{"id":"https://openalex.org/W1978187805","doi":"https://doi.org/10.1051/jphyscol:1984933","title":"HIGH SPATIAL RESOLUTION SIMS WITH THE UC-HRL SCANNING ION MICROPROBE","display_name":"HIGH SPATIAL RESOLUTION SIMS WITH THE UC-HRL SCANNING ION MICROPROBE","publication_year":1984,"publication_date":"1984-12-01","ids":{"openalex":"https://openalex.org/W1978187805","doi":"https://doi.org/10.1051/jphyscol:1984933","mag":"1978187805"},"language":"fr","primary_location":{"id":"doi:10.1051/jphyscol:1984933","doi":"https://doi.org/10.1051/jphyscol:1984933","is_oa":false,"landing_page_url":"https://doi.org/10.1051/jphyscol:1984933","pdf_url":null,"source":{"id":"https://openalex.org/S4210215636","display_name":"Le Journal de Physique Colloques","issn_l":"0449-1947","issn":["0449-1947","2777-3418"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319748","host_organization_name":"EDP Sciences","host_organization_lineage":["https://openalex.org/P4310319748","https://openalex.org/P4310319982"],"host_organization_lineage_names":["EDP Sciences","Science Press"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Le Journal de Physique Colloques","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal.science/jpa-00224413","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111464467","display_name":"Riccardo Levi\u2010Setti","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I40347166","display_name":"University of Chicago","ror":"https://ror.org/024mw5h28","country_code":"US","type":"education","lineage":["https://openalex.org/I40347166"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Levi-Setti","raw_affiliation_strings":["The Enrico Fermi Institute and Department of Physics, The University of Chicago, Chicago, Illinois 60637, U.S.A"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Enrico Fermi Institute and Department of Physics, The University of Chicago, Chicago, Illinois 60637, U.S.A","institution_ids":["https://openalex.org/I40347166"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015203346","display_name":"Yuh\u2010Lin Wang","orcid":"https://orcid.org/0000-0001-5920-3468","observed_orcids":["https://orcid.org/0000-0001-5920-3468"]},"institutions":[{"id":"https://openalex.org/I40347166","display_name":"University of Chicago","ror":"https://ror.org/024mw5h28","country_code":"US","type":"education","lineage":["https://openalex.org/I40347166"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Y. L. Wang","raw_affiliation_strings":["The Enrico Fermi Institute and Department of Physics, The University of Chicago, Chicago, Illinois 60637, U.S.A"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Enrico Fermi Institute and Department of Physics, The University of Chicago, Chicago, Illinois 60637, U.S.A","institution_ids":["https://openalex.org/I40347166"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110076240","display_name":"G. Crow","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I40347166","display_name":"University of Chicago","ror":"https://ror.org/024mw5h28","country_code":"US","type":"education","lineage":["https://openalex.org/I40347166"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"G. Crow","raw_affiliation_strings":["The Enrico Fermi Institute and Department of Physics, The University of Chicago, Chicago, Illinois 60637, U.S.A"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Enrico Fermi Institute and Department of Physics, The University of Chicago, Chicago, Illinois 60637, U.S.A","institution_ids":["https://openalex.org/I40347166"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I40347166"],"apc_list":null,"apc_paid":null,"fwci":1.2753,"has_fulltext":false,"cited_by_count":42,"citation_normalized_percentile":{"value":0.73592493,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":97},"biblio":{"volume":"45","issue":"C9","first_page":"C9","last_page":"197"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10683","display_name":"Mass Spectrometry Techniques and Applications","score":0.0008999999845400453,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","score":0.0008999999845400453,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ga-ion-beam","display_name":"Ga+ ion beam","score":0.8489999771118164},{"id":"https://openalex.org/keywords/secondary-ion-imaging","display_name":"secondary ion imaging","score":0.6679999828338623},{"id":"https://openalex.org/keywords/lateral-resolution","display_name":"lateral