{"id":"https://openalex.org/W1982682012","doi":"https://doi.org/10.1016/j.sse.2004.03.016","title":"Silicon nanocrystal memory devices obtained by ultra-low-energy ion-beam synthesis","display_name":"Silicon nanocrystal memory devices obtained by ultra-low-energy ion-beam synthesis","publication_year":2004,"publication_date":"2004-04-29","ids":{"openalex":"https://openalex.org/W1982682012","doi":"https://doi.org/10.1016/j.sse.2004.03.016","mag":"1982682012"},"language":"en","primary_location":{"id":"doi:10.1016/j.sse.2004.03.016","doi":"https://doi.org/10.1016/j.sse.2004.03.016","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.sse.2004.03.016","pdf_url":null,"source":{"id":"https://openalex.org/S77418581","display_name":"Solid-State Electronics","issn_l":"0038-1101","issn":["0038-1101","1879-2405"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Solid-State Electronics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088937977","display_name":"Panagiotis Dimitrakis","orcid":"https://orcid.org/0000-0002-4941-0487","observed_orcids":["https://orcid.org/0000-0002-4941-0487"]},"institutions":[{"id":"https://openalex.org/I203474044","display_name":"National Centre of Scientific Research \"Demokritos\"","ror":"https://ror.org/038jp4m40","country_code":"GR","type":"facility","lineage":["https://openalex.org/I203474044"]}],"countries":["GR"],"is_corresponding":true,"raw_author_name":"P Dimitrakis","raw_affiliation_strings":["IMEL, NCSR \u201cDemokritos\u201d, Institute of Microelectronics, 15310 Aghia Paraskevi, Greece"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMEL, NCSR \u201cDemokritos\u201d, Institute of Microelectronics, 15310 Aghia Paraskevi, Greece","institution_ids":["https://openalex.org/I203474044"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066902701","display_name":"Eleftherios Kapetanakis","orcid":"https://orcid.org/0000-0002-7919-7023","observed_orcids":["https://orcid.org/0000-0002-7919-7023"]},"institutions":[{"id":"https://openalex.org/I203474044","display_name":"National Centre of Scientific Research \"Demokritos\"","ror":"https://ror.org/038jp4m40","country_code":"GR","type":"facility","lineage":["https://openalex.org/I203474044"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"E Kapetanakis","raw_affiliation_strings":["IMEL, NCSR \u201cDemokritos\u201d, Institute of Microelectronics, 15310 Aghia Paraskevi, Greece"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMEL, NCSR \u201cDemokritos\u201d, Institute of Microelectronics, 15310 Aghia Paraskevi, Greece","institution_ids":["https://openalex.org/I203474044"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051466360","display_name":"D. Tsoukalas","orcid":"https://orcid.org/0000-0001-5189-3396","observed_orcids":["https://orcid.org/0000-0001-5189-3396"]},"institutions":[{"id":"https://openalex.org/I203474044","display_name":"National Centre of Scientific Research \"Demokritos\"","ror":"https://ror.org/038jp4m40","country_code":"GR","type":"facility","lineage":["https://openalex.org/I203474044"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"D Tsoukalas","raw_affiliation_strings":["IMEL, NCSR \u201cDemokritos\u201d, Institute of Microelectronics, 15310 Aghia Paraskevi, Greece"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMEL, NCSR \u201cDemokritos\u201d, Institute of Microelectronics, 15310 Aghia Paraskevi, Greece","institution_ids":["https://openalex.org/I203474044"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026212352","display_name":"Dimitrios Skarlatos","orcid":"https://orcid.org/0000-0002-1749-257X","observed_orcids":["https://orcid.org/0000-0002-1749-257X"]},"institutions":[{"id":"https://openalex.org/I203474044","display_name":"National Centre of Scientific Research \"Demokritos\"","ror":"https://ror.org/038jp4m40","country_code":"GR","type":"facility","lineage":["https://openalex.org/I203474044"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"D Skarlatos","raw_affiliation_strings":["IMEL, NCSR \u201cDemokritos\u201d, Institute of Microelectronics, 15310 Aghia Paraskevi, Greece"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMEL, NCSR \u201cDemokritos\u201d, Institute of Microelectronics, 15310 Aghia Paraskevi, Greece","institution_ids":["https://openalex.org/I203474044"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001412200","display_name":"Caroline Bonafos","orcid":"https://orcid.org/0000-0001-5140-6690","observed_orcids":["https://orcid.org/0000-0001-5140-6690"]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210135147","display_name":"Centre d\u2019\u00c9laboration de Mat\u00e9riaux et d\u2019\u00c9tudes Structurales","ror":"https://ror.org/03kwnqq69","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I196454796","https://openalex.org/I4210098836","https://openalex.org/I4210135147","https://openalex.org/I4405258862"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"C Bonafos","raw_affiliation_strings":["CNRS/CEMES, 29 rue Jeanne Marvig, 31055 Toulouse, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNRS/CEMES, 29 rue Jeanne Marvig, 31055 Toulouse, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210135147"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109364105","display_name":"G. Benassayag","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210135147","display_name":"Centre d\u2019\u00c9laboration de Mat\u00e9riaux et d\u2019\u00c9tudes