{"id":"https://openalex.org/W1978294464","doi":"https://doi.org/10.1063/1.92716","title":"Periodic motion of the crystallization front during beam annealing of Si films","display_name":"Periodic motion of the crystallization front during beam annealing of Si films","publication_year":1981,"publication_date":"1981-08-15","ids":{"openalex":"https://openalex.org/W1978294464","doi":"https://doi.org/10.1063/1.92716","mag":"1978294464"},"language":"en","primary_location":{"id":"doi:10.1063/1.92716","doi":"https://doi.org/10.1063/1.92716","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.92716","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111479137","display_name":"Ross A. Lemons","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"R. A. Lemons","raw_affiliation_strings":["Bell Laboratories, Holmdel, New Jersey 07733"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bell Laboratories, Holmdel, New Jersey 07733","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109874963","display_name":"M. A. B\u00f6sch","orcid":"https://orcid.org/0009-0005-1201-2935","observed_orcids":["https://orcid.org/0009-0005-1201-2935"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M. A. B\u00f6sch","raw_affiliation_strings":["Bell Laboratories, Holmdel, New Jersey 07733"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bell Laboratories, Holmdel, New Jersey 07733","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":9.4604,"has_fulltext":false,"cited_by_count":27,"citation_normalized_percentile":{"value":0.98470341,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"39","issue":"4","first_page":"343","last_page":"345"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12141","display_name":"Fluid Dynamics and Thin Films","score":0.32100000977516174,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12141","display_name":"Fluid Dynamics and Thin Films","score":0.32100000977516174,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10732","display_name":"Laser Material Processing Techniques","score":0.2946999967098236,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11087","display_name":"Solidification and crystal growth phenomena","score":0.11230000108480453,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/crystallization-front","display_name":"crystallization front","score":0.8450000286102295},{"id":"https://openalex.org/keywords/silicon-thin-films","display_name":"silicon thin films","score":0.8949999809265137},{"id":"https://openalex.org/keywords/amorphous-silicon","display_name":"amorphous silicon","score":0.8339999914169312},{"id":"https://openalex.org/keywords/polycrystalline-silicon","display_name":"polycrystalline silicon","score":0.9399999976158142},{"id":"https://openalex.org/keywords/latent-heating","display_name":"latent heat release","score":0.8759999871253967},{"id":"https://openalex.org/keywords/temperature-gradient","display_name":"temperature gradient","score":0.5709999799728394},{"id":"https://openalex.org/keywords/recrystallization","display_name":"recrystallization","score":0.7670000195503235},{"id":"https://openalex.org/keywords/molten-pool","display_name":"molten pool","score":0.6830000281333923},{"id":"https://openalex.org/keywords/surface-tension-gradients","display_name":"surface tension gradients","score":0.8949999809265137},{"id":"https://openalex.org/keywords/laser-annealing","display_name":"laser annealing","score":0.5979999899864197},{"id":"https://openalex.org/keywords/electron-beam-annealing","display_name":"electron beam annealing","score":0.9860000014305115}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7719334959983826},{"id":"https://openalex.org/C203036418","wikidata":"https://www.wikidata.org/wiki/Q284256","display_name":"Crystallization","level":2,"score":0.6748154163360596},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.5804270505905151},{"id":"https://openalex.org/C195702682","wikidata":"https://www.wikidata.org/wiki/Q623318","display_name":"Recrystallization (geology)","level":2,"score":0.519143283367157},{"id":"https://openalex.org/C56052488","wikidata":"https://www.wikidata.org/wiki/Q103382","display_name":"Amorphous solid","level":2,"score":0.49178197979927063},{"id":"https://openalex.org/C2776390347","wikidata":"https://www.wikidata.org/wiki/Q474163","display_name":"Amorphous