{"id":"https://openalex.org/W1977094491","doi":"https://doi.org/10.1016/0304-3991(89)90003-x","title":"An ultra-high-vacuum transmission and scanning electron microscope for crystal growth experiments","display_name":"An ultra-high-vacuum transmission and scanning electron microscope for crystal growth experiments","publication_year":1989,"publication_date":"1989-05-01","ids":{"openalex":"https://openalex.org/W1977094491","doi":"https://doi.org/10.1016/0304-3991(89)90003-x","mag":"1977094491"},"language":"en","primary_location":{"id":"doi:10.1016/0304-3991(89)90003-x","doi":"https://doi.org/10.1016/0304-3991(89)90003-x","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0304-3991(89)90003-x","pdf_url":null,"source":{"id":"https://openalex.org/S27731274","display_name":"Ultramicroscopy","issn_l":"0304-3991","issn":["0304-3991","1879-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-a","jufo-1","ki-jl-1","medline","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Ultramicroscopy","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113569440","display_name":"J.J. M\u00e9tois","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210127181","display_name":"Catskill Regional Medical Center","ror":"https://ror.org/03eevrx63","country_code":"US","type":"healthcare","lineage":["https://openalex.org/I4210127181"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J.J. M\u00e9tois","raw_affiliation_strings":["CRMC"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CRMC","institution_ids":["https://openalex.org/I4210127181"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049231897","display_name":"Serge Nitsche","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210127181","display_name":"Catskill Regional Medical Center","ror":"https://ror.org/03eevrx63","country_code":"US","type":"healthcare","lineage":["https://openalex.org/I4210127181"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Nitsche","raw_affiliation_strings":["CRMC"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CRMC","institution_ids":["https://openalex.org/I4210127181"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111728970","display_name":"J.C. Heyraud","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210127181","display_name":"Catskill Regional Medical Center","ror":"https://ror.org/03eevrx63","country_code":"US","type":"healthcare","lineage":["https://openalex.org/I4210127181"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J.C. Heyraud","raw_affiliation_strings":["CRMC"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CRMC","institution_ids":["https://openalex.org/I4210127181"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210127181"],"apc_list":{"value":3760,"currency":"USD","value_usd":3760},"apc_paid":null,"fwci":1.0388,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.74102745,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"27","issue":"4","first_page":"349","last_page":"357"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},"topics":[{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.005900000222027302,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","score":0.0010999999940395355,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ultra-high-vacuum-electron-microscopy","display_name":"ultra-high vacuum electron microscopy","score":0.8190000057220459},{"id":"https://openalex.org/keywords/transmission-electron-microscope","display_name":"transmission electron microscope","score":0.6959999799728394},{"id":"https://openalex.org/keywords/scanning-electron-microscopy","display_name":"scanning electron microscopy","score":0.9350000023841858},{"id":"https://openalex.org/keywords/in-situ-crystal-growth","display_name":"in situ crystal growth","score":0.9929999709129333},{"id":"https://openalex.org/keywords/evaporation-source","display_name":"evaporation source","score":0.7129999995231628}],"concepts":[{"id":"https://openalex.org/C82225425","wikidata":"https://www.wikidata.org/wiki/Q7880334","display_name":"Ultra-high vacuum","level":2,"score":0.6730135083198547},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6350164413452148},{"id":"https://openalex.org/C2781285689","wikidata":"https://www.wikidata.org/wiki/Q21921428","display_name":"Crystal (programming language)","level":2,"score":0.6231728792190552},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.6199448108673096},{"id":"https://openalex.org/C61441594","wikidata":"https://www.wikidata.org/wiki/Q132814","display_name":"Evaporation","level":2,"score":0.6091534495353699},{"id":"https://openalex.org/C2779698641","wikidata":"https://www.wikidata.org/wiki/Q5309","display_name":"Graphite","level":2,"score":0.6037130355834961},{"id":"https://openalex.org/C146088050","wikidata":"https://www.wikidata.org/wiki/Q744818","display_name":"Transmission electron microscopy","level":2,"score":0.5892859697341919},{"id":"https://openalex.org/C2777822432","wikidata":"https://www.wikidata.org/wiki/Q216681","display_name":"In situ","level":2,"score":0.5763638615608215},{"id":"https://openalex.org/C30646810","wikidata":"https://www.wikidata.org/wiki/Q185648","display_name":"Torr","level":2,"score":0.5682744979858398},{"id":"https://openalex.org/C193016168","wikidata":"https://www.wikidata.org/wiki/Q874835","display_name":"Scanning transmission electron microscopy","level":3,"score":0.5594968795776367},{"id":"https://openalex.org/C2779192298","wikidata":"https://www.wikidata.org/wiki/Q7908061","display_name":"Vacuum evaporation","level":3,"score":0.5354613661766052},{"id":"https://openalex.org/C178423520","wikidata":"https://www.wikidata.org/wiki/Q744818","display_name":"Conventional transmission electron microscope","level":4,"score":0.46537134051322937},{"id":"https://openalex.org/C26456737","wikidata":"https://www.wikidata.org/wiki/Q185154","display_name":"Crystal growth","level":2,"score":0.45293572545051575},{"id":"https://openalex.org/C135693964","wikidata":"https://www.wikidata.org/wiki/Q1444759","display_name":"Low-voltage electron microscope","level":5,"score":0.4420516788959503},{"id":"https://openalex.org/C67649825","wikidata":"https://www.wikidata.org/wiki/Q196538","display_name":"Microscope","level":2,"score":0.44164055585861206},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3835700750350952},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.38343995809555054},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3756425082683563},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.25717926025390625},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.25265318155288696},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.24976307153701782},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.15498363971710205},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.09789380431175232},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.09274378418922424},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06490233540534973},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0304-3991(89)90003-x","doi":"https://doi.org/10.1016/0304-3991(89)90003-x","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0304-3991(89)90003-x","pdf_url":null,"source":{"id":"https://openalex.org/S27731274","display_name":"Ultramicroscopy","issn_l":"0304-3991","issn":["0304-3991","1879-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-a","jufo-1","ki-jl-1","medline","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Ultramicroscopy","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W144675102","https://openalex.org/W1967480258","https://openalex.org/W1970573545","https://openalex.org/W1972846765","https://openalex.org/W1973473207","https://openalex.org/W1977115119","https://openalex.org/W1979545000","https://openalex.org/W1981444144","https://openalex.org/W1983203959","https://openalex.org/W1991104947","https://openalex.org/W1999630728","https://openalex.org/W2005968779","https://openalex.org/W2006913517","https://openalex.org/W2025084259","https://openalex.org/W2033499828","https://openalex.org/W2039048143","https://openalex.org/W2040603943","https://openalex.org/W2041129293","https://openalex.org/W2050004230","https://openalex.org/W2077776473","https://openalex.org/W2079119911","https://openalex.org/W2087355997","https://openalex.org/W2092933066"],"related_works":["https://openalex.org/W2010370469","https://openalex.org/W4384297385","https://openalex.org/W4244950297","https://openalex.org/W1997130412","https://openalex.org/W2081789451","https://openalex.org/W1978545211","https://openalex.org/W2051497731","https://openalex.org/W1974758030","https://openalex.org/W2094451430","https://openalex.org/W2041124584"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-09-22T06:50:58.402377","created_date":"2016-06-24T00:00:00"}