{"id":"https://openalex.org/W1978112840","doi":"https://doi.org/10.1063/1.4919528","title":"Apertureless scanning microscope probe as a detector of semiconductor laser emission","display_name":"Apertureless scanning microscope probe as a detector of semiconductor laser emission","publication_year":2015,"publication_date":"2015-04-27","ids":{"openalex":"https://openalex.org/W1978112840","doi":"https://doi.org/10.1063/1.4919528","mag":"1978112840"},"language":"en","primary_location":{"id":"doi:10.1063/1.4919528","doi":"https://doi.org/10.1063/1.4919528","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.4919528","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009483013","display_name":"M. S. Dunaevskiy","orcid":"https://orcid.org/0000-0001-6038-223X","observed_orcids":["https://orcid.org/0000-0001-6038-223X"]},"institutions":[{"id":"https://openalex.org/I173089394","display_name":"ITMO University","ror":"https://ror.org/04txgxn49","country_code":"RU","type":"education","lineage":["https://openalex.org/I173089394"]},{"id":"https://openalex.org/I95568926","display_name":"Ioffe Institute","ror":"https://ror.org/05dkdaa55","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210096333","https://openalex.org/I95568926"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Mikhail Dunaevskiy","raw_affiliation_strings":["Ioffe Institute 1 , Saint-Petersburg 194021, Russia","National Research University of Information Technologies 2 , Mechanics and Optics (ITMO), Saint-Petersburg 197101, Russia"],"raw_orcid":"https://orcid.org/0000-0001-6038-223X","affiliations":[{"raw_affiliation_string":"Ioffe Institute 1 , Saint-Petersburg 194021, Russia","institution_ids":["https://openalex.org/I95568926"]},{"raw_affiliation_string":"National Research University of Information Technologies 2 , Mechanics and Optics (ITMO), Saint-Petersburg 197101, Russia","institution_ids":["https://openalex.org/I173089394"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008764459","display_name":"Anton Dontsov","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I95568926","display_name":"Ioffe Institute","ror":"https://ror.org/05dkdaa55","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210096333","https://openalex.org/I95568926"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Anton Dontsov","raw_affiliation_strings":["Ioffe Institute 1 , Saint-Petersburg 194021, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ioffe Institute 1 , Saint-Petersburg 194021, Russia","institution_ids":["https://openalex.org/I95568926"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029727917","display_name":"P. A. Alekseev","orcid":"https://orcid.org/0000-0002-8143-4606","observed_orcids":["https://orcid.org/0000-0002-8143-4606"]},"institutions":[{"id":"https://openalex.org/I41518628","display_name":"Saint Petersburg State Electrotechnical University","ror":"https://ror.org/023bq8521","country_code":"RU","type":"education","lineage":["https://openalex.org/I41518628"]},{"id":"https://openalex.org/I95568926","display_name":"Ioffe Institute","ror":"https://ror.org/05dkdaa55","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210096333","https://openalex.org/I95568926"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Prokhor Alekseev","raw_affiliation_strings":["Ioffe Institute 1 , Saint-Petersburg 194021, Russia","Saint Petersburg Electrotechnical University \"LETI,\" 3 Saint-Petersburg 197376, Russia"],"raw_orcid":"https://orcid.org/0000-0002-8143-4606","affiliations":[{"raw_affiliation_string":"Ioffe Institute 1 , Saint-Petersburg 194021, Russia","institution_ids":["https://openalex.org/I95568926"]},{"raw_affiliation_string":"Saint Petersburg Electrotechnical University \"LETI,\" 3 Saint-Petersburg 197376, Russia","institution_ids":["https://openalex.org/I41518628"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108140799","display_name":"A. M. Monakhov","orcid":"https://orcid.org/0000-0002-7190-6614","observed_orcids":["https://orcid.org/0000-0002-7190-6614"]},"institutions":[{"id":"https://openalex.org/I95568926","display_name":"Ioffe Institute","ror":"https://ror.org/05dkdaa55","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210096333","https://openalex.org/I95568926"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Andrei Monakhov","raw_affiliation_strings":["Ioffe Institute 1 , Saint-Petersburg 194021, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ioffe Institute 1 , Saint-Petersburg 194021, Russia","institution_ids":["https://openalex.org/I95568926"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070987650","display_name":"Alexei N. Baranov","orcid":"https://orcid.org/0000-0003-4940-6098","observed_orcids":["https://orcid.org/0000-0003-4940-6098"]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210134800","display_name":"Institut d'\u00c9lectronique et des Syst\u00e8mes","ror":"https://ror.org/0431hh004","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210095849","https://openalex.org/I4210134800"]},{"id":"https://openalex.org/I4387154756","display_name":"Universit\u00e9 Montpellier 2","ror":"https://ror.org/00wh4bp03","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307","https://openalex.org/I4387154756"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Alexei Baranov","raw_affiliation_strings":["Institut