{"id":"https://openalex.org/W1980603333","doi":"https://doi.org/10.1063/1.3073741","title":"Electronic properties of dislocations in GaN investigated by scanning tunneling microscopy","display_name":"Electronic properties of dislocations in GaN investigated by scanning tunneling microscopy","publication_year":2009,"publication_date":"2009-02-09","ids":{"openalex":"https://openalex.org/W1980603333","doi":"https://doi.org/10.1063/1.3073741","mag":"1980603333"},"language":"en","primary_location":{"id":"doi:10.1063/1.3073741","doi":"https://doi.org/10.1063/1.3073741","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.3073741","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://juser.fz-juelich.de/search?p=id:%22PreJuSER-3849%22","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066479895","display_name":"Ph. Ebert","orcid":"https://orcid.org/0000-0002-2022-2378","observed_orcids":["https://orcid.org/0000-0002-2022-2378"]},"institutions":[{"id":"https://openalex.org/I171892758","display_name":"Forschungszentrum J\u00fclich","ror":"https://ror.org/02nv7yv05","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1305996414","https://openalex.org/I171892758"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Ph. Ebert","raw_affiliation_strings":["Institut f\u00fcr Festk\u00f6rperforschung, Forschungszentrum J\u00fclich GmbH, 52425 J\u00fclich, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Festk\u00f6rperforschung, Forschungszentrum J\u00fclich GmbH, 52425 J\u00fclich, Germany","institution_ids":["https://openalex.org/I171892758"]}]},{"author_position":"middle","author":{"id":null,"display_name":"L. Ivanova","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4577782","display_name":"Technische Universit\u00e4t Berlin","ror":"https://ror.org/03v4gjf40","country_code":"DE","type":"education","lineage":["https://openalex.org/I4577782"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"L. Ivanova","raw_affiliation_strings":["Institut f\u00fcr Festk\u00f6rperphysik, Technische Universit\u00e4t Berlin, Hardenbergstr. 36, 10623 Berlin, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Festk\u00f6rperphysik, Technische Universit\u00e4t Berlin, Hardenbergstr. 36, 10623 Berlin, Germany","institution_ids":["https://openalex.org/I4577782"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110345460","display_name":"Svetlana Borisova","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I171892758","display_name":"Forschungszentrum J\u00fclich","ror":"https://ror.org/02nv7yv05","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1305996414","https://openalex.org/I171892758"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"S. Borisova","raw_affiliation_strings":["Institut f\u00fcr Festk\u00f6rperforschung, Forschungszentrum J\u00fclich GmbH, 52425 J\u00fclich, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Festk\u00f6rperforschung, Forschungszentrum J\u00fclich GmbH, 52425 J\u00fclich, Germany","institution_ids":["https://openalex.org/I171892758"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020201334","display_name":"Holger Eisele","orcid":"https://orcid.org/0000-0001-6603-0008","observed_orcids":["https://orcid.org/0000-0001-6603-0008"]},"institutions":[{"id":"https://openalex.org/I4577782","display_name":"Technische Universit\u00e4t Berlin","ror":"https://ror.org/03v4gjf40","country_code":"DE","type":"education","lineage":["https://openalex.org/I4577782"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"H. Eisele","raw_affiliation_strings":["Institut f\u00fcr Festk\u00f6rperphysik, Technische Universit\u00e4t Berlin, Hardenbergstr. 36, 10623 Berlin, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Festk\u00f6rperphysik, Technische Universit\u00e4t Berlin, Hardenbergstr. 36, 10623 Berlin, Germany","institution_ids":["https://openalex.org/I4577782"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024315403","display_name":"Ansgar Laubsch","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4387154934","display_name":"Osram Opto Semiconductors","ror":"https://ror.org/05v6nhz77","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210103613","https://openalex.org/I4387154934"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"A. Laubsch","raw_affiliation_strings":["OSRAM Opto-Semiconductors GmbH, Leibnizstrasse 4, 93055 Regensburg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"OSRAM Opto-Semiconductors GmbH, Leibnizstrasse 4, 93055 Regensburg, Germany","institution_ids":["https://openalex.org/I4387154934"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037472518","display_name":"Mario D\u00e4hne","orcid":"https://orcid.org/0000-0001-6364-8953","observed_orcids":["https://orcid.org/0000-0001-6364-8953"]},"institutions":[{"id":"https://openalex.org/I4577782","display_name":"Technische Universit\u00e4t Berlin","ror":"https://ror.org/03v4gjf40","country_code":"DE","type":"education","lineage":["https://openalex.org/I4577782"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"M. D\u00e4hne","raw_affiliation_strings":["Institut f\u00fcr Festk\u00f6rperphysik, Technische Universit\u00e4t Berlin, Hardenbergstr. 36, 10623 Berlin, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Festk\u00f6rperphysik, Technische Universit\u00e4t Berlin, Hardenbergstr. 