"id":"https://openalex.org/S35391503","display_name":"IEEE Transactions on Power Apparatus and Systems","issn_l":"0018-9510","issn":["0018-9510"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Power Apparatus and Systems","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5020668022","display_name":"W.C. Gangloff","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I9217761","display_name":"Westinghouse Electric (United States)","ror":"https://ror.org/04p8w0f39","country_code":"US","type":"company","lineage":["https://openalex.org/I9217761"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"W.C. Gangloff","raw_affiliation_strings":["Westinghouse Electric Corporation, Pittsburgh, PA, USA","Westinghouse Electric Corporation, Pittsburgh, Pa"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Westinghouse Electric Corporation, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I9217761"]},{"raw_affiliation_string":"Westinghouse Electric Corporation, Pittsburgh, Pa","institution_ids":["https://openalex.org/I9217761"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5020668022"],"corresponding_institution_ids":["https://openalex.org/I9217761"],"apc_list":null,"apc_paid":null,"fwci":24.1288,"has_fulltext":false,"cited_by_count":46,"citation_normalized_percentile":{"value":0.99396031,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":87,"max":97},"biblio":{"volume":"94","issue":"1","first_page":"27","last_page":"30"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9731000065803528,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9731000065803528,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.019300000742077827,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.002300000051036477,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/common-mode-failures","display_name":"common mode failures","score":0.8500000238418579},{"id":"https://openalex.org/keywords/common-cause-failure","display_name":"common cause failure","score":0.8920000195503235},{"id":"https://openalex.org/keywords/multiple-failures","display_name":"multiple failures","score":0.4819999933242798},{"id":"https://openalex.org/keywords/fault-trees","display_name":"fault trees","score":0.49900001287460327},{"id":"https://openalex.org/keywords/reliability-block-diagram","display_name":"reliability block diagram","score":0.984000027179718},{"id":"https://openalex.org/keywords/reactor-protection-system","display_name":"reactor protection system","score":0.8159999847412109},{"id":"https://openalex.org/keywords/commercial-nuclear-reactors","display_name":"commercial nuclear reactors","score":0.5989999771118164},{"id":"https://openalex.org/keywords/system-reliability","display_name":"system reliability","score":0.5550000071525574}],"concepts":[{"id":"https://openalex.org/C107094494","wikidata":"https://www.wikidata.org/wiki/Q428453","display_name":"Fault tree analysis","level":2,"score":0.8645431995391846},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.8196184039115906},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7414265275001526},{"id":"https://openalex.org/C18074226","wikidata":"https://www.wikidata.org/wiki/Q7310986","display_name":"Reliability block diagram","level":3,"score":0.7308783531188965},{"id":"https://openalex.org/C66283442","wikidata":"https://www.wikidata.org/wiki/Q1389268","display_name":"Failure mode and effects analysis","level":2,"score":0.728753924369812},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.5792456269264221},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5405648350715637},{"id":"https://openalex.org/C189714311","wikidata":"https://www.wikidata.org/wiki/Q1530371","display_name":"Common-mode signal","level":4,"score":0.5314447283744812},{"id":"https://openalex.org/C95713431","wikidata":"https://www.wikidata.org/wiki/Q631425","display_name":"Vulnerability (computing)","level":2,"score":0.516605019569397},{"id":"https://openalex.org/C167063184","wikidata":"https://www.wikidata.org/wiki/Q1400839","display_name":"Vulnerability assessment","level":3,"score":0.5123163461685181},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.4869764745235443},{"id":"https://openalex.org/C48677424","wikidata":"https://www.wikidata.org/wiki/Q6888088","display_name":"Mode (computer interface)","level":2,"score":0.4831082820892334},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.4681831896305084},{"id":"https://openalex.org/C149227320","wikidata":"https://www.wikidata.org/wiki/Q884718","display_name":"Block diagram","level":2,"score":0.42683666944503784},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3797804117202759},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3075273633003235},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.2408863604068756},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11782148480415344},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10505616664886475},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C542102704","wikidata":"https://www.wikidata.org/wiki/Q183257","display_name":"Psychotherapist","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C13412647","wikidata":"https://www.wikidata.org/wiki/Q174948","display_name":"Analog signal","level":3,"score":0.0},{"id":"https://openalex.org/C137176749","wikidata":"https://www.wikidata.org/wiki/Q4105337","display_name":"Psychological resilience","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/t-pas.1975.31820","doi":"https://doi.org/10.1109/t-pas.1975.31820","is_oa":false,"landing_page_url":"https://doi.org/10.1109/t-pas.1975.31820","pdf_url":null,"source":{"id":"https://openalex.org/S35391503","display_name":"IEEE Transactions on Power Apparatus and Systems","issn_l":"0018-9510","issn":["0018-9510"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Power Apparatus and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2069452837","https://openalex.org/W2092048755","https://openalex.org/W2001898056","https://openalex.org/W3096364625","https://openalex.org/W2348538328","https://openalex.org/W4386996582","https://openalex.org/W28595318","https://openalex.org/W3196153844","https://openalex.org/W3194799976","https://openalex.org/W2038265286"],"abstract_inverted_index":{"Standard":[0],"Reliability":[1],"analysis":[2],"techniques":[3,67],"have":[4,93],"demonstrated":[5],"the":[6,18,43,55,58,66,85,89,98],"capability":[7],"to":[8,12,28,64,68,96],"evaluate":[9,97],"system":[10],"vulnerability":[11],"random":[13],"component":[14],"failures.":[15],"Recently,":[16],"in":[17,26,39,77],"nuclear":[19],"power":[20,106],"industry,":[21],"interest":[22],"has":[23],"been":[24,94],"developing":[25],"methods":[27],"consider":[29],"systematic,":[30],"nonrandom,":[31],"so-called":[32],"\"Common-mode\"":[33],"failures":[34,71],"which":[35],"are":[36],"not":[37],"tractable":[38],"quantitative":[40],"terms":[41],"using":[42],"usual":[44],"fault":[45,86],"tree":[46,87],"or":[47],"reliability":[48,61,90],"block":[49,91],"diagram":[50],"approaches.":[51],"This":[52],"paper":[53],"summarizes":[54],"state":[56],"of":[57,83,100],"art":[59],"as":[60],"engineers":[62],"seek":[63],"extend":[65],"include":[69],"multiple":[70],"from":[72],"a":[73,78],"common":[74,79],"cause":[75],"(or":[76],"mode).":[80],"Qualitative":[81],"extensions":[82],"both":[84],"and":[88],"diagrams":[92],"used":[95],"adequacy":[99],"reactor":[101],"protection":[102],"circuitry":[103],"for":[104],"commercial":[105],"reactors.":[107]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2016-06-24T00:00:00"}