d'Electronique du Sud 4 , UMR 5214 UM2-CNRS, CC082, Universit\u00e9 Montpellier 2, 34095 Montpellier Cedex 5, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut d'Electronique du Sud 4 , UMR 5214 UM2-CNRS, CC082, Universit\u00e9 Montpellier 2, 34095 Montpellier Cedex 5, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210134800","https://openalex.org/I4387154756"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104364238","display_name":"Paul Girard","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210134800","display_name":"Institut d'\u00c9lectronique et des Syst\u00e8mes","ror":"https://ror.org/0431hh004","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210095849","https://openalex.org/I4210134800"]},{"id":"https://openalex.org/I4387154756","display_name":"Universit\u00e9 Montpellier 2","ror":"https://ror.org/00wh4bp03","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307","https://openalex.org/I4387154756"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Paul Girard","raw_affiliation_strings":["Institut d'Electronique du Sud 4 , UMR 5214 UM2-CNRS, CC082, Universit\u00e9 Montpellier 2, 34095 Montpellier Cedex 5, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut d'Electronique du Sud 4 , UMR 5214 UM2-CNRS, CC082, Universit\u00e9 Montpellier 2, 34095 Montpellier Cedex 5, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210134800","https://openalex.org/I4387154756"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029935295","display_name":"Richard Arinero","orcid":"https://orcid.org/0000-0002-2578-2606","observed_orcids":["https://orcid.org/0000-0002-2578-2606"]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210134800","display_name":"Institut d'\u00c9lectronique et des Syst\u00e8mes","ror":"https://ror.org/0431hh004","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210095849","https://openalex.org/I4210134800"]},{"id":"https://openalex.org/I4387154756","display_name":"Universit\u00e9 Montpellier 2","ror":"https://ror.org/00wh4bp03","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307","https://openalex.org/I4387154756"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Richard Arinero","raw_affiliation_strings":["Institut d'Electronique du Sud 4 , UMR 5214 UM2-CNRS, CC082, Universit\u00e9 Montpellier 2, 34095 Montpellier Cedex 5, France"],"raw_orcid":"https://orcid.org/0000-0002-2578-2606","affiliations":[{"raw_affiliation_string":"Institut d'Electronique du Sud 4 , UMR 5214 UM2-CNRS, CC082, Universit\u00e9 Montpellier 2, 34095 Montpellier Cedex 5, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210134800","https://openalex.org/I4387154756"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020517415","display_name":"R. Teissier","orcid":"https://orcid.org/0000-0002-1453-2433","observed_orcids":["https://orcid.org/0000-0002-1453-2433"]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210134800","display_name":"Institut d'\u00c9lectronique et des Syst\u00e8mes","ror":"https://ror.org/0431hh004","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210095849","https://openalex.org/I4210134800"]},{"id":"https://openalex.org/I4387154756","display_name":"Universit\u00e9 Montpellier 2","ror":"https://ror.org/00wh4bp03","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307","https://openalex.org/I4387154756"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Roland Teissier","raw_affiliation_strings":["Institut d'Electronique du Sud 4 , UMR 5214 UM2-CNRS, CC082, Universit\u00e9 Montpellier 2, 34095 Montpellier Cedex 5, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut d'Electronique du Sud 4 , UMR 5214 UM2-CNRS, CC082, Universit\u00e9 Montpellier 2, 34095 Montpellier Cedex 5, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210134800","https://openalex.org/I4387154756"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050920313","display_name":"A. N. Titkov","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I41518628","display_name":"Saint Petersburg State Electrotechnical University","ror":"https://ror.org/023bq8521","country_code":"RU","type":"education","lineage":["https://openalex.org/I41518628"]},{"id":"https://openalex.org/I95568926","display_name":"Ioffe Institute","ror":"https://ror.org/05dkdaa55","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210096333","https://openalex.org/I95568926"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Alexander Titkov","raw_affiliation_strings":["Ioffe Institute 1 , Saint-Petersburg 194021, Russia","Saint Petersburg Electrotechnical University \"LETI,\" 3 Saint-Petersburg 197376, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ioffe Institute 1 , Saint-Petersburg 194021, Russia","institution_ids":["https://openalex.org/I95568926"]},{"raw_affiliation_string":"Saint Petersburg Electrotechnical University \"LETI,\" 3 Saint-Petersburg 197376, Russia","institution_ids":["https://openalex.org/I41518628"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8888,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.68851653,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"106","issue":"17","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12466","display_name":"Near-Field Optical Microscopy","score":0.43140000104904175,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12466","display_name":"Near-Field