36, 10623 Berlin, Germany","institution_ids":["https://openalex.org/I4577782"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.8711,"has_fulltext":false,"cited_by_count":33,"citation_normalized_percentile":{"value":0.90952059,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":87,"max":97},"biblio":{"volume":"94","issue":"6","first_page":"062104","last_page":"062104"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dislocations","display_name":"dislocations","score":0.8980000019073486},{"id":"https://openalex.org/keywords/gan","display_name":"GaN","score":0.8450000286102295},{"id":"https://openalex.org/keywords/shockley-partial-dislocations","display_name":"Shockley partial dislocations","score":0.8500000238418579},{"id":"https://openalex.org/keywords/stacking-faults","display_name":"stacking faults","score":0.7289999723434448},{"id":"https://openalex.org/keywords/burgers-vector","display_name":"Burgers vector","score":0.7210000157356262},{"id":"https://openalex.org/keywords/dislocation-charge","display_name":"dislocation charge","score":0.7279999852180481},{"id":"https://openalex.org/keywords/dislocation-core-structure","display_name":"dislocation core structure","score":0.8339999914169312},{"id":"https://openalex.org/keywords/charge-transfer","display_name":"charge transfer","score":0.621999979019165},{"id":"https://openalex.org/keywords/n-gan","display_name":"n-type GaN","score":0.7210000157356262},{"id":"https://openalex.org/keywords/line-defects","display_name":"line defects","score":0.375}],"concepts":[{"id":"https://openalex.org/C2778447006","wikidata":"https://www.wikidata.org/wiki/Q1156474","display_name":"Icon","level":2,"score":0.948378324508667},{"id":"https://openalex.org/C2778805511","wikidata":"https://www.wikidata.org/wiki/Q1713","display_name":"Citation","level":2,"score":0.6541647911071777},{"id":"https://openalex.org/C2780154274","wikidata":"https://www.wikidata.org/wiki/Q7126717","display_name":"Download","level":2,"score":0.5780676603317261},{"id":"https://openalex.org/C6518042","wikidata":"https://www.wikidata.org/wiki/Q175646","display_name":"Scanning tunneling microscope","level":2,"score":0.5567083954811096},{"id":"https://openalex.org/C23123220","wikidata":"https://www.wikidata.org/wiki/Q816826","display_name":"Information retrieval","level":1,"score":0.4924872815608978},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4562772810459137},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.3734760880470276},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2834727168083191},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.22234907746315002},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1063/1.3073741","doi":"https://doi.org/10.1063/1.3073741","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.3073741","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"},{"id":"pmh:oai:juser.fz-juelich.de:3849","doi":null,"is_oa":true,"landing_page_url":"http://juser.fz-juelich.de/search?p=id:%22PreJuSER-3849%22","pdf_url":null,"source":{"id":"https://openalex.org/S4306401090","display_name":"JuSER (Forschungszentrum J\u00fclich)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I171892758","host_organization_name":"Forschungszentrum J\u00fclich","host_organization_lineage":["https://openalex.org/I171892758"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Applied physics letters 94, 062104 (2009). doi:10.1063/1.3073741","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:juser.fz-juelich.de:3849","doi":null,"is_oa":true,"landing_page_url":"http://juser.fz-juelich.de/search?p=id:%22PreJuSER-3849%22","pdf_url":null,"source":{"id":"https://openalex.org/S4306401090","display_name":"JuSER (Forschungszentrum J\u00fclich)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I171892758","host_organization_name":"Forschungszentrum J\u00fclich","host_organization_lineage":["https://openalex.org/I171892758"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Applied physics letters 94, 062104 (2009). doi:10.1063/1.3073741","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W407669220","https://openalex.org/W1970775286","https://openalex.org/W1977526929","https://openalex.org/W1991988352","https://openalex.org/W2007025492","https://openalex.org/W2010752531","https://openalex.org/W2020579855","https://openalex.org/W2023537533","https://openalex.org/W2026179820","https://openalex.org/W2026520373","https://openalex.org/W2030197921","https://openalex.org/W2043843758","https://openalex.org/W2046015996","https://openalex.org/W2047919429","https://openalex.org/W2058490426","https://openalex.org/W2059037715","https://openalex.org/W2060675130","https://openalex.org/W2061530209","https://openalex.org/W2067160992","https://openalex.org/W2068527242","https://openalex.org/W2074796258","https://openalex.org/W2075821144","https://openalex.org/W2079368588","https://openalex.org/W2084602713","https://openalex.org/W2104798740","https://openalex.org/W3021921835"],"related_works":["https://openalex.org/W2060675130","https://openalex.org/W1978558434","https://openalex.org/W2059789699","https://openalex.org/W2058573167","https://openalex.org/W2169593299","https://openalex.org/W1988458320","https://openalex.org/W7160428724","https://openalex.org/W2064750342","https://openalex.org/W2076710897","https://openalex.org/W1656616687"],"abstract_inverted_index":{"We":[0,20],"investigated":[1],"the":[2,57],"type,":[3],"spatial":[4],"distribution,":[5],"line":[6],"direction,":[7],"and":[8,29],"electronic":[9],"properties":[10],"of":[11],"dislocations":[12,24,34],"in":[13],"n-type":[14],"GaN":[15],"by":[16,40],"scanning":[17],"tunneling":[18],"microscopy.":[19],"found":[21],"uncharged":[22],"perfect":[23],"with":[25,35,56],"a/3{1120}":[26],"Burgers":[27,37],"vectors":[28,38],"negatively":[30,42],"charged":[31,43],"Shockley":[32],"partial":[33],"a/3{1100}":[36],"interconnected":[39],"a":[41],"stacking":[44],"fault.":[45],"The":[46],"charges":[47],"are":[48],"traced":[49],"to":[50],"different":[51],"charge":[52],"transfer":[53],"levels":[54],"associated":[55],"particular":[58],"core":[59],"structure.":[60]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":1}],"updated_date":"2026-10-01T08:54:57.152042","created_date":"2016-06-24T00:00:00"}