{"id":"https://openalex.org/W1978530246","doi":"https://doi.org/10.1117/12.166151","title":"Development of high-temperature superconducting 100-ns delay line","display_name":"Development of high-temperature superconducting 100-ns delay line","publication_year":1994,"publication_date":"1994-01-04","ids":{"openalex":"https://openalex.org/W1978530246","doi":"https://doi.org/10.1117/12.166151","mag":"1978530246"},"language":"en","primary_location":{"id":"doi:10.1117/12.166151","doi":"https://doi.org/10.1117/12.166151","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.166151","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054278491","display_name":"N.O. Fenzi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210091503","display_name":"Superconductor Technologies (United States)","ror":"https://ror.org/00msez306","country_code":"US","type":"company","lineage":["https://openalex.org/I4210091503"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Neal Fenzi","raw_affiliation_strings":["Superconductor Technologies Inc. (United States)","Superconductor Technologies Inc. (USA)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Superconductor Technologies Inc. (United States)","institution_ids":["https://openalex.org/I4210091503"]},{"raw_affiliation_string":"Superconductor Technologies Inc. (USA)","institution_ids":["https://openalex.org/I4210091503"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077169777","display_name":"D.L. Aidnik","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210091503","display_name":"Superconductor Technologies (United States)","ror":"https://ror.org/00msez306","country_code":"US","type":"company","lineage":["https://openalex.org/I4210091503"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David Aidnik","raw_affiliation_strings":["Superconductor Technologies Inc. (United States)","Superconductor Technologies Inc. (USA)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Superconductor Technologies Inc. (United States)","institution_ids":["https://openalex.org/I4210091503"]},{"raw_affiliation_string":"Superconductor Technologies Inc. (USA)","institution_ids":["https://openalex.org/I4210091503"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078243266","display_name":"David Skoglund","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210091503","display_name":"Superconductor Technologies (United States)","ror":"https://ror.org/00msez306","country_code":"US","type":"company","lineage":["https://openalex.org/I4210091503"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David Skoglund","raw_affiliation_strings":["Superconductor Technologies Inc. (United States)","Superconductor Technologies Inc. (USA)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Superconductor Technologies Inc. (United States)","institution_ids":["https://openalex.org/I4210091503"]},{"raw_affiliation_string":"Superconductor Technologies Inc. (USA)","institution_ids":["https://openalex.org/I4210091503"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077976739","display_name":"Steve Rohlfing","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210091503","display_name":"Superconductor Technologies (United States)","ror":"https://ror.org/00msez306","country_code":"US","type":"company","lineage":["https://openalex.org/I4210091503"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Steve Rohlfing","raw_affiliation_strings":["Superconductor Technologies Inc. (United States)","Superconductor Technologies Inc. (USA)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Superconductor Technologies Inc. (United States)","institution_ids":["https://openalex.org/I4210091503"]},{"raw_affiliation_string":"Superconductor Technologies Inc. (USA)","institution_ids":["https://openalex.org/I4210091503"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210091503"],"apc_list":null,"apc_paid":null,"fwci":4.8251,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.93427178,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"2156","issue":null,"first_page":"143","last_page":"151"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11803","display_name":"Superconducting and THz Device Technology","score":0.7886000275611877,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11803","display_name":"Superconducting and THz Device Technology","score":0.7886000275611877,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.15690000355243683,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11808","display_name":"Superconducting Materials and Applications","score":0.006599999964237213,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/unit-cell-design","display_name":"unit cell design","score":0.8479999899864197},{"id":"https://openalex.org/keywords/cell-cell-coupling","display_name":"cell coupling","score":0.7990000247955322},{"id":"https://openalex.org/keywords/insertion-loss","display_name":"insertion