{"id":"https://openalex.org/W1978533480","doi":"https://doi.org/10.1117/12.869647","title":"3000 pixel linear InGaAs sensor for the Proba-V satellite","display_name":"3000 pixel linear InGaAs sensor for the Proba-V satellite","publication_year":2010,"publication_date":"2010-10-28","ids":{"openalex":"https://openalex.org/W1978533480","doi":"https://doi.org/10.1117/12.869647","mag":"1978533480"},"language":"it","primary_location":{"id":"doi:10.1117/12.869647","doi":"https://doi.org/10.1117/12.869647","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.869647","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016107395","display_name":"Jonas L. Bentell","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210118111","display_name":"Xenics (Belgium)","ror":"https://ror.org/02nj1s179","country_code":"BE","type":"company","lineage":["https://openalex.org/I4210118111"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Jonas Bentell","raw_affiliation_strings":["Xenics NV (Belgium)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xenics NV (Belgium)","institution_ids":["https://openalex.org/I4210118111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051290752","display_name":"Jan P. Vermeiren","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210118111","display_name":"Xenics (Belgium)","ror":"https://ror.org/02nj1s179","country_code":"BE","type":"company","lineage":["https://openalex.org/I4210118111"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Jan Vermeiren","raw_affiliation_strings":["Xenics NV (Belgium)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xenics NV (Belgium)","institution_ids":["https://openalex.org/I4210118111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086983273","display_name":"Peet Verbeke","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210118111","display_name":"Xenics (Belgium)","ror":"https://ror.org/02nj1s179","country_code":"BE","type":"company","lineage":["https://openalex.org/I4210118111"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Peet Verbeke","raw_affiliation_strings":["Xenics NV (Belgium)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xenics NV (Belgium)","institution_ids":["https://openalex.org/I4210118111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006565443","display_name":"Alexandre de Kerckhove","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210118111","display_name":"Xenics (Belgium)","ror":"https://ror.org/02nj1s179","country_code":"BE","type":"company","lineage":["https://openalex.org/I4210118111"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Alexandre de Kerckhove","raw_affiliation_strings":["Xenics NV (Belgium)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xenics NV (Belgium)","institution_ids":["https://openalex.org/I4210118111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102012973","display_name":"Luis Rodriguez","orcid":"https://orcid.org/0000-0003-4679-2739","observed_orcids":["https://orcid.org/0000-0003-4679-2739","https://orcid.org/0000-0003-3667-1167"]},"institutions":[{"id":"https://openalex.org/I4210118111","display_name":"Xenics (Belgium)","ror":"https://ror.org/02nj1s179","country_code":"BE","type":"company","lineage":["https://openalex.org/I4210118111"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Luis Rodriguez","raw_affiliation_strings":["Xenics NV (Belgium)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xenics NV (Belgium)","institution_ids":["https://openalex.org/I4210118111"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Thierry Colin","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210118111","display_name":"Xenics (Belgium)","ror":"https://ror.org/02nj1s179","country_code":"BE","type":"company","lineage":["https://openalex.org/I4210118111"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Thierry Colin","raw_affiliation_strings":["Xenics NV (Belgium)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xenics NV (Belgium)","institution_ids":["https://openalex.org/I4210118111"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023453035","display_name":"B. Grietens","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210118111","display_name":"Xenics (Belgium)","ror":"https://ror.org/02nj1s179","country_code":"BE","type":"company","lineage":["https://openalex.org/I4210118111"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Bob Grietens","raw_affiliation_strings":["Xenics NV (Belgium)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xenics NV (Belgium)","institution_ids":["https://openalex.org/I4210118111"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210118111"],"apc_list":null,"apc_paid":null,"fwci":0.4278,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.49169565,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":97},"biblio":{"volume":"7862","issue":null,"first_page":"786206","last_page":"786206"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.5166000127792358,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.5166000127792358,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.47780001163482666,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14163","display_name":"Astronomical Observations and Instrumentation","score":0.0005000000237487257,"subfield":{"id":"https://openalex.org/subfields/3103","display_name":"Astronomy and Astrophysics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/readout-integrated-circuit","display_name":"readout integrated circuit","score":0.8450000286102295},{"id":"https://openalex.org/keywords/correlated-double-sampling","display_name":"correlated double sampling","score":0.8970000147819519},{"id":"https://openalex.org/keywords/signal-multiplexing","display_name":"signal multiplexing","score":0.7670000195503235},{"id":"https://openalex.org/keywords/stitching","display_name":"stitching","score":0.3580000102519989}],"concepts":[{"id":"https://openalex.org/C19269812","wikidata":"https://www.wikidata.org/wiki/Q26540","display_name":"Satellite","level":2,"score":0.6427798271179199},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.5094068646430969},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4340009093284607},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.39394479990005493},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3674779534339905},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.25534453988075256},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.21600475907325745},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.14176908135414124},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.09932088851928711},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.06650248169898987}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.869647","doi":"https://doi.org/10.1117/12.869647","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.869647","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2064037618","https://openalex.org/W2111364328","https://openalex.org/W2112952447","https://openalex.org/W1970450656","https://openalex.org/W2047290185","https://openalex.org/W2069183555","https://openalex.org/W2584849247","https://openalex.org/W1983627835","https://openalex.org/W4410848058","https://openalex.org/W1970140980"],"abstract_inverted_index":{"We":[0],"report":[1],"on":[2,30,41],"the":[3,8,19,23,76,79,110],"design":[4],"and":[5,62,70,90,102],"development":[6],"of":[7,22,33,50,78,109],"large":[9],"linear":[10],"SWIR":[11],"focal":[12],"plane":[13],"arrays":[14,37],"to":[15,75],"be":[16],"deployed":[17],"in":[18],"multispectral":[20],"instrument":[21],"Proba-V":[24],"satellite.":[25],"These":[26],"sensors":[27],"are":[28],"based":[29],"mechanical":[31],"butting":[32],"three":[34],"InGaAs":[35],"photodiode":[36],"with":[38,65],"1024":[39,66],"pixels":[40],"25":[42],"\u03bcm":[43],"pitch,":[44],"forming":[45],"a":[46,94],"nearly":[47],"continuous":[48],"line":[49],"3072":[51],"pixels.":[52],"A":[53],"new":[54],"read-out":[55],"integrated":[56],"circuit":[57],"(ROIC)":[58],"for":[59],"photocurrent":[60],"integration":[61],"signal":[63,112],"multiplexing":[64],"inputs":[67],"was":[68],"designed":[69],"manufactured":[71],"by":[72],"stitching":[73],"due":[74],"length":[77],"chip.":[80],"The":[81],"ROIC":[82],"(XRO3508)":[83],"includes":[84],"both":[85],"correlated":[86],"double":[87],"sampling":[88],"(CDS)":[89],"autozero":[91],"features,":[92],"enabling":[93],"very":[95],"low":[96],"Dark":[97],"Signal":[98],"Non":[99],"Uniformity":[100],"(DSNU)":[101],"Photoresponse":[103],"Non-Uniformity":[104],"(PRNU)":[105],"less":[106],"than":[107],"0.5%":[108],"available":[111],"range.":[113]},"counts_by_year":[{"year":2018,"cited_by_count":2},{"year":2015,"cited_by_count":3}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2016-06-24T00:00:00"}