{"id":"https://openalex.org/W1978484791","doi":"https://doi.org/10.1117/12.2068034","title":"Coupling effect of subsurface defect and coating layer on the laser induced damage threshold of dielectric coating","display_name":"Coupling effect of subsurface defect and coating layer on the laser induced damage threshold of dielectric coating","publication_year":2014,"publication_date":"2014-10-31","ids":{"openalex":"https://openalex.org/W1978484791","doi":"https://doi.org/10.1117/12.2068034","mag":"1978484791"},"language":"en","primary_location":{"id":"doi:10.1117/12.2068034","doi":"https://doi.org/10.1117/12.2068034","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2068034","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103120375","display_name":"Yingjie Chai","orcid":"https://orcid.org/0000-0002-9953-9860","observed_orcids":["https://orcid.org/0000-0002-9953-9860"]},"institutions":[{"id":"https://openalex.org/I4210135349","display_name":"Shanghai Institute of Optics and Fine Mechanics","ror":"https://ror.org/03g897070","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210135349"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yingjie Chai","raw_affiliation_strings":["Shanghai Institute of Optics and Fine Mechanics (China)","Univ. of Chinese Academy of Sciences (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Institute of Optics and Fine Mechanics (China)","institution_ids":["https://openalex.org/I4210135349"]},{"raw_affiliation_string":"Univ. of Chinese Academy of Sciences (China)","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112454154","display_name":"Meiping Zhu","orcid":"https://orcid.org/0000-0002-4899-1582","observed_orcids":["https://orcid.org/0000-0002-4899-1582"]},"institutions":[{"id":"https://openalex.org/I4210135349","display_name":"Shanghai Institute of Optics and Fine Mechanics","ror":"https://ror.org/03g897070","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210135349"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Meiping Zhu","raw_affiliation_strings":["Shanghai Institute of Optics and Fine Mechanics (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Institute of Optics and Fine Mechanics (China)","institution_ids":["https://openalex.org/I4210135349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101573848","display_name":"Kui Yi","orcid":"https://orcid.org/0000-0003-3585-1852","observed_orcids":["https://orcid.org/0000-0003-3585-1852"]},"institutions":[{"id":"https://openalex.org/I4210135349","display_name":"Shanghai Institute of Optics and Fine Mechanics","ror":"https://ror.org/03g897070","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210135349"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kui Yi","raw_affiliation_strings":["Shanghai Institute of Optics and Fine Mechanics (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Institute of Optics and Fine Mechanics (China)","institution_ids":["https://openalex.org/I4210135349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100335428","display_name":"Hongji Qi","orcid":"https://orcid.org/0000-0002-3666-4445","observed_orcids":["https://orcid.org/0000-0002-3666-4445"]},"institutions":[{"id":"https://openalex.org/I4210135349","display_name":"Shanghai Institute of Optics and Fine Mechanics","ror":"https://ror.org/03g897070","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210135349"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongji Qi","raw_affiliation_strings":["Shanghai Institute of Optics and Fine Mechanics (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Institute of Optics and Fine Mechanics (China)","institution_ids":["https://openalex.org/I4210135349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038220330","display_name":"Hu Wang","orcid":"https://orcid.org/0000-0002-4575-5699","observed_orcids":["https://orcid.org/0000-0002-4575-5699"]},"institutions":[{"id":"https://openalex.org/I4210135349","display_name":"Shanghai Institute of Optics and Fine Mechanics","ror":"https://ror.org/03g897070","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210135349"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hu Wang","raw_affiliation_strings":["Shanghai Institute of Optics and Fine Mechanics (China)","Univ. of Chinese Academy of Sciences (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Institute of Optics and Fine Mechanics (China)","institution_ids":["https://openalex.org/I4210135349"]},{"raw_affiliation_string":"Univ. of Chinese Academy of Sciences (China)","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100650657","display_name":"Wei Sun","orcid":"https://orcid.org/0000-0002-3524-4852","observed_orcids":["https://orcid.org/0000-0002-3524-4852"]},"institutions":[{"id":"https://openalex.org/I4210135349","display_name":"Shanghai Institute of Optics and Fine