{"id":"https://openalex.org/W1973084971","doi":"https://doi.org/10.1116/1.586167","title":"Defects in strained In0.2Ga0.8As/GaAs multiple quantum wells on patterned and unpatterned substrates: A near-infrared cathodoluminescence study","display_name":"Defects in strained In0.2Ga0.8As/GaAs multiple quantum wells on patterned and unpatterned substrates: A near-infrared cathodoluminescence study","publication_year":1992,"publication_date":"1992-07-01","ids":{"openalex":"https://openalex.org/W1973084971","doi":"https://doi.org/10.1116/1.586167","mag":"1973084971"},"language":"en","primary_location":{"id":"doi:10.1116/1.586167","doi":"https://doi.org/10.1116/1.586167","is_oa":false,"landing_page_url":"https://doi.org/10.1116/1.586167","pdf_url":null,"source":{"id":"https://openalex.org/S4210169477","display_name":"Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena","issn_l":"1071-1023","issn":["1071-1023","1520-8567"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","poland-70"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069015659","display_name":"Daniel H. Rich","orcid":"https://orcid.org/0000-0001-5662-6529","observed_orcids":["https://orcid.org/0000-0001-5662-6529"]},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. H. Rich","raw_affiliation_strings":["Photonic Materials and Devices Laboratory, Department of Materials Science and Engineering, University of Southern California, Los Angeles, California 90089-0241"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Photonic Materials and Devices Laboratory, Department of Materials Science and Engineering, University of Southern California, Los Angeles, California 90089-0241","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029906901","display_name":"K. C. Rajkumar","orcid":"https://orcid.org/0000-0003-1765-6375","observed_orcids":["https://orcid.org/0000-0003-1765-6375"]},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. C. Rajkumar","raw_affiliation_strings":["Photonic Materials and Devices Laboratory, Department of Materials Science and Engineering, University of Southern California, Los Angeles, California 90089-0241"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Photonic Materials and Devices Laboratory, Department of Materials Science and Engineering, University of Southern California, Los Angeles, California 90089-0241","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100379279","display_name":"Li Chen","orcid":"https://orcid.org/0000-0002-8013-5508","observed_orcids":["https://orcid.org/0000-0002-8013-5508","https://orcid.org/0009-0004-1390-5236","https://orcid.org/0009-0004-6389-3392","https://orcid.org/0000-0001-8614-4854"]},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Li Chen","raw_affiliation_strings":["Photonic Materials and Devices Laboratory, Department of Materials Science and Engineering, University of Southern California, Los Angeles, California 90089-0241"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Photonic Materials and Devices Laboratory, Department of Materials Science and Engineering, University of Southern California, Los Angeles, California 90089-0241","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034106172","display_name":"A. Madhukar","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Madhukar","raw_affiliation_strings":["Photonic Materials and Devices Laboratory, Department of Materials Science and Engineering, University of Southern California, Los Angeles, California 90089-0241"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Photonic Materials and Devices Laboratory, Department of Materials Science and Engineering, University of Southern California, Los Angeles, California 90089-0241","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111589952","display_name":"T. George","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I122411786","display_name":"California Institute of Technology","ror":"https://ror.org/05dxps055","country_code":"US","type":"education","lineage":["https://openalex.org/I122411786"]},{"id":"https://openalex.org/I1334627681","display_name":"Jet Propulsion Laboratory","ror":"https://ror.org/027k65916","country_code":"US","type":"facility","lineage":["https://openalex.org/I122411786","https://openalex.org/I1334627681","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T. George","raw_affiliation_strings":["Center for Space Microelectronics Technology, Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California 91109"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Space Microelectronics Technology, Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California 91109","institution_ids":["https://openalex.org/I122411786","https://openalex.org/I1334627681"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091755584","display_name":"Joseph L. Maserjian","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I122411786","display_name":"California Institute of Technology","ror":"https://ror.org/05dxps055","country_code":"US","type":"education","lineage":["https://openalex.org/I122411786"]},{"id":"https://openalex.org/I1334627681","display_name":"Jet Propulsion Laboratory","ror":"https://ror.org/027k65916","country_code":"US","type":"facility","lineage":["https://openalex.org/I122411786","https://openalex.org/I1334627681","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Maserjian","raw_affiliation_strings":["Center