Optical Microscopy","score":0.43140000104904175,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.3407999873161316,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.05009999871253967,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/multiple-reflections","display_name":"multiple reflections","score":0.597000002861023},{"id":"https://openalex.org/keywords/infrared-emission","display_name":"infrared emission","score":0.5820000171661377},{"id":"https://openalex.org/keywords/diode-laser","display_name":"diode laser","score":0.878000020980835}],"concepts":[{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.7488458752632141},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.6356916427612305},{"id":"https://openalex.org/C67649825","wikidata":"https://www.wikidata.org/wiki/Q196538","display_name":"Microscope","level":2,"score":0.6227860450744629},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.567724347114563},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.5653041005134583},{"id":"https://openalex.org/C141354745","wikidata":"https://www.wikidata.org/wiki/Q17227","display_name":"Cantilever","level":2,"score":0.5314829349517822},{"id":"https://openalex.org/C121477167","wikidata":"https://www.wikidata.org/wiki/Q17154002","display_name":"Semiconductor laser theory","level":3,"score":0.4873681664466858},{"id":"https://openalex.org/C21799368","wikidata":"https://www.wikidata.org/wiki/Q212656","display_name":"Near-field scanning optical microscope","level":4,"score":0.4727129638195038},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4616369903087616},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.4517291784286499},{"id":"https://openalex.org/C200649887","wikidata":"https://www.wikidata.org/wiki/Q17154544","display_name":"Laser power scaling","level":3,"score":0.43171826004981995},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.4148064851760864},{"id":"https://openalex.org/C77017923","wikidata":"https://www.wikidata.org/wiki/Q912313","display_name":"Optical microscope","level":3,"score":0.27070194482803345},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.16230636835098267},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13676735758781433},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1063/1.4919528","doi":"https://doi.org/10.1063/1.4919528","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.4919528","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-01626348v1","doi":null,"is_oa":false,"landing_page_url":"https://hal.science/hal-01626348","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252976","host_organization_name":"Centre pour la Communication Scientifique Directe","host_organization_lineage":["https://openalex.org/I4405252976"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Applied Physics Letters, 2015, 106 (17), ⟨10.1063/1.4919528⟩","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G6554937906","display_name":null,"funder_award_id":"14-02-01118","funder_id":"https://openalex.org/F4320321079","funder_display_name":"Russian Foundation for Basic Research"}],"funders":[{"id":"https://openalex.org/F4320321079","display_name":"Russian Foundation for Basic Research","ror":"https://ror.org/02mh1ke95"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1975144453","https://openalex.org/W2011481574","https://openalex.org/W2052765137","https://openalex.org/W2057647159","https://openalex.org/W2094093348","https://openalex.org/W2094535676","https://openalex.org/W2103524513"],"related_works":["https://openalex.org/W1979593488","https://openalex.org/W2052765137","https://openalex.org/W2137246594","https://openalex.org/W2031921541","https://openalex.org/W2079231044","https://openalex.org/W3008775767","https://openalex.org/W2001071055","https://openalex.org/W3129883060","https://openalex.org/W7134342793","https://openalex.org/W2015817025"],"abstract_inverted_index":{"An":[0],"operating":[1],"semiconductor":[2],"laser":[3,27,48,78,121],"has":[4,29,62,125],"been":[5,30,63,126],"studied":[6],"using":[7],"a":[8,66,110,119],"scanning":[9],"probe":[10,19,72,103],"microscope.":[11],"A":[12,55],"shift":[13,34],"of":[14,18,58,68,76,83,115,118],"the":[15,38,47,59,71,74,77,81,84,91,96,98,102],"resonance":[16],"frequency":[17],"that":[20],"is":[21,35,105],"due":[22,79],"to":[23,37,45,80,90],"its":[24,52],"heating":[25],"by":[26,101],"radiation":[28,40],"analyzed.":[31],"The":[32],"observed":[33,64],"proportional":[36],"absorbed":[39],"and":[41,73,86],"can":[42],"be":[43],"used":[44],"measure":[46],"near":[49],"field":[50],"or":[51],"output":[53],"power.":[54],"periodical":[56],"dependence":[57],"measured":[60],"signal":[61],"as":[65],"function":[67],"distance":[69],"between":[70],"surface":[75],"interference":[82],"outgoing":[85],"cantilever-reflected":[87],"waves.":[88],"Due":[89],"multiple":[92],"reflections":[93],"resulting":[94],"in":[95],"interference,":[97],"light":[99],"absorption":[100],"cantilever":[104],"greatly":[106],"enhanced":[107],"compared":[108],"with":[109,122],"single":[111],"pass":[112],"case.":[113],"Interaction":[114],"infrared":[116],"emission":[117],"diode":[120],"different":[123],"probes":[124],"studied.":[127]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2026-10-27T15:51:10.671819","created_date":"2016-06-24T00:00:00"}