resolution","score":0.7540000081062317},{"id":"https://openalex.org/keywords/high-spatial-resolution","display_name":"high spatial resolution","score":0.5709999799728394}],"concepts":[{"id":"https://openalex.org/C125206250","wikidata":"https://www.wikidata.org/wiki/Q2365355","display_name":"Microprobe","level":2,"score":0.941759467124939},{"id":"https://openalex.org/C77671233","wikidata":"https://www.wikidata.org/wiki/Q556046","display_name":"Secondary ion mass spectrometry","level":3,"score":0.6671137809753418},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.4913903772830963},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.44221585988998413},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.4374420940876007},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3818496763706207},{"id":"https://openalex.org/C199289684","wikidata":"https://www.wikidata.org/wiki/Q83353","display_name":"Mineralogy","level":1,"score":0.2204194962978363},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.20375007390975952},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.12000098824501038},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.06636124849319458},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.05494925379753113},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1051/jphyscol:1984933","doi":"https://doi.org/10.1051/jphyscol:1984933","is_oa":false,"landing_page_url":"https://doi.org/10.1051/jphyscol:1984933","pdf_url":null,"source":{"id":"https://openalex.org/S4210215636","display_name":"Le Journal de Physique Colloques","issn_l":"0449-1947","issn":["0449-1947","2777-3418"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319748","host_organization_name":"EDP Sciences","host_organization_lineage":["https://openalex.org/P4310319748","https://openalex.org/P4310319982"],"host_organization_lineage_names":["EDP Sciences","Science Press"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Le Journal de Physique Colloques","raw_type":"journal-article"},{"id":"pmh:oai:edpsciences.org:dkey/10.1051/jphyscol:1984933","doi":null,"is_oa":false,"landing_page_url":"https://jphyscol.journaldephysique.org/10.1051/jphyscol:1984933/pdf","pdf_url":"https://jphyscol.journaldephysique.org/10.1051/jphyscol:1984933/pdf","source":{"id":"https://openalex.org/S4306400744","display_name":"Springer Link (Chiba Institute of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I8488066","host_organization_name":"Chiba Institute of Technology","host_organization_lineage":["https://openalex.org/I8488066"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"https://doi.org/10.1051/jphyscol:1984933","raw_type":"Text"},{"id":"pmh:oai:HAL:jpa-00224413v1","doi":null,"is_oa":true,"landing_page_url":"https://hal.science/jpa-00224413","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252976","host_organization_name":"Centre pour la Communication Scientifique Directe","host_organization_lineage":["https://openalex.org/I4405252976"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal de Physique Colloques, 1984, 45 (C9), pp.C9-197-C9-205. ⟨10.1051/jphyscol:1984933⟩","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:HAL:jpa-00224413v1","doi":null,"is_oa":true,"landing_page_url":"https://hal.science/jpa-00224413","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252976","host_organization_name":"Centre pour la Communication Scientifique Directe","host_organization_lineage":["https://openalex.org/I4405252976"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal de Physique Colloques, 1984, 45 (C9), pp.C9-197-C9-205. ⟨10.1051/jphyscol:1984933⟩","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W3036069346","https://openalex.org/W2077752665","https://openalex.org/W1993064800","https://openalex.org/W3036713826","https://openalex.org/W1973952726","https://openalex.org/W2916141720","https://openalex.org/W2900216835","https://openalex.org/W2121201112","https://openalex.org/W7033491902","https://openalex.org/W2085531817"],"abstract_inverted_index":{"A":[0],"new":[1],"Ga+":[2],"scanning":[3],"ion":[4],"microprobe":[5],"yields":[6],"images":[7],"at":[8],"lateral":[9],"resolution":[10],"approaching":[11],"40":[12],"nm,":[13],"making":[14],"use":[15],"of":[16],"the":[17],"secondary":[18],"ions":[19],"analyzed":[20],"by":[21],"an":[22],"RF":[23],"quadrupole":[24],"mass":[25],"filter.":[26]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":3}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}