for Space Microelectronics Technology, Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California 91109"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Space Microelectronics Technology, Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California 91109","institution_ids":["https://openalex.org/I122411786","https://openalex.org/I1334627681"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062403087","display_name":"F. J. Grunthaner","orcid":"https://orcid.org/0000-0003-2397-6658","observed_orcids":["https://orcid.org/0000-0003-2397-6658"]},"institutions":[{"id":"https://openalex.org/I122411786","display_name":"California Institute of Technology","ror":"https://ror.org/05dxps055","country_code":"US","type":"education","lineage":["https://openalex.org/I122411786"]},{"id":"https://openalex.org/I1334627681","display_name":"Jet Propulsion Laboratory","ror":"https://ror.org/027k65916","country_code":"US","type":"facility","lineage":["https://openalex.org/I122411786","https://openalex.org/I1334627681","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"F. J. Grunthaner","raw_affiliation_strings":["Center for Space Microelectronics Technology, Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California 91109"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Space Microelectronics Technology, Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California 91109","institution_ids":["https://openalex.org/I122411786","https://openalex.org/I1334627681"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078557689","display_name":"Anders G. Larsson","orcid":"https://orcid.org/0000-0002-0912-7695","observed_orcids":["https://orcid.org/0000-0002-0912-7695"]},"institutions":[{"id":"https://openalex.org/I66862912","display_name":"Chalmers University of Technology","ror":"https://ror.org/040wg7k59","country_code":"SE","type":"education","lineage":["https://openalex.org/I66862912"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"A. Larsson","raw_affiliation_strings":["Chalmers University of Technology, Department of Optoelectronics and Electrical Measurements, S-412 96 G\u00f6teborg, Sweden"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chalmers University of Technology, Department of Optoelectronics and Electrical Measurements, S-412 96 G\u00f6teborg, Sweden","institution_ids":["https://openalex.org/I66862912"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.7161,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.61372052,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"10","issue":"4","first_page":"1965","last_page":"1970"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","score":0.9442999958992004,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","score":0.9442999958992004,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12309","display_name":"solar cell performance optimization","score":0.026799999177455902,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.015799999237060547,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ingaas-gaas-multiple-quantum-wells","display_name":"InGaAs/GaAs multiple quantum wells","score":0.9869999885559082},{"id":"https://openalex.org/keywords/strained-quantum-wells","display_name":"strained quantum wells","score":0.6800000071525574},{"id":"https://openalex.org/keywords/dark-line-defects","display_name":"dark line defects","score":0.746999979019165},{"id":"https://openalex.org/keywords/misfit-dislocations","display_name":"misfit dislocations","score":0.8270000219345093},{"id":"https://openalex.org/keywords/nonradiative-recombination-centers","display_name":"nonradiative recombination centers","score":0.8309999704360962},{"id":"https://openalex.org/keywords/defect-induced-luminescence","display_name":"defect-induced luminescence","score":0.8149999976158142},{"id":"https://openalex.org/keywords/exciton-recombination","display_name":"exciton recombination","score":0.7459999918937683},{"id":"https://openalex.org/keywords/patterned-substrates","display_name":"patterned substrates","score":0.753000020980835},{"id":"https://openalex.org/keywords/cathodoluminescence-imaging","display_name":"cathodoluminescence imaging","score":0.7770000100135803},{"id":"https://openalex.org/keywords/dislocation-core-structure","display_name":"dislocation core structure","score":0.46799999475479126}],"concepts":[{"id":"https://openalex.org/C139861200","wikidata":"https://www.wikidata.org/wiki/Q369794","display_name":"Cathodoluminescence","level":3,"score":0.9834042191505432},{"id":"https://openalex.org/C148869448","wikidata":"https://www.wikidata.org/wiki/Q184240","display_name":"Luminescence","level":2,"score":0.8069007992744446},{"id":"https://openalex.org/C17729963","wikidata":"https://www.wikidata.org/wiki/Q858289","display_name":"Exciton","level":2,"score":0.6633001565933228},{"id":"https://openalex.org/C85080765","wikidata":"https://www.wikidata.org/wiki/Q614893","display_name":"Photoluminescence","level":2,"score":0.6218849420547485},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.591928243637085},{"id":"https://openalex.org/C29169072","wikidata":"https://www.wikidata.org/wiki/Q521166","display_name":"Quantum