loss","score":0.796999990940094},{"id":"https://openalex.org/keywords/phase-matching","display_name":"phase matching","score":0.8980000019073486},{"id":"https://openalex.org/keywords/2d-electromagnetic-simulation","display_name":"2D electromagnetic simulation","score":0.7149999737739563}],"concepts":[{"id":"https://openalex.org/C51141536","wikidata":"https://www.wikidata.org/wiki/Q838801","display_name":"Nanosecond","level":3,"score":0.8210563063621521},{"id":"https://openalex.org/C131584629","wikidata":"https://www.wikidata.org/wiki/Q4308705","display_name":"Coupling (piping)","level":2,"score":0.6357687711715698},{"id":"https://openalex.org/C123792056","wikidata":"https://www.wikidata.org/wiki/Q365988","display_name":"Group delay and phase delay","level":3,"score":0.5506835579872131},{"id":"https://openalex.org/C204223013","wikidata":"https://www.wikidata.org/wiki/Q133036","display_name":"Lithography","level":2,"score":0.5343196988105774},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.524451732635498},{"id":"https://openalex.org/C154020017","wikidata":"https://www.wikidata.org/wiki/Q520171","display_name":"Repeatability","level":2,"score":0.5204137563705444},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5170936584472656},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.5105918049812317},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.48258984088897705},{"id":"https://openalex.org/C3736036","wikidata":"https://www.wikidata.org/wiki/Q15525941","display_name":"Coplanar waveguide","level":3,"score":0.47093382477760315},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.42681989073753357},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3880397081375122},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.37545397877693176},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.326274573802948},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2819269895553589},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21031039953231812},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.15161025524139404},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.12180465459823608},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08538362383842468},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.166151","doi":"https://doi.org/10.1117/12.166151","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.166151","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2146066134","https://openalex.org/W2014284067","https://openalex.org/W1509856589","https://openalex.org/W153798661","https://openalex.org/W2115589050","https://openalex.org/W2001619347","https://openalex.org/W2112449684","https://openalex.org/W2535119949","https://openalex.org/W2026138790","https://openalex.org/W2092433436"],"abstract_inverted_index":{"Two":[0],"100":[1,30,168],"nanosecond":[2,31,169],"long":[3,32,170],"delay":[4,33,51,118,126],"lines":[5,52,127],"have":[6,15,155],"been":[7,16],"built.":[8],"Bandwidths":[9],"of":[10,21,99,106,144],"up":[11],"to":[12,64,154],"7":[13],"GHz":[14],"demonstrated,":[17],"with":[18],"insertion":[19],"losses":[20],"less":[22,40],"than":[23,41],"0.08":[24],"dB/nanosecond":[25],"at":[26],"6":[27],"GHz.":[28],"Each":[29],"line":[34,58],"is":[35,112,143,164],"contained":[36],"in":[37,147],"a":[38,54,61,76,113],"package":[39],"4":[42,45],"inches":[43,46],"by":[44,47],"0.5":[48],"inch.":[49],"The":[50],"use":[53],"meandered":[55],"coplanar":[56],"waveguide":[57],"built":[59],"on":[60,108,161],"simple,":[62],"easy":[63],"model":[65],"unit":[66,101],"cell.":[67],"Coupling":[68],"within":[69],"individual":[70],"cells":[71,107],"was":[72],"modeled":[73,83],"using":[74,84,132],"`Tranline,'":[75],"2D":[77],"EM":[78],"simulator.":[79],"Cell-to-cell":[80],"interactions":[81],"were":[82],"NODAL,":[85],"an":[86],"in-house":[87],"simulator":[88],"that":[89],"allows":[90],"for":[91],"coupling":[92,116],"between":[93,115,166],"non-adjacent":[94],"lines.":[95],"In":[96],"the":[97,100,104,109,156],"design":[98],"cell":[102],"and":[103,117,122,130],"layout":[105],"wafer,":[110],"there":[111],"tradeoff":[114],"density":[119],"affecting":[120],"size":[121],"performance.":[123],"Since":[124],"these":[125],"are":[128],"passive":[129],"patterned":[131],"photo-lithographic":[133],"techniques,":[134],"they":[135],"exhibit":[136],"good":[137],"unit-to-unit":[138],"phase":[139,162],"repeatability.":[140],"Phase":[141],"repeatability":[142],"particular":[145],"interest":[146],"applications":[148],"where":[149],"multiple":[150],"signal":[151],"paths":[152],"need":[153],"same":[157],"transfer":[158],"characteristics.":[159],"Data":[160],"matching":[163],"shown":[165],"two":[167],"assemblies.":[171]},"counts_by_year":[{"year":2022,"cited_by_count":1}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2016-06-24T00:00:00"}