Mechanics","ror":"https://ror.org/03g897070","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210135349"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Sun","raw_affiliation_strings":["Shanghai Institute of Optics and Fine Mechanics (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Institute of Optics and Fine Mechanics (China)","institution_ids":["https://openalex.org/I4210135349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113935964","display_name":"Zhenkun Yu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210135349","display_name":"Shanghai Institute of Optics and Fine Mechanics","ror":"https://ror.org/03g897070","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210135349"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhenkun Yu","raw_affiliation_strings":["Shanghai Institute of Optics and Fine Mechanics (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Institute of Optics and Fine Mechanics (China)","institution_ids":["https://openalex.org/I4210135349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065938323","display_name":"Zhengyuan Bai","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210135349","display_name":"Shanghai Institute of Optics and Fine Mechanics","ror":"https://ror.org/03g897070","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210135349"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengyuan Bai","raw_affiliation_strings":["Shanghai Institute of Optics and Fine Mechanics (China)","Univ. of Chinese Academy of Sciences (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Institute of Optics and Fine Mechanics (China)","institution_ids":["https://openalex.org/I4210135349"]},{"raw_affiliation_string":"Univ. of Chinese Academy of Sciences (China)","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017012038","display_name":"Yuanan Zhao","orcid":"https://orcid.org/0000-0001-8243-7254","observed_orcids":["https://orcid.org/0000-0001-8243-7254"]},"institutions":[{"id":"https://openalex.org/I4210135349","display_name":"Shanghai Institute of Optics and Fine Mechanics","ror":"https://ror.org/03g897070","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210135349"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuanan Zhao","raw_affiliation_strings":["Shanghai Institute of Optics and Fine Mechanics (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Institute of Optics and Fine Mechanics (China)","institution_ids":["https://openalex.org/I4210135349"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100616734","display_name":"Jianda Shao","orcid":"https://orcid.org/0009-0001-2191-515X","observed_orcids":["https://orcid.org/0009-0001-2191-515X"]},"institutions":[{"id":"https://openalex.org/I4210135349","display_name":"Shanghai Institute of Optics and Fine Mechanics","ror":"https://ror.org/03g897070","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210135349"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianda Shao","raw_affiliation_strings":["Shanghai Institute of Optics and Fine Mechanics (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Institute of Optics and Fine Mechanics (China)","institution_ids":["https://openalex.org/I4210135349"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.7138,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.77290323,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"9237","issue":null,"first_page":"92370P","last_page":"92370P"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.9560999870300293,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.9560999870300293,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10732","display_name":"Laser Material Processing Techniques","score":0.03869999945163727,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.004100000020116568,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/laser-induced-damage-threshold","display_name":"laser-induced damage threshold","score":0.9660000205039978},{"id":"https://openalex.org/keywords/subsurface-defects","display_name":"subsurface defects","score":0.9079999923706055},{"id":"https://openalex.org/keywords/dielectric-coating","display_name":"dielectric coating","score":0.7200000286102295},{"id":"https://openalex.org/keywords/antireflection-coatings","display_name":"antireflection coatings","score":0.824999988079071},{"id":"https://openalex.org/keywords/electron-beam-evaporation","display_name":"electron beam evaporation","score":0.7049999833106995},{"id":"https://openalex.org/keywords/fused-silica-substrate","display_name":"fused silica substrate","score":0.9120000004768372},{"id":"https://openalex.org/keywords/impurity-aggregation","display_name":"impurity aggregation","score":0.8980000019073486},{"id":"https://openalex.org/keywords/femtosecond-laser-surface-modification","display_name":"femtosecond laser surface