well","level":3,"score":0.5394426584243774},{"id":"https://openalex.org/C159122135","wikidata":"https://www.wikidata.org/wiki/Q737571","display_name":"Dislocation","level":2,"score":0.5293762683868408},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5177459120750427},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.49276140332221985},{"id":"https://openalex.org/C32891209","wikidata":"https://www.wikidata.org/wiki/Q483666","display_name":"Spectroscopy","level":2,"score":0.4560416340827942},{"id":"https://openalex.org/C164675345","wikidata":"https://www.wikidata.org/wiki/Q898226","display_name":"Crystallographic defect","level":2,"score":0.4211881756782532},{"id":"https://openalex.org/C156695909","wikidata":"https://www.wikidata.org/wiki/Q3373825","display_name":"Recombination","level":3,"score":0.4149303436279297},{"id":"https://openalex.org/C41999313","wikidata":"https://www.wikidata.org/wiki/Q489328","display_name":"Molecular physics","level":1,"score":0.33740222454071045},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.32331353425979614},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2609539031982422},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.20922595262527466},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.1744687855243683},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13658449053764343},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.11243230104446411},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.09134560823440552},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1116/1.586167","doi":"https://doi.org/10.1116/1.586167","is_oa":false,"landing_page_url":"https://doi.org/10.1116/1.586167","pdf_url":null,"source":{"id":"https://openalex.org/S4210169477","display_name":"Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena","issn_l":"1071-1023","issn":["1071-1023","1520-8567"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","poland-70"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306101","display_name":"National Aeronautics and Space Administration","ror":"https://ror.org/027ka1x80"},{"id":"https://openalex.org/F4320332180","display_name":"Defense Advanced Research Projects Agency","ror":"https://ror.org/02caytj08"},{"id":"https://openalex.org/F4320338279","display_name":"Air Force Office of Scientific Research","ror":"https://ror.org/011e9bt93"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2021731699","https://openalex.org/W2015049511","https://openalex.org/W2013228562","https://openalex.org/W2094441674","https://openalex.org/W7019867682","https://openalex.org/W1985817700","https://openalex.org/W2080352420","https://openalex.org/W2085030381","https://openalex.org/W2075081619","https://openalex.org/W2022642928"],"abstract_inverted_index":{"The":[0,81,151],"spatial":[1,119,153],"distribution":[2],"of":[3,64,88,155,172,196,209,224],"the":[4,32,36,43,51,62,70,89,106,124,131,148,156,161,170,178,183,192,206,213],"long-wavelength":[5],"luminescence":[6,33,48,135,157,222],"in":[7,68,98,130,164,177,221],"thick":[8],"In0.2Ga0.8As/GaAs":[9],"multiple":[10],"quantum":[11],"wells":[12],"(MQWs)":[13],"grown":[14],"on":[15,77,103],"patterned":[16,78],"and":[17,27,72,194,198],"unpatterned":[18,104],"substrates":[19],"has":[20],"been":[21],"investigated":[22],"using":[23],"cathodoluminescence":[24],"(CL)":[25],"imaging":[26,223],"spectroscopy.":[28],"By":[29],"spatially":[30],"correlating":[31],"arising":[34,49],"from":[35,50,200],"MQW":[37,179],"exciton":[38,134],"recombination":[39,174],"(\u03bb\u224a950":[40],"nm)":[41,47],"with":[42,123],"longer":[44],"wavelength":[45],"(1000\u2272\u03bb\u22721200":[46],"defect-induced":[52,110],"recombination,":[53],"we":[54],"demonstrate":[55],"that":[56,141,160],"it":[57],"is":[58],"possible":[59],"to":[60,92],"determine":[61],"regions":[63,74,91],"highest":[65],"film":[66],"quality":[67],"both":[69],"mesa":[71],"valley":[73],"for":[75,95,216],"growth":[76,102],"GaAs":[79],"substrates.":[80],"present":[82],"approach":[83],"enables":[84],"a":[85],"judicious":[86],"determination":[87],"optimal":[90],"be":[93],"used":[94],"active":[96],"pixels":[97],"InGaAs/GaAs":[99],"devices.":[100],"For":[101],"substrates,":[105],"CL":[107,165],"spectra":[108],"show":[109],"broad":[111],"bands":[112,117],"between":[113],"1000\u2272\u03bb\u22721600":[114],"nm.":[115],"These":[116],"exhibit":[118],"variations":[120],"which":[121,203],"correlate":[122],"dark":[125],"line":[126],"defects":[127],"(DLDs)":[128],"observed":[129,163],"\u03bb=950":[132],"nm":[133],"imaging.":[136],"Transmission":[137],"electron":[138],"microscopy":[139],"showed":[140],"[110]-oriented":[142],"misfit":[143],"dislocations":[144],"occur":[145],"primarily":[146],"at":[147],"substrate-to-MQW":[149],"interface.":[150],"large":[152],"variation":[154],"intensities":[158],"indicates":[159],"DLDs":[162,197],"images":[166],"are":[167],"caused":[168],"by":[169],"presence":[171],"nonradiative":[173],"centers":[175],"occurring":[176],"region":[180],"located":[181],"above":[182],"interface":[184],"dislocations.":[185],"This":[186],"study":[187],"provides":[188],"new":[189],"information":[190],"describing":[191],"origin":[193],"nature":[195,208],"differs":[199],"previous":[201],"models,":[202],"have":[204],"regarded":[205],"electronic":[207],"dislocation":[210],"cores":[211],"as":[212],"primary":[214],"mechanism":[215],"inducing":[217],"DLD":[218],"radiative":[219],"contrast":[220],"strained":[225],"InGaAs/GaAs.":[226]},"counts_by_year":[],"updated_date":"2026-10-13T10:08:12.033832","created_date":"2016-06-24T00:00:00"}