silicon","level":4,"score":0.4911148250102997},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.46206602454185486},{"id":"https://openalex.org/C2779015724","wikidata":"https://www.wikidata.org/wiki/Q7623560","display_name":"Striation","level":2,"score":0.45881256461143494},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.4432125389575958},{"id":"https://openalex.org/C80086925","wikidata":"https://www.wikidata.org/wiki/Q3960533","display_name":"Nanocrystalline silicon","level":5,"score":0.4198288917541504},{"id":"https://openalex.org/C2780565262","wikidata":"https://www.wikidata.org/wiki/Q737038","display_name":"Polycrystalline silicon","level":4,"score":0.4190976023674011},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.398345410823822},{"id":"https://openalex.org/C2779667780","wikidata":"https://www.wikidata.org/wiki/Q18206302","display_name":"Crystalline silicon","level":3,"score":0.3404207229614258},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.33571380376815796},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.1966797113418579},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.16958656907081604},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.1608920693397522},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.07990044355392456},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.92716","doi":"https://doi.org/10.1063/1.92716","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.92716","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1971221491","https://openalex.org/W1987866211","https://openalex.org/W1992754979","https://openalex.org/W2039716263","https://openalex.org/W2049254866","https://openalex.org/W2053049994","https://openalex.org/W2054972379","https://openalex.org/W2078375749","https://openalex.org/W2081640783","https://openalex.org/W2087552937","https://openalex.org/W2089929774","https://openalex.org/W2090637468","https://openalex.org/W2094859098","https://openalex.org/W2107520849"],"related_works":["https://openalex.org/W7084029660","https://openalex.org/W2073660352","https://openalex.org/W2024816190","https://openalex.org/W2898327930","https://openalex.org/W2088139998","https://openalex.org/W2092326800","https://openalex.org/W2035132190","https://openalex.org/W2146793191","https://openalex.org/W12529299","https://openalex.org/W2074203275"],"abstract_inverted_index":{"Periodic":[0,122],"surface":[1,150],"topography":[2,30],"is":[3,100],"observed":[4],"in":[5,68,77,138,144],"Si":[6,37],"films":[7,14],"deposited":[8],"on":[9],"fused":[10],"quartz":[11],"when":[12],"the":[13,33,36,48,52,78,81,91,94,116,120,126,130,145,157,165,169],"are":[15,57],"crystallized":[16],"by":[17,59],"a":[18,86,105,149],"scanning":[19],"laser":[20],"or":[21],"electron":[22],"beam.":[23,53,92],"The":[24,141],"formation":[25],"and":[26,70,102],"character":[27],"of":[28,35,51,74,90,129,164],"this":[29,98,160],"depends":[31],"upon":[32],"structure":[34],"film.":[38,121],"With":[39,110],"amorphous":[40],"Si,":[41],"periodic":[42,101,106],"features":[43],"can":[44,147],"be":[45],"formed":[46],"at":[47,125],"leading":[49],"edge":[50,128],"We":[54],"thick":[55],"these":[56],"produced":[58],"self":[60],"sustained":[61],"crystallization":[62,82],"as":[63],"has":[64],"been":[65,136],"previously":[66],"studied":[67,137],"Ge":[69],"other":[71,139],"materials.":[72,140],"Liberation":[73],"latent":[75],"heat":[76],"film":[79],"enables":[80],"front":[83],"to":[84,118,156],"propagate":[85],"short":[87],"distance":[88],"ahead":[89],"In":[93],"moving":[95],"temperature":[96,142],"gradient":[97,152],"motion":[99],"therefore":[103],"leaves":[104],"crystal":[107],"grain":[108],"pattern.":[109],"polycrystalline":[111],"silicon":[112,166],"films,":[113],"recrystallization":[114],"requires":[115],"beam":[117],"melt":[119,146],"structures":[123],"form":[124],"trailing":[127],"molten":[131],"pool.":[132],"Similar":[133],"ripples":[134],"have":[135],"distribution":[143],"cause":[148],"tension":[151],"that":[153],"pulls":[154],"material":[155,161],"edges.":[158],"When":[159],"solidifies,":[162],"expansion":[163],"may":[167],"enhance":[168],"ripple":[170],"amplitude.":[171]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2026-10-14T16:39:01.820549","created_date":"2016-06-24T00:00:00"}