modification","score":0.6779999732971191},{"id":"https://openalex.org/keywords/1064-nm","display_name":"1064 nm","score":0.8109999895095825},{"id":"https://openalex.org/keywords/high-power-lasers","display_name":"high-power lasers","score":0.5260000228881836}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8964505195617676},{"id":"https://openalex.org/C2781448156","wikidata":"https://www.wikidata.org/wiki/Q1570182","display_name":"Coating","level":2,"score":0.8894997835159302},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.6771988868713379},{"id":"https://openalex.org/C167735695","wikidata":"https://www.wikidata.org/wiki/Q1777507","display_name":"Femtosecond","level":3,"score":0.6105291843414307},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.6033599972724915},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.5798590779304504},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.5715954303741455},{"id":"https://openalex.org/C71597924","wikidata":"https://www.wikidata.org/wiki/Q2890543","display_name":"Optical coating","level":3,"score":0.5511038303375244},{"id":"https://openalex.org/C64297162","wikidata":"https://www.wikidata.org/wiki/Q1987070","display_name":"Deposition (geology)","level":3,"score":0.5128734111785889},{"id":"https://openalex.org/C131584629","wikidata":"https://www.wikidata.org/wiki/Q4308705","display_name":"Coupling (piping)","level":2,"score":0.5015828609466553},{"id":"https://openalex.org/C108406538","wikidata":"https://www.wikidata.org/wiki/Q583040","display_name":"Anti-reflective coating","level":3,"score":0.4623068571090698},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.4513801336288452},{"id":"https://openalex.org/C71987851","wikidata":"https://www.wikidata.org/wiki/Q7216430","display_name":"Impurity","level":2,"score":0.43861448764801025},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4305569529533386},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.40141233801841736},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C2816523","wikidata":"https://www.wikidata.org/wiki/Q180184","display_name":"Sediment","level":2,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1117/12.2068034","doi":"https://doi.org/10.1117/12.2068034","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2068034","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},{"id":"pmh:oai:ir.siom.ac.cn:181231/17038","doi":null,"is_oa":false,"landing_page_url":"http://ir.siom.ac.cn/handle/181231/17038","pdf_url":null,"source":{"id":"https://openalex.org/S7407064335","display_name":"Shanghai Institute of Optics and Fine Mechanics, CAS Institutional Repository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"\u4f1a\u8bae\u8bba\u6587"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1975894873","https://openalex.org/W1985102489","https://openalex.org/W1991203962","https://openalex.org/W2010861416","https://openalex.org/W2011641164","https://openalex.org/W2040759357","https://openalex.org/W2060420370","https://openalex.org/W2061071011","https://openalex.org/W2068870955","https://openalex.org/W2090168519","https://openalex.org/W2124786775","https://openalex.org/W4205740989"],"related_works":["https://openalex.org/W2235381008","https://openalex.org/W2000901445","https://openalex.org/W4378232910","https://openalex.org/W2049870716","https://openalex.org/W2090168519","https://openalex.org/W2019472302","https://openalex.org/W2914501300","https://openalex.org/W2010861416","https://openalex.org/W4294295404","https://openalex.org/W2410703175"],"abstract_inverted_index":{"The":[0],"laser":[1,9,41,68],"damage":[2],"resistance":[3,42],"of":[4,17,34,43,99,112],"coatings":[5],"for":[6,108],"high":[7],"power":[8],"systems":[10],"depends":[11],"greatly":[12],"on":[13,39,54],"the":[14,31,40,77,82,88,96,100,109],"surface":[15,84],"quality":[16],"substrate.":[18],"In":[19],"this":[20],"work,":[21],"experimental":[22],"approaches":[23],"with":[24,58],"theoretical":[25],"simulation":[26,92],"were":[27,63],"employed":[28],"to":[29,81],"understand":[30],"coupling":[32,97],"effect":[33,98],"subsurface":[35],"defect":[36],"and":[37,59,85,103],"coating":[38,48,104],"coating.":[44,115],"1064":[45],"nm":[46],"anti-reflection":[47],"was":[49],"deposited":[50],"by":[51,66],"E-beam":[52,113],"deposition":[53,114],"fused":[55],"silica.":[56],"Substrate":[57],"without":[60],"micro-scale":[61],"pits":[62],"fabricated":[64],"precisely":[65],"femtosecond":[67],"processing.":[69],"Experimental":[70],"results":[71],"indicate":[72],"that":[73,95],"impurities":[74,102],"induced":[75],"in":[76],"finishing":[78],"process":[79],"shifted":[80],"substrate":[83],"aggregated":[86,101],"during":[87],"heating":[89],"process.":[90],"Theoretical":[91],"result":[93],"shows":[94],"are":[105],"mainly":[106],"responsible":[107],"low":[110],"LIDT":[111]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2016-06-24T00:00:00"}