{"id":"https://openalex.org/W1982657230","doi":"https://doi.org/10.1063/1.1843288","title":"Ferroelectricity and local currents in epitaxial 5- and 9-nm-thick Pb(Zr,Ti)O3 ultrathin films by scanning probe microscopy","display_name":"Ferroelectricity and local currents in epitaxial 5- and 9-nm-thick Pb(Zr,Ti)O3 ultrathin films by scanning probe microscopy","publication_year":2004,"publication_date":"2004-12-23","ids":{"openalex":"https://openalex.org/W1982657230","doi":"https://doi.org/10.1063/1.1843288","mag":"1982657230"},"language":"en","primary_location":{"id":"doi:10.1063/1.1843288","doi":"https://doi.org/10.1063/1.1843288","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.1843288","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081923476","display_name":"Hironori Fujisawa","orcid":"https://orcid.org/0000-0002-8497-5846","observed_orcids":["https://orcid.org/0000-0002-8497-5846"]},"institutions":[{"id":"https://openalex.org/I180941496","display_name":"University of Hyogo","ror":"https://ror.org/0151bmh98","country_code":"JP","type":"education","lineage":["https://openalex.org/I180941496"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hironori Fujisawa","raw_affiliation_strings":["Department of Electrical Engineering and Computer Sciences , University of Hyogo, 2167 Shosha, Himeji, Hyogo 671-2201, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Sciences , University of Hyogo, 2167 Shosha, Himeji, Hyogo 671-2201, Japan","institution_ids":["https://openalex.org/I180941496"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104054490","display_name":"Masaru Shimizu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I180941496","display_name":"University of Hyogo","ror":"https://ror.org/0151bmh98","country_code":"JP","type":"education","lineage":["https://openalex.org/I180941496"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masaru Shimizu","raw_affiliation_strings":["Department of Electrical Engineering and Computer Sciences , University of Hyogo, 2167 Shosha, Himeji, Hyogo 671-2201, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Sciences , University of Hyogo, 2167 Shosha, Himeji, Hyogo 671-2201, Japan","institution_ids":["https://openalex.org/I180941496"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103446422","display_name":"Hirohiko Niu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I180941496","display_name":"University of Hyogo","ror":"https://ror.org/0151bmh98","country_code":"JP","type":"education","lineage":["https://openalex.org/I180941496"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hirohiko Niu","raw_affiliation_strings":["Department of Electrical Engineering and Computer Sciences , University of Hyogo, 2167 Shosha, Himeji, Hyogo 671-2201, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Sciences , University of Hyogo, 2167 Shosha, Himeji, Hyogo 671-2201, Japan","institution_ids":["https://openalex.org/I180941496"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041854566","display_name":"Hajime Nonomura","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hajime Nonomura","raw_affiliation_strings":["Department of Electrical Engineering and Computer Sciences , Himeji Institute of Technology, 2167 Shosha, Himeji, Hyogo 671-2201, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Sciences , Himeji Institute of Technology, 2167 Shosha, Himeji, Hyogo 671-2201, Japan","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110099525","display_name":"K\u014dichiro Honda","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Koichiro Honda","raw_affiliation_strings":["Fujitsu Laboratories Limited , 10-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0197, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Limited , 10-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0197, Japan","institution_ids":["https://openalex.org/I2252096349"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.5677,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.61535045,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":95},"biblio":{"volume":"86","issue":"1","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":0.9603999853134155,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":0.9603999853134155,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.02250000089406967,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.00930000003427267,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ferroelectricity","display_name":"ferroelectricity","score":0.9160000085830688},{"id":"https://openalex.org/keywords/lead-zirconate-titanate","display_name":"lead zirconate titanate","score":0.8970000147819519},{"id":"https://openalex.org/keywords/ultrathin-films","display_name":"ultrathin films","score":0.8159999847412109},{"id":"https://openalex.org/keywords/epitaxial-films","display_name":"epitaxial thin films","score":0.7009999752044678},{"id":"https://openalex.org/keywords/local-currents","display_name":"local currents","score":0.7139999866485596},{"id":"https://openalex.org/keywords/antiparallel-domains","display_name":"antiparallel domains","score":0.9110000133514404},{"id":"https://openalex.org/keywords/domain-contrast","display_name":"domain contrast","score":0.5899999737739563},{"id":"https://openalex.org/keywords/piezoelectric-vibration","display_name":"piezoelectric vibration","score":0.6819999814033508},{"id":"https://openalex.org/keywords/electrostatic-interactions","display_name":"electrostatic interactions","score":0.699999988079071},{"id":"https://openalex.org/keywords/srruo3-srtio3-substrate","display_name":"SrRuO3/SrTiO3 substrate","score":0.8119999766349792},{"id":"https://openalex.org/keywords/surface-steps","display_name":"surface steps","score":0.4359999895095825},{"id":"https://openalex.org/keywords/ferroelectric-stability","display_name":"ferroelectric stability","score":0.7379999756813049}],"concepts":[{"id":"https://openalex.org/C172436747","wikidata":"https://www.wikidata.org/wiki/Q3312359","display_name":"Piezoresponse