{"id":"https://openalex.org/W1978013076","doi":"https://doi.org/10.1016/0022-3093(85)90797-5","title":"Detailed studies of optical edge and below gap absorption in a-Si1\u2212xCx:H system","display_name":"Detailed studies of optical edge and below gap absorption in a-Si1\u2212xCx:H system","publication_year":1985,"publication_date":"1985-12-01","ids":{"openalex":"https://openalex.org/W1978013076","doi":"https://doi.org/10.1016/0022-3093(85)90797-5","mag":"1978013076"},"language":"en","primary_location":{"id":"doi:10.1016/0022-3093(85)90797-5","doi":"https://doi.org/10.1016/0022-3093(85)90797-5","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0022-3093(85)90797-5","pdf_url":null,"source":{"id":"https://openalex.org/S59020844","display_name":"Journal of Non-Crystalline Solids","issn_l":"0022-3093","issn":["0022-3093","1873-4812"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-1","norway-1","poland-70","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Non-Crystalline Solids","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011470671","display_name":"Shuichi Nonomura","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210117807","display_name":"National Institute of Technology, Akashi College","ror":"https://ror.org/029kvcs29","country_code":"JP","type":"education","lineage":["https://openalex.org/I4210117807","https://openalex.org/I4210120810"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Nonomura","raw_affiliation_strings":["Electrical Engineering, Akashi Technological College, Akashi, Hyogo 674, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering, Akashi Technological College, Akashi, Hyogo 674, Japan","institution_ids":["https://openalex.org/I4210117807"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111728250","display_name":"Seizou Sakata","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210117807","display_name":"National Institute of Technology, Akashi College","ror":"https://ror.org/029kvcs29","country_code":"JP","type":"education","lineage":["https://openalex.org/I4210117807","https://openalex.org/I4210120810"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Sakata","raw_affiliation_strings":["Electrical Engineering, Akashi Technological College, Akashi, Hyogo 674, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering, Akashi Technological College, Akashi, Hyogo 674, Japan","institution_ids":["https://openalex.org/I4210117807"]}]},{"author_position":"middle","author":{"id":null,"display_name":"T. Kanada","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Kanada","raw_affiliation_strings":["Faculty of Engineering Science, Osaka University, Toyonaka, Osaka 560, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Engineering Science, Osaka University, Toyonaka, Osaka 560, Japan","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111588154","display_name":"Hirotsugu Kida","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Kida","raw_affiliation_strings":["Faculty of Engineering Science, Osaka University, Toyonaka, Osaka 560, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Engineering Science, Osaka University, Toyonaka, Osaka 560, Japan","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016281184","display_name":"Dusit Kruangam","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"D. Kruangam","raw_affiliation_strings":["Faculty of Engineering Science, Osaka University, Toyonaka, Osaka 560, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Engineering Science, Osaka University, Toyonaka, Osaka 560, Japan","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060412731","display_name":"H. Okamoto","orcid":"https://orcid.org/0000-0002-0723-7049","observed_orcids":["https://orcid.org/0000-0002-0723-7049"]},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Okamoto","raw_affiliation_strings":["Faculty of Engineering Science, Osaka University, Toyonaka, Osaka 560, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Engineering Science, Osaka University, Toyonaka, Osaka 560, Japan","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110046439","display_name":"Yoshihiro Hamakawa","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Hamakawa","raw_affiliation_strings":["Faculty of Engineering Science, Osaka University, Toyonaka, Osaka 560, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Engineering Science, Osaka University, Toyonaka, Osaka 560, Japan","institution_ids":["https://openalex.org/I98285908"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3380,"currency":"USD","value_usd":3380},"apc_paid":null,"fwci":3.8007,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.92065675,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"77-78","issue":null,"first_page":"865","last_page":"868"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.7339000105857849,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.7339000105857849,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.12470000237226486,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11169","display_name":"Silicon Nanostructures and Photoluminescence","score":0.055399999022483826,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/amorphous-silicon","display_name":"amorphous silicon","score":0.6480000019073486},{"id":"https://openalex.org/keywords/hydrogenated-amorphous-silicon","display_name":"hydrogenated amorphous silicon","score":0.8669999837875366},{"id":"https://openalex.org/keywords/optical-absorption-edge","display_name":"optical absorption edge","score":0.9779999852180481},{"id":"https://openalex.org/keywords/urbach-tail","display_name":"Urbach tail","score":0.8410000205039978},{"id":"https://openalex.org/keywords/electroabsorption-spectra","display_name":"electroabsorption spectra","score":0.8489999771118164},{"id":"https://openalex.org/keywords/photoacoustic-spectroscopy","display_name":"photoacoustic spectroscopy","score":0.9089999794960022},{"id":"https://openalex.org/keywords/substrate-temperature","display_name":"substrate temperature","score":0.8980000019073486},{"id":"https://openalex.org/keywords/chemical-disorder","display_name":"chemical disorder","score":0.8889999985694885},{"id":"https://openalex.org/keywords/thermal-disorder","display_name":"thermal disorder","score":0.9919999837875366}],"concepts":[{"id":"https://openalex.org/C125287762","wikidata":"https://www.wikidata.org/wiki/Q1758948","display_name":"Absorption (acoustics)","level":2,"score":0.6561659574508667},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6386922597885132},{"id":"https://openalex.org/C50792271","wikidata":"https://www.wikidata.org/wiki/Q332846","display_name":"Absorption edge","level":3,"score":0.6233954429626465},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.6072736382484436},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.5680540800094604},{"id":"https://openalex.org/C54932901","wikidata":"https://www.wikidata.org/wiki/Q7187705","display_name":"Photoacoustic imaging in biomedicine","level":2,"score":0.49627548456192017},{"id":"https://openalex.org/C32891209","wikidata":"https://www.wikidata.org/wiki/Q483666","display_name":"Spectroscopy","level":2,"score":0.4428047239780426},{"id":"https://openalex.org/C4839761","wikidata":"https://www.wikidata.org/wiki/Q212111","display_name":"Spectral line","level":2,"score":0.43287748098373413},{"id":"https://openalex.org/C119824511","wikidata":"https://www.wikidata.org/wiki/Q13553575","display_name":"Absorption spectroscopy","level":2,"score":0.4325874447822571},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.39533570408821106},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3863905370235443},{"id":"https://openalex.org/C181966813","wikidata":"https://www.wikidata.org/wiki/Q806352","display_name":"Band gap","level":2,"score":0.37039485573768616},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3663581609725952},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2798509895801544},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08434480428695679},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.06192651391029358},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0022-3093(85)90797-5","doi":"https://doi.org/10.1016/0022-3093(85)90797-5","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0022-3093(85)90797-5","pdf_url":null,"source":{"id":"https://openalex.org/S59020844","display_name":"Journal of Non-Crystalline Solids","issn_l":"0022-3093","issn":["0022-3093","1873-4812"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-1","norway-1","poland-70","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Non-Crystalline Solids","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1964500573","https://openalex.org/W1967322827","https://openalex.org/W1985133623","https://openalex.org/W2004776339","https://openalex.org/W2024573115","https://openalex.org/W2028268071","https://openalex.org/W2032053827","https://openalex.org/W2077056838","https://openalex.org/W2600419165"],"related_works":["https://openalex.org/W2005745555","https://openalex.org/W2074388551","https://openalex.org/W1993961486","https://openalex.org/W2072245561","https://openalex.org/W1989482192","https://openalex.org/W2082477924","https://openalex.org/W1601856937","https://openalex.org/W1968861453","https://openalex.org/W7065265228","https://openalex.org/W4320458297"],"abstract_inverted_index":null,"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}