{"id":"https://openalex.org/W1973449727","doi":"https://doi.org/10.1109/test.2009.5355906","title":"Built-in Self Test for Error Vector Magnitude measurement of RF transceiver","display_name":"Built-in Self Test for Error Vector Magnitude measurement of RF transceiver","publication_year":2009,"publication_date":"2009-11-01","ids":{"openalex":"https://openalex.org/W1973449727","doi":"https://doi.org/10.1109/test.2009.5355906","mag":"1973449727"},"language":"en","primary_location":{"id":"doi:10.1109/test.2009.5355906","doi":"https://doi.org/10.1109/test.2009.5355906","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2009.5355906","pdf_url":null,"source":{"id":"https://openalex.org/S4210209697","display_name":"IEEE International Test Conference (ITC)","issn_l":"1089-3539","issn":["1089-3539","2378-2250"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 International Test Conference","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016144361","display_name":"Bilal Elkassir","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Bilal El Kassir","raw_affiliation_strings":["NXP Semiconductor, ICRF, Caen, France","ICRF, NXP Semiconductor, Colombelles, BP 20000 CAEN 14906 Cedex 9, FRANCE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductor, ICRF, Caen, France","institution_ids":[]},{"raw_affiliation_string":"ICRF, NXP Semiconductor, Colombelles, BP 20000 CAEN 14906 Cedex 9, FRANCE","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087174545","display_name":"Christophe Kelma","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Christophe Kelma","raw_affiliation_strings":["NXP Semiconductor, ICRF, Caen, France","ICRF, NXP Semiconductor, Colombelles, BP 20000 CAEN 14906 Cedex 9, FRANCE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductor, ICRF, Caen, France","institution_ids":[]},{"raw_affiliation_string":"ICRF, NXP Semiconductor, Colombelles, BP 20000 CAEN 14906 Cedex 9, FRANCE","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111765116","display_name":"B. Jarry","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210093397","display_name":"XLIM","ror":"https://ror.org/00f7srh09","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I32881790","https://openalex.org/I4210093397","https://openalex.org/I4210095849","https://openalex.org/I65806277"]},{"id":"https://openalex.org/I65806277","display_name":"Universit\u00e9 de Limoges","ror":"https://ror.org/02cp04407","country_code":"FR","type":"education","lineage":["https://openalex.org/I65806277"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Bernard Jarry","raw_affiliation_strings":["C2S2, CLIM, Limoges, France","C2S2, XLIM, 87060 LIMOGES Cedex, FRANCE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"C2S2, CLIM, Limoges, France","institution_ids":["https://openalex.org/I65806277"]},{"raw_affiliation_string":"C2S2, XLIM, 87060 LIMOGES Cedex, FRANCE","institution_ids":["https://openalex.org/I4210093397","https://openalex.org/I65806277"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089534634","display_name":"Michel Campovecchio","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210093397","display_name":"XLIM","ror":"https://ror.org/00f7srh09","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I32881790","https://openalex.org/I4210093397","https://openalex.org/I4210095849","https://openalex.org/I65806277"]},{"id":"https://openalex.org/I65806277","display_name":"Universit\u00e9 de Limoges","ror":"https://ror.org/02cp04407","country_code":"FR","type":"education","lineage":["https://openalex.org/I65806277"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Michel Campovecchio","raw_affiliation_strings":["C2S2, CLIM, Limoges, France","C2S2, XLIM, 87060 LIMOGES Cedex, FRANCE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"C2S2, CLIM, Limoges, France","institution_ids":["https://openalex.org/I65806277"]},{"raw_affiliation_string":"C2S2, XLIM, 87060 LIMOGES Cedex, FRANCE","institution_ids":["https://openalex.org/I4210093397","https://openalex.org/I65806277"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4685,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.49813042,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11248","display_name":"Advanced Power Amplifier Design","score":0.5268999934196472,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11248","display_name":"Advanced Power Amplifier Design","score":0.5268999934196472,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.4259999990463257,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.03460000082850456,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"built-in self-test","score":0.949999988079071},{"id":"https://openalex.org/keywords/error-vector-magnitude","display_name":"error vector magnitude","score":0.968999981880188},{"id":"https://openalex.org/keywords/rf-transceiver","display_name":"RF transceiver","score":0.8529999852180481},{"id":"https://openalex.org/keywords/qpsk","display_name":"QPSK","score":0.652999997138977},{"id":"https://openalex.org/keywords/digital-phase-shifter","display_name":"digital phase shifter","score":0.8690000176429749},{"id":"https://openalex.org/keywords/test-time-reduction","display_name":"test time