{"id":"https://openalex.org/W1978721083","doi":"https://doi.org/10.1109/ats.2011.44","title":"On Replacing an RF Test with an Alternative Measurement: Theory and a Case Study","display_name":"On Replacing an RF Test with an Alternative Measurement: Theory and a Case Study","publication_year":2011,"publication_date":"2011-11-01","ids":{"openalex":"https://openalex.org/W1978721083","doi":"https://doi.org/10.1109/ats.2011.44","mag":"1978721083"},"language":"en","primary_location":{"id":"doi:10.1109/ats.2011.44","doi":"https://doi.org/10.1109/ats.2011.44","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats.2011.44","pdf_url":null,"source":{"id":"https://openalex.org/S4210236090","display_name":"Proceedings - Asian Test Symposium/Proceedings","issn_l":"1081-7735","issn":["1081-7735","2377-5386"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 Asian Test Symposium","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048785491","display_name":"Alexios D. Spyronasios","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I177483745","display_name":"Universit\u00e9 Joseph Fourier","ror":"https://ror.org/02aj0kh94","country_code":"FR","type":"education","lineage":["https://openalex.org/I177483745","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I21370196","display_name":"Aristotle University of Thessaloniki","ror":"https://ror.org/02j61yw88","country_code":"GR","type":"education","lineage":["https://openalex.org/I21370196"]},{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006"]}],"countries":["FR","GR"],"is_corresponding":false,"raw_author_name":"Alexios Spyronasios","raw_affiliation_strings":["Department of Electrical and Computer Eng, Aristotle University of Thessaloniki, Thessaloniki, Greece","TIMA Laboratory, CNRS-Grenoble INP, UJF, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Eng, Aristotle University of Thessaloniki, Thessaloniki, Greece","institution_ids":["https://openalex.org/I21370196"]},{"raw_affiliation_string":"TIMA Laboratory, CNRS-Grenoble INP, UJF, Grenoble, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I177483745","https://openalex.org/I4210087012"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113840589","display_name":"Louay Abdallah","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I177483745","display_name":"Universit\u00e9 Joseph Fourier","ror":"https://ror.org/02aj0kh94","country_code":"FR","type":"education","lineage":["https://openalex.org/I177483745","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Louay Abdallah","raw_affiliation_strings":["TIMA Laboratory, CNRS-Grenoble INP, UJF, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TIMA Laboratory, CNRS-Grenoble INP, UJF, Grenoble, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I177483745","https://openalex.org/I4210087012"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091734149","display_name":"Haralampos\u2010G. Stratigopoulos","orcid":"https://orcid.org/0000-0002-9943-5607","observed_orcids":["https://orcid.org/0000-0002-9943-5607"]},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I177483745","display_name":"Universit\u00e9 Joseph Fourier","ror":"https://ror.org/02aj0kh94","country_code":"FR","type":"education","lineage":["https://openalex.org/I177483745","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Haralampos-G. Stratigopoulos","raw_affiliation_strings":["TIMA Laboratory, CNRS-Grenoble INP, UJF, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TIMA Laboratory, CNRS-Grenoble INP, UJF, Grenoble, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I177483745","https://openalex.org/I4210087012"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061963866","display_name":"Salvador Mir","orcid":"https://orcid.org/0000-0001-9911-8946","observed_orcids":["https://orcid.org/0000-0001-9911-8946"]},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I177483745","display_name":"Universit\u00e9 Joseph Fourier","ror":"https://ror.org/02aj0kh94","country_code":"FR","type":"education","lineage":["https://openalex.org/I177483745","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Salvador Mir","raw_affiliation_strings":["TIMA Laboratory, CNRS-Grenoble INP, UJF, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TIMA Laboratory, CNRS-Grenoble INP, UJF, Grenoble, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I177483745","https://openalex.org/I4210087012"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1863,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.34585117,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"365","last_page":"370"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.0010000000474974513,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test-escapes","display_name":"test escapes","score":0.7440000176429749},{"id":"https://openalex.org/keywords/yield-loss","display_name":"yield