Structurales","ror":"https://ror.org/03kwnqq69","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I196454796","https://openalex.org/I4210098836","https://openalex.org/I4210135147","https://openalex.org/I4405258862"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"G Ben Asssayag","raw_affiliation_strings":["CNRS/CEMES, 29 rue Jeanne Marvig, 31055 Toulouse, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNRS/CEMES, 29 rue Jeanne Marvig, 31055 Toulouse, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210135147"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024168567","display_name":"A. Claverie","orcid":"https://orcid.org/0000-0003-2211-4618","observed_orcids":["https://orcid.org/0000-0003-2211-4618"]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210135147","display_name":"Centre d\u2019\u00c9laboration de Mat\u00e9riaux et d\u2019\u00c9tudes Structurales","ror":"https://ror.org/03kwnqq69","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I196454796","https://openalex.org/I4210098836","https://openalex.org/I4210135147","https://openalex.org/I4405258862"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"A Claverie","raw_affiliation_strings":["CNRS/CEMES, 29 rue Jeanne Marvig, 31055 Toulouse, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNRS/CEMES, 29 rue Jeanne Marvig, 31055 Toulouse, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210135147"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022595157","display_name":"Michele Perego","orcid":"https://orcid.org/0000-0001-7431-1969","observed_orcids":["https://orcid.org/0000-0001-7431-1969"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M Perego","raw_affiliation_strings":["Laboratorio MDM-INFM, via C.Olivetti 2, 20041 Agrate Brianza, MI, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratorio MDM-INFM, via C.Olivetti 2, 20041 Agrate Brianza, MI, Italy","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008647090","display_name":"Marco Fanciulli","orcid":"https://orcid.org/0000-0003-2951-0859","observed_orcids":["https://orcid.org/0000-0003-2951-0859"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M Fanciulli","raw_affiliation_strings":["Laboratorio MDM-INFM, via C.Olivetti 2, 20041 Agrate Brianza, MI, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratorio MDM-INFM, via C.Olivetti 2, 20041 Agrate Brianza, MI, Italy","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037684383","display_name":"Valter Soncini","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"V Soncini","raw_affiliation_strings":["ST Central R&D Agrate, Via Olivetti 2, 20041, Agrate, Brianza, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ST Central R&D Agrate, Via Olivetti 2, 20041, Agrate, Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047374695","display_name":"R. Sotgiu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"R Sotgiu","raw_affiliation_strings":["ST Central R&D Agrate, Via Olivetti 2, 20041, Agrate, Brianza, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ST Central R&D Agrate, Via Olivetti 2, 20041, Agrate, Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068033542","display_name":"Aditya Agarwal","orcid":"https://orcid.org/0000-0002-1141-0991","observed_orcids":["https://orcid.org/0000-0002-1141-0991"]},"institutions":[{"id":"https://openalex.org/I116272418","display_name":"Axcelis Technologies (United States)","ror":"https://ror.org/018pfae44","country_code":"US","type":"company","lineage":["https://openalex.org/I116272418"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A Agarwal","raw_affiliation_strings":["Axcelis Technologies, Inc., 55 Cherry Hill Drive, Beverly MA 01915, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Axcelis Technologies, Inc., 55 Cherry Hill Drive, Beverly MA 01915, USA","institution_ids":["https://openalex.org/I116272418"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111968197","display_name":"M. S. Ameen","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I116272418","display_name":"Axcelis Technologies (United States)","ror":"https://ror.org/018pfae44","country_code":"US","type":"company","lineage":["https://openalex.org/I116272418"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M Ameen","raw_affiliation_strings":["Axcelis Technologies, Inc., 55 Cherry Hill Drive, Beverly MA 01915, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Axcelis Technologies, Inc., 55 Cherry Hill Drive, Beverly MA 01915, USA","institution_ids":["https://openalex.org/I116272418"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113343609","display_name":"Christina Sohl","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I116272418","display_name":"Axcelis Technologies (United States)","ror":"https://ror.org/018pfae44","country_code":"US","type":"company","lineage":["https://openalex.org/I116272418"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C Sohl","raw_affiliation_strings":["Axcelis Technologies, Inc., 55 Cherry Hill Drive, Beverly MA 01915, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Axcelis Technologies, Inc., 55 Cherry Hill Drive, Beverly MA 01915, USA","institution_ids":["https://openalex.org/I116272418"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084238973","display_name":"P. Normand","orcid":"https://orcid.org/0000-0002-7342-6542","observed_orcids":["https://orcid.org/0000-0002-7342-6542"]},"institutions":[{"id":"https://openalex.org/I203474044","display_name":"National Centre of Scientific Research \"Demokritos\"","ror":"https://ror.org/038jp4m40","country_code":"GR","type":"facility","lineage":["https://openalex.org/I203474044"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"P Normand","raw_affiliation_strings":["IMEL, NCSR \u201cDemokritos\u201d, Institute of Microelectronics, 15310 Aghia Paraskevi, Greece"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMEL, NCSR \u201cDemokritos\u201d, Institute of Microelectronics, 15310 Aghia Paraskevi, Greece","institution_ids":["https://openalex.org/I203474044"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5088937977"],"corresponding_institution_ids":["https://openalex.org/I203474044"],"apc_list":{"value":2410,"currency":"USD","value_usd":2410},"apc_paid":null,"fwci":7.9144,"has_fulltext":false,"cited_by_count":68,"citation_normalized_percentile":{"value":0.97519281,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":87,"max":99},"biblio":{"volume":"48","issue":"9","first_page":"1511","last_page":"1517"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.6401000022888184,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.6401000022888184,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11169","display_name":"Silicon Nanostructures and Photoluminescence","score":0.2280000001192093,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.050999999046325684,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/silicon-nanocrystals","display_name":"silicon nanocrystals","score":0.9570000171661377},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"non-volatile memory","score":0.8629999756813049},{"id":"https://openalex.org/keywords/ultra-low-energy-ion-implantation","display_name":"ultra-low energy ion implantation","score":0.8820000290870667},{"id":"https://openalex.org/keywords/annealing","display_name":"annealing","score":0.7870000004768372},{"id":"https://openalex.org/keywords/boron-contamination","display_name":"boron contamination","score":0.7450000047683716},{"id":"https://openalex.org/keywords/parasitic-currents","display_name":"parasitic currents","score":0.8339999914169312},{"id":"https://openalex.org/keywords/threshold-voltage-shift","display_name":"threshold voltage shift","score":0.8830000162124634},{"id":"https://openalex.org/keywords/electron-and-hole-trapping","display_name":"electron and hole trapping","score":0.7680000066757202},{"id":"https://openalex.org/keywords/charge-retention","display_name":"charge retention","score":0.9789999723434448},{"id":"https://openalex.org/keywords/memory-window","display_name":"memory window","score":0.5709999799728394}],"concepts":[{"id":"https://openalex.org/C175854130","wikidata":"https://www.wikidata.org/wiki/Q98276914","display_name":"Nanocrystal","level":2,"score":0.7309882640838623},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7289204001426697},{"id":"https://openalex.org/C2777924906","wikidata":"https://www.wikidata.org/wiki/Q34168","display_name":"Trapping","level":2,"score":0.704102098941803},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.6555671095848083},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5906097292900085},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.534440279006958},{"id":"https://openalex.org/C2777855556","wikidata":"https://www.wikidata.org/wiki/Q4339544","display_name":"Annealing (glass)","level":2,"score":0.5235661864280701},{"id":"https://openalex.org/C41823505","wikidata":"https://www.wikidata.org/wiki/Q1436752","display_name":"Ion implantation","level":3,"score":0.5086370706558228},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.49130335450172424},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.48141786456108093},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.4692903459072113},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.4578191041946411},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4257880449295044},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.407412588596344},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.34246546030044556},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.1619342863559723},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.16172215342521667},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.sse.2004.03.016","doi":"https://doi.org/10.1016/j.sse.2004.03.016","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.sse.2004.03.016","pdf_url":null,"source":{"id":"https://openalex.org/S77418581","display_name":"Solid-State Electronics","issn_l":"0038-1101","issn":["0038-1101","1879-2405"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Solid-State Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1520009589","https://openalex.org/W1981901304","https://openalex.org/W2009851040","https://openalex.org/W2010791591","https://openalex.org/W2021122851","https://openalex.org/W2023347132","https://openalex.org/W2032928151","https://openalex.org/W2072096873","https://openalex.org/W2122491682","https://openalex.org/W2132321654","https://openalex.org/W2132555393","https://openalex.org/W2151654658"],"related_works":["https://openalex.org/W2076523431","https://openalex.org/W2587460501","https://openalex.org/W2129526788","https://openalex.org/W2138534942","https://openalex.org/W4236914331","https://openalex.org/W7197781742","https://openalex.org/W2007842206","https://openalex.org/W2064349680","https://openalex.org/W2545509667","https://openalex.org/W2107057379"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":7}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}