reduction","score":0.7429999709129333}],"concepts":[{"id":"https://openalex.org/C65165936","wikidata":"https://www.wikidata.org/wiki/Q575784","display_name":"Baseband","level":3,"score":0.5659953355789185},{"id":"https://openalex.org/C7720470","wikidata":"https://www.wikidata.org/wiki/Q954187","display_name":"Transceiver","level":3,"score":0.5519893169403076},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5470680594444275},{"id":"https://openalex.org/C186378180","wikidata":"https://www.wikidata.org/wiki/Q4874866","display_name":"Phase-shift keying","level":4,"score":0.5075975656509399},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5043975114822388},{"id":"https://openalex.org/C152622121","wikidata":"https://www.wikidata.org/wiki/Q185796","display_name":"NTSC","level":3,"score":0.4945182502269745},{"id":"https://openalex.org/C2778562939","wikidata":"https://www.wikidata.org/wiki/Q1298791","display_name":"Synchronization (alternating current)","level":3,"score":0.463024765253067},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.43607833981513977},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.4153999388217926},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.4031691253185272},{"id":"https://openalex.org/C56296756","wikidata":"https://www.wikidata.org/wiki/Q840922","display_name":"Bit error rate","level":3,"score":0.3831324577331543},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33777886629104614},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.28143763542175293},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.18818101286888123},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.11947935819625854},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10340762138366699},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/test.2009.5355906","doi":"https://doi.org/10.1109/test.2009.5355906","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2009.5355906","pdf_url":null,"source":{"id":"https://openalex.org/S4210209697","display_name":"IEEE International Test Conference (ITC)","issn_l":"1089-3539","issn":["1089-3539","2378-2250"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 International Test Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-00703365v1","doi":null,"is_oa":false,"landing_page_url":"https://hal.science/hal-00703365","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252976","host_organization_name":"Centre pour la Communication Scientifique Directe","host_organization_lineage":["https://openalex.org/I4405252976"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"40th International Test Conference (ITC 2009), Nov 2009, Austin, United States. pp.35-38, ⟨10.1109/TEST.2009.5355906⟩","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.428600013256073,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2043603254","https://openalex.org/W2539443691","https://openalex.org/W2137634025","https://openalex.org/W1968810857","https://openalex.org/W3110779007","https://openalex.org/W2113451234","https://openalex.org/W2121692978","https://openalex.org/W2013536534","https://openalex.org/W7099861674","https://openalex.org/W3140239071"],"abstract_inverted_index":{"In":[0,94],"wireless":[1,34],"systems,":[2],"the":[3,28,33,44,47,66,98,134,139,157,167],"overall":[4],"quality":[5,31],"of":[6,27,32,65],"transmission":[7],"and":[8,15,54,102,125,137,145,161],"reception":[9],"is":[10,24,37,115,162],"determined":[11],"by":[12,79],"various":[13],"baseband":[14],"RF":[16],"system":[17],"specifications.":[18],"The":[19,63,148],"error":[20],"vector":[21],"magnitude":[22],"(EVM)":[23],"a":[25,51,105,121,126,128],"measure":[26],"digital":[29,122],"modulation":[30],"system-under-test":[35],"which":[36],"very":[38],"sensitive":[39],"to":[40,73,90,96,156],"much":[41],"impairment":[42],"in":[43,61,70,88,117],"transceiver.":[45],"However":[46],"EVM":[48,107,159,169],"test":[49,58,99,113,135,170],"takes":[50,172],"long":[52],"time":[53,101,136],"requires":[55],"expansive":[56],"automatic":[57],"equipment":[59],"(ATE)":[60],"production.":[62],"originality":[64],"proposed":[67,116],"approach":[68],"lies":[69],"its":[71],"ability":[72],"overcome":[74],"two":[75],"limitations":[76],"being":[77],"faced":[78],"available":[80],"techniques":[81],"(correction":[82],"signal,":[83],"reference":[84],"synchronization,":[85],"correlation":[86],"analysis),":[87],"addition":[89],"length":[91,103],"frame":[92],"reduction.":[93],"order":[95],"decrease":[97],"cost,":[100],"sequence,":[104],"new":[106],"measurement":[108],"method":[109,150,160],"using":[110],"built-in":[111],"self":[112],"(BIST)":[114],"this":[118],"paper.":[119],"Using":[120],"phase":[123],"shifter":[124],"multiplier,":[127],"reduced":[129],"QPSK":[130],"data":[131],"sequence":[132],"minimizes":[133],"covers":[138],"faults":[140],"such":[141],"as":[142],"IQ":[143],"impairments":[144],"amplification":[146],"distortions.":[147],"BIST":[149],"demonstrates":[151],"only":[152],"1%":[153],"difference":[154],"compared":[155],"usual":[158],"1000":[163],"times":[164],"faster":[165],"than":[166],"traditional":[168],"(it":[171],"200\u00bfs).":[173]},"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2026-10-26T11:51:55.731654","created_date":"2016-06-24T00:00:00"}