loss","score":0.9869999885559082},{"id":"https://openalex.org/keywords/low-noise-amplifier","display_name":"low noise amplifier","score":0.8510000109672546}],"concepts":[{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.6773687601089478},{"id":"https://openalex.org/C153180980","wikidata":"https://www.wikidata.org/wiki/Q19776675","display_name":"Commit","level":2,"score":0.6303518414497375},{"id":"https://openalex.org/C74143277","wikidata":"https://www.wikidata.org/wiki/Q7705812","display_name":"Test theory","level":3,"score":0.6000901460647583},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.5521718263626099},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.546592116355896},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5245009660720825},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5150887370109558},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.44606533646583557},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.4379441738128662},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.41126903891563416},{"id":"https://openalex.org/C65155139","wikidata":"https://www.wikidata.org/wiki/Q5380912","display_name":"Envelope (radar)","level":3,"score":0.41027188301086426},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3763173222541809},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3415108919143677},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.276516318321228},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.23371371626853943},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.22912847995758057},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2053634226322174},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1652044951915741},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0},{"id":"https://openalex.org/C171606756","wikidata":"https://www.wikidata.org/wiki/Q506132","display_name":"Psychometrics","level":2,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/ats.2011.44","doi":"https://doi.org/10.1109/ats.2011.44","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats.2011.44","pdf_url":null,"source":{"id":"https://openalex.org/S4210236090","display_name":"Proceedings - Asian Test Symposium/Proceedings","issn_l":"1081-7735","issn":["1081-7735","2377-5386"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 Asian Test Symposium","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-00672554v1","doi":null,"is_oa":false,"landing_page_url":"https://hal.science/hal-00672554","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252976","host_organization_name":"Centre pour la Communication Scientifique Directe","host_organization_lineage":["https://openalex.org/I4405252976"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Asian Test Symposium (ATS'11), Nov 2011, New Delhi, India. pp.365-370, ⟨10.1109/ATS.2011.44⟩","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1495124085","https://openalex.org/W1500657154","https://openalex.org/W2053829770","https://openalex.org/W2098936390","https://openalex.org/W2108939487","https://openalex.org/W2109824007","https://openalex.org/W2110179049","https://openalex.org/W2114265927","https://openalex.org/W2114482684","https://openalex.org/W2130282462","https://openalex.org/W2141118186","https://openalex.org/W3146889211"],"related_works":["https://openalex.org/W3146889211","https://openalex.org/W2003117802","https://openalex.org/W2109824007","https://openalex.org/W2610780652","https://openalex.org/W1513738535","https://openalex.org/W2051357347","https://openalex.org/W2136081346","https://openalex.org/W2131594217","https://openalex.org/W1986602429","https://openalex.org/W2054559231"],"abstract_inverted_index":{"In":[0,74],"this":[1],"paper":[2],"we":[3,13,16,76],"present":[4],"the":[5,9,32,89],"theory":[6,68],"for":[7,92],"evaluating":[8],"test":[10,21,35,47,54,91],"error":[11,48],"that":[12],"commit":[14],"when":[15],"replace":[17],"a":[18,23,41,79],"standard":[19],"analog":[20],"by":[22],"lower-cost":[24],"alternative":[25],"measurement.":[26],"The":[27,46,67],"evaluation":[28],"takes":[29],"place":[30],"during":[31],"design":[33],"and":[34,38,56],"development":[36],"phases":[37],"relies":[39],"on":[40],"tractable":[42],"number":[43],"of":[44,53],"simulations.":[45],"is":[49,69],"expressed":[50],"in":[51,62],"terms":[52],"escape":[55],"yield":[57],"loss":[58],"which":[59],"are":[60],"estimated":[61],"parts":[63],"per":[64],"million":[65],"accuracy.":[66],"demonstrated":[70],"with":[71],"an":[72,93],"example.":[73],"particular,":[75],"evaluate":[77],"whether":[78],"dedicated":[80],"on-chip":[81],"envelope":[82],"detector":[83],"can":[84],"be":[85],"used":[86],"to":[87],"eliminate":[88],"NF":[90],"LNA.":[94]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}