{"id":"https://openalex.org/W1971504151","doi":"https://doi.org/10.1049/el:19900869","title":"Cellular automata-based built-in self-test structures for VLSI systems","display_name":"Cellular automata-based built-in self-test structures for VLSI systems","publication_year":1990,"publication_date":"1990-08-16","ids":{"openalex":"https://openalex.org/W1971504151","doi":"https://doi.org/10.1049/el:19900869","mag":"1971504151"},"language":"en","primary_location":{"id":"doi:10.1049/el:19900869","doi":"https://doi.org/10.1049/el:19900869","is_oa":false,"landing_page_url":"https://doi.org/10.1049/el:19900869","pdf_url":null,"source":{"id":"https://openalex.org/S149016011","display_name":"Electronics Letters","issn_l":"0013-5194","issn":["0013-5194","1350-911X"],"is_oa":false,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-d","jufo-1","norway-1","oarl","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronics Letters","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref","doaj"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113677967","display_name":"Ph. Tsalides","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I147962203","display_name":"Democritus University of Thrace","ror":"https://ror.org/03bfqnx40","country_code":"GR","type":"education","lineage":["https://openalex.org/I147962203"]}],"countries":["GR"],"is_corresponding":true,"raw_author_name":"Ph. Tsalides","raw_affiliation_strings":["Department of Electrical Engineering, Democritus University of Thrace, Xanthi, W67100, Greece","Dept. of Electr. Eng., Democritus Univ. of Thrace, Xanthi, Greece"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Democritus University of Thrace, Xanthi, W67100, Greece","institution_ids":["https://openalex.org/I147962203"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Democritus Univ. of Thrace, Xanthi, Greece","institution_ids":["https://openalex.org/I147962203"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5113677967"],"corresponding_institution_ids":["https://openalex.org/I147962203"],"apc_list":{"value":2590,"currency":"USD","value_usd":2590},"apc_paid":null,"fwci":0.3877,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.59673025,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"26","issue":"17","first_page":"1350","last_page":"1352"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.5859000086784363,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.5859000086784363,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12162","display_name":"Cellular Automata and Applications","score":0.4018999934196472,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.0010000000474974513,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cellular-automata","display_name":"cellular automata","score":0.9269999861717224},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"built-in self-test","score":0.9350000023841858},{"id":"https://openalex.org/keywords/linear-feedback-shift-registers","display_name":"linear feedback shift registers","score":0.8199999928474426},{"id":"https://openalex.org/keywords/vlsi-testing","display_name":"VLSI testing","score":0.847000002861023},{"id":"https://openalex.org/keywords/locality","display_name":"locality","score":0.5889999866485596}],"concepts":[{"id":"https://openalex.org/C35527583","wikidata":"https://www.wikidata.org/wiki/Q189156","display_name":"Cellular automaton","level":2,"score":0.5807995200157166},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.568259060382843},{"id":"https://openalex.org/C112505250","wikidata":"https://www.wikidata.org/wiki/Q787116","display_name":"Automaton","level":2,"score":0.4809938371181488},{"id":"https://openalex.org/C2779808786","wikidata":"https://www.wikidata.org/wiki/Q6664603","display_name":"Locality","level":2,"score":0.45883908867836},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45743826031684875},{"id":"https://openalex.org/C2780586882","wikidata":"https://www.wikidata.org/wiki/Q7520643","display_name":"Simple (philosophy)","level":2,"score":0.455394446849823},{"id":"https://openalex.org/C45357846","wikidata":"https://www.wikidata.org/wiki/Q2001982","display_name":"Notation","level":2,"score":0.426291286945343},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.4112764298915863},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.3435385227203369},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.29999205470085144},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.2946007251739502},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.1672813892364502},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1049/el:19900869","doi":"https://doi.org/10.1049/el:19900869","is_oa":false,"landing_page_url":"https://doi.org/10.1049/el:19900869","pdf_url":null,"source":{"id":"https://openalex.org/S149016011","display_name":"Electronics Letters","issn_l":"0013-5194","issn":["0013-5194","1350-911X"],"is_oa":false,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-d","jufo-1","norway-1","oarl","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronics Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W590338321","https://openalex.org/W1515082873","https://openalex.org/W1979092306","https://openalex.org/W2007024413","https://openalex.org/W2036424138","https://openalex.org/W2097890209","https://openalex.org/W2109678242","https://openalex.org/W2726276257"],"related_works":["https://openalex.org/W2351572435","https://openalex.org/W2097890209","https://openalex.org/W7097269162","https://openalex.org/W1969855747","https://openalex.org/W7095187581","https://openalex.org/W2020092809","https://openalex.org/W2168023632","https://openalex.org/W2128612604","https://openalex.org/W2944267045","https://openalex.org/W7101095814"],"abstract_inverted_index":{"Some":[0],"of":[1,6,33,48],"the":[2,61],"fundamental":[3],"algebraic":[4],"properties":[5],"hybrid":[7],"additive,":[8],"null-bounded,":[9],"cellular":[10],"automata":[11],"(HACA)":[12],"are":[13],"presented.":[14],"Simple":[15],"HACA":[16,35,49,64],"have":[17],"been":[18],"obtained":[19],"by":[20],"spatially":[21],"alternating":[22],"additive":[23],"rules":[24],"90":[25],"and":[26,67],"150":[27],"(in":[28],"Wolfram's":[29],"notation).":[30],"The":[31,45],"use":[32],"such":[34],"for":[36,72],"on-chip":[37],"pseudorandom":[38],"test":[39],"pattern":[40],"generation":[41],"is":[42,60],"also":[43],"described.":[44],"great":[46],"advantage":[47],"over":[50],"linear":[51],"feedback":[52],"shift":[53],"registers":[54],"(LFSR),":[55],"as":[56],"their":[57],"size":[58],"increases,":[59],"fact":[62],"that":[63],"display":[65],"locality":[66],"topological":[68],"regularity,":[69],"important":[70],"attributes":[71],"VLSI":[73],"implementation.":[74]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2016-06-24T00:00:00"}