force microscopy","level":4,"score":0.9504820108413696},{"id":"https://openalex.org/C79090758","wikidata":"https://www.wikidata.org/wiki/Q1045739","display_name":"Ferroelectricity","level":3,"score":0.7650970220565796},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7322028875350952},{"id":"https://openalex.org/C110738630","wikidata":"https://www.wikidata.org/wiki/Q1135540","display_name":"Epitaxy","level":3,"score":0.5863912105560303},{"id":"https://openalex.org/C71246147","wikidata":"https://www.wikidata.org/wiki/Q16029538","display_name":"Non-contact atomic force microscopy","level":4,"score":0.5524581074714661},{"id":"https://openalex.org/C100082104","wikidata":"https://www.wikidata.org/wiki/Q183759","display_name":"Piezoelectricity","level":2,"score":0.5169022083282471},{"id":"https://openalex.org/C36628996","wikidata":"https://www.wikidata.org/wiki/Q907287","display_name":"Scanning probe microscopy","level":2,"score":0.5148760080337524},{"id":"https://openalex.org/C102951782","wikidata":"https://www.wikidata.org/wiki/Q49295","display_name":"Atomic force microscopy","level":2,"score":0.4921371340751648},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.47906336188316345},{"id":"https://openalex.org/C141354745","wikidata":"https://www.wikidata.org/wiki/Q17227","display_name":"Cantilever","level":2,"score":0.4744219183921814},{"id":"https://openalex.org/C142089489","wikidata":"https://www.wikidata.org/wiki/Q1053976","display_name":"Antiparallel (mathematics)","level":3,"score":0.4493197202682495},{"id":"https://openalex.org/C83898325","wikidata":"https://www.wikidata.org/wiki/Q1324110","display_name":"Kelvin probe force microscope","level":3,"score":0.44516345858573914},{"id":"https://openalex.org/C206008964","wikidata":"https://www.wikidata.org/wiki/Q5159384","display_name":"Conductive atomic force microscopy","level":3,"score":0.44163021445274353},{"id":"https://openalex.org/C43826995","wikidata":"https://www.wikidata.org/wiki/Q17014103","display_name":"Atomic force acoustic microscopy","level":5,"score":0.4191862940788269},{"id":"https://openalex.org/C147230242","wikidata":"https://www.wikidata.org/wiki/Q5358564","display_name":"Electrostatic force microscope","level":3,"score":0.41738325357437134},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.3766923248767853},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3669625520706177},{"id":"https://openalex.org/C181635281","wikidata":"https://www.wikidata.org/wiki/Q2799395","display_name":"Magnetic force microscope","level":4,"score":0.35604599118232727},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3323294520378113},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2924172878265381},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.21031010150909424},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.16858887672424316},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.14019787311553955},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06564798951148987},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.0},{"id":"https://openalex.org/C32546565","wikidata":"https://www.wikidata.org/wiki/Q856711","display_name":"Magnetization","level":3,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.1843288","doi":"https://doi.org/10.1063/1.1843288","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.1843288","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1526053027","https://openalex.org/W1553650702","https://openalex.org/W1575089198","https://openalex.org/W1964216837","https://openalex.org/W2001761237","https://openalex.org/W2005470678","https://openalex.org/W2008016530","https://openalex.org/W2018211315","https://openalex.org/W2031453383","https://openalex.org/W2035154896","https://openalex.org/W2051774517","https://openalex.org/W2054636656","https://openalex.org/W2057408287","https://openalex.org/W2064193542","https://openalex.org/W2070762222","https://openalex.org/W2171752110"],"related_works":["https://openalex.org/W2209317586","https://openalex.org/W75295775","https://openalex.org/W1591090129","https://openalex.org/W2030876870","https://openalex.org/W2064193542","https://openalex.org/W2167647694","https://openalex.org/W7066163220","https://openalex.org/W4211246987","https://openalex.org/W1998283860","https://openalex.org/W122632233"],"abstract_inverted_index":{"Ferroelectricity":[0],"and":[1,6,23,89,95,105],"local":[2,34],"currents":[3,35],"in":[4,64],"5-":[5,104],"9-nm-thick":[7],"Pb(Zr,Ti)O3":[8],"ultrathin":[9],"films":[10,108],"epitaxially":[11],"grown":[12],"on":[13,99],"SrRuO3\u2215SrTiO3(100)":[14],"are":[15,109],"investigated":[16],"by":[17,58,80],"current-sensitive":[18],"atomic":[19],"force":[20,26],"microscopy":[21,27],"(CS-AFM)":[22],"contact-resonance":[24],"piezoresponse":[25],"(CR-PFM).":[28],"CS-AFM":[29],"observations":[30],"reveal":[31],"that":[32],"large":[33],"flowed":[36],"at":[37],"the":[38,65,72,87,93,103],"step":[39],"edge":[40],"of":[41,68,71,86],"SrRuO3":[42],"bottom":[43,96],"electrodes.":[44,97],"Using":[45],"CR-PFM,":[46],"clear":[47],"contrasts":[48],"were":[49,55],"observed":[50,62],"for":[51],"antiparallel":[52,75],"domains,":[53],"which":[54],"not":[56],"observable":[57],"conventional":[59],"PFM.":[60],"The":[61],"difference":[63],"deflection":[66],"signals":[67],"flexural":[69],"vibrations":[70,85],"cantilever":[73,94],"between":[74,92],"domains":[76],"is":[77],"qualitatively":[78],"explained":[79],"coupled":[81],"contributions":[82],"from":[83],"piezoelectric":[84],"PZT":[88,107],"electrostatic":[90],"interaction":[91],"Based":[98],"this":[100],"interpretation,":[101],"both":[102],"9-nm-ultrathin":[106],"concluded":[110],"to":[111],"exhibit":[112],"a":[113],"stable":[114],"ferroelectric":[115],"state.":[116]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-08-18T07:49:30.821534","created_date":"2016-06-24T00:00:00"}