{"id":"https://openalex.org/W1981069381","doi":"https://doi.org/10.1016/0026-2714(83)90513-9","title":"Reliability system with two types of repair facilities","display_name":"Reliability system with two types of repair facilities","publication_year":1983,"publication_date":"1983-01-01","ids":{"openalex":"https://openalex.org/W1981069381","doi":"https://doi.org/10.1016/0026-2714(83)90513-9","mag":"1981069381"},"language":"en","primary_location":{"id":"doi:10.1016/0026-2714(83)90513-9","doi":"https://doi.org/10.1016/0026-2714(83)90513-9","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0026-2714(83)90513-9","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046323395","display_name":"Krishna Murari","orcid":"https://orcid.org/0000-0003-4535-7153","observed_orcids":["https://orcid.org/0000-0003-4535-7153"]},"institutions":[{"id":"https://openalex.org/I154851008","display_name":"Indian Institute of Technology Roorkee","ror":"https://ror.org/00582g326","country_code":"IN","type":"education","lineage":["https://openalex.org/I154851008"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"K. Murari","raw_affiliation_strings":["Department of Mathematics, University of Roorkee, Roorkee-247667, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mathematics, University of Roorkee, Roorkee-247667, India","institution_ids":["https://openalex.org/I154851008"]}]},{"author_position":"last","author":{"id":null,"display_name":"Vibha Goyal","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I154851008","display_name":"Indian Institute of Technology Roorkee","ror":"https://ror.org/00582g326","country_code":"IN","type":"education","lineage":["https://openalex.org/I154851008"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Vibha Goyal","raw_affiliation_strings":["Department of Mathematics, University of Roorkee, Roorkee-247667, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mathematics, University of Roorkee, Roorkee-247667, India","institution_ids":["https://openalex.org/I154851008"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I154851008"],"apc_list":{"value":2280,"currency":"USD","value_usd":2280},"apc_paid":null,"fwci":13.5442,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.98373676,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":96},"biblio":{"volume":"23","issue":"6","first_page":"1015","last_page":"1025"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.0007999999797903001,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cold-standby-systems","display_name":"cold standby systems","score":0.7900000214576721},{"id":"https://openalex.org/keywords/repair-facility","display_name":"repair facility","score":0.6570000052452087},{"id":"https://openalex.org/keywords/repair-priority","display_name":"repair priority","score":0.5709999799728394},{"id":"https://openalex.org/keywords/waiting-time","display_name":"waiting time","score":0.5139999985694885},{"id":"https://openalex.org/keywords/mean-time-to-failure","display_name":"mean time to failure","score":0.7900000214576721},{"id":"https://openalex.org/keywords/steady-state-availability","display_name":"steady-state availability","score":0.8790000081062317},{"id":"https://openalex.org/keywords/semi-markov-processes","display_name":"semi-Markov processes","score":0.9010000228881836},{"id":"https://openalex.org/keywords/regeneration","display_name":"regeneration","score":0.9890000224113464},{"id":"https://openalex.org/keywords/laplace-transform","display_name":"Laplace transform","score":0.7250000238418579},{"id":"https://openalex.org/keywords/repair-costs","display_name":"repair costs","score":0.4830000102519989},{"id":"https://openalex.org/keywords/profit-maximization","display_name":"profit maximization","score":0.8169999718666077}],"concepts":[{"id":"https://openalex.org/C97937538","wikidata":"https://www.wikidata.org/wiki/Q199691","display_name":"Laplace transform","level":2,"score":0.7100164294242859},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6414471864700317},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5762108564376831},{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.5195325016975403},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.4375843405723572},{"id":"https://openalex.org/C159886148","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov process","level":2,"score":0.4320252537727356},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.4114637076854706},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.411052942276001},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2641781270503998},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.17755624651908875},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0790024995803833},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0026-2714(83)90513-9","doi":"https://doi.org/10.1016/0026-2714(83)90513-9","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0026-2714(83)90513-9","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.5378999710083008,"id":"https://metadata.un.org/sdg/9"}],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1981868680","https://openalex.org/W1984452694","https://openalex.org/W2057472623","https://openalex.org/W2078197079","https://openalex.org/W2331898814","https://openalex.org/W4301808727","https://openalex.org/W6664881617"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":null,"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}