{"id":"https://openalex.org/W1968256276","doi":"https://doi.org/10.1117/12.454637","title":"IR in Norway","display_name":"IR in Norway","publication_year":2003,"publication_date":"2003-01-01","ids":{"openalex":"https://openalex.org/W1968256276","doi":"https://doi.org/10.1117/12.454637","mag":"1968256276"},"language":"en","primary_location":{"id":"doi:10.1117/12.454637","doi":"https://doi.org/10.1117/12.454637","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.454637","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014763177","display_name":"Randi Haakenaasen","orcid":"https://orcid.org/0000-0003-0973-2913","observed_orcids":["https://orcid.org/0000-0003-0973-2913"]},"institutions":[{"id":"https://openalex.org/I163244428","display_name":"Norwegian Defence Research Establishment","ror":"https://ror.org/0098gnz32","country_code":"NO","type":"facility","lineage":["https://openalex.org/I163244428"]}],"countries":["NO"],"is_corresponding":false,"raw_author_name":"Randi Haakenaasen","raw_affiliation_strings":["Norwegian Defense Research Establishment (Norway)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Norwegian Defense Research Establishment (Norway)","institution_ids":["https://openalex.org/I163244428"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111525512","display_name":"S. L\u00f8vold","orcid":"https://orcid.org/0009-0004-3316-9213","observed_orcids":["https://orcid.org/0009-0004-3316-9213"]},"institutions":[{"id":"https://openalex.org/I163244428","display_name":"Norwegian Defence Research Establishment","ror":"https://ror.org/0098gnz32","country_code":"NO","type":"facility","lineage":["https://openalex.org/I163244428"]}],"countries":["NO"],"is_corresponding":false,"raw_author_name":"Stian Lovold","raw_affiliation_strings":["Norwegian Defense Research Establishment (Norway)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Norwegian Defense Research Establishment (Norway)","institution_ids":["https://openalex.org/I163244428"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I163244428"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"4820","issue":null,"first_page":"99","last_page":"99"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.9771000146865845,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.9771000146865845,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.011800000444054604,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14158","display_name":"Optical Systems and Laser Technology","score":0.006200000178068876,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/infrared-technology","display_name":"infrared technology","score":0.8429999947547913},{"id":"https://openalex.org/keywords/infrared-detectors","display_name":"infrared detectors","score":0.8629999756813049},{"id":"https://openalex.org/keywords/molecular-beam-epitaxy","display_name":"molecular beam epitaxy","score":0.9629999995231628},{"id":"https://openalex.org/keywords/tunable-infrared-laser","display_name":"tunable infrared laser","score":0.8730000257492065},{"id":"https://openalex.org/keywords/laser-rangefinder","display_name":"laser rangefinder","score":0.9200000166893005},{"id":"https://openalex.org/keywords/infrared-gas-sensor","display_name":"infrared gas sensor","score":0.9990000128746033},{"id":"https://openalex.org/keywords/hyperspectral-camera","display_name":"hyperspectral camera","score":0.9860000014305115},{"id":"https://openalex.org/keywords/optical-coatings","display_name":"optical coatings","score":0.722000002861023},{"id":"https://openalex.org/keywords/dewar-design","display_name":"dewar design","score":0.9430000185966492},{"id":"https://openalex.org/keywords/infrared-scene-simulation","display_name":"infrared scene simulation","score":0.6800000071525574},{"id":"https://openalex.org/keywords/image-analysis","display_name":"image analysis","score":0.7360000014305115}],"concepts":[{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.6519055962562561},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.5986795425415039},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.45142120122909546},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.44615206122398376},{"id":"https://openalex.org/C63428231","wikidata":"https://www.wikidata.org/wiki/Q9043","display_name":"Norwegian","level":2,"score":0.4355059564113617},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3870494067668915},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.38590407371520996},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.3851257562637329},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.36179009079933167},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.34050941467285156},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.33500808477401733},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.20721766352653503},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20256391167640686},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18923908472061157},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.454637","doi":"https://doi.org/10.1117/12.454637","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.454637","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2060128962","https://openalex.org/W1988568734","https://openalex.org/W2095103854","https://openalex.org/W2138190008","https://openalex.org/W1623702590","https://openalex.org/W2094698040","https://openalex.org/W2068086689","https://openalex.org/W1982866281","https://openalex.org/W1964755853","https://openalex.org/W3134689505"],"abstract_inverted_index":{"Infrared":[0],"technology":[1],"in":[2,12,39,68,74,101],"Norway":[3],"started":[4],"at":[5],"the":[6,13,58],"Norwegian":[7,112],"Defense":[8],"Research":[9],"Establishment":[10],"(FFI)":[11],"1960s,":[14],"and":[15,25,37,53,71,86,103,130,138],"has":[16,28,96],"since":[17],"then":[18],"spread":[19],"to":[20],"universities,":[21],"other":[22],"research":[23,36,67,102],"institutes":[24],"industry.":[26],"FFI":[27,94],"a":[29,62,97],"large,":[30],"integrated":[31,59],"IR":[32,40,51,89],"activity":[33,60],"that":[34],"includes":[35],"development":[38,104],"detectors,":[41],"optics":[42],"design,":[43,48],"optical":[44],"coatings,":[45],"advanced":[46],"dewar":[47],"modelling/simulation":[49],"of":[50,57,78,99,105,117],"scenes,":[52],"image":[54],"analysis.":[55],"Part":[56],"is":[61],"laboratory":[63],"for":[64,109,134],"more":[65],"basic":[66],"materials":[69],"science":[70],"semiconductor":[72],"physics,":[73],"which":[75],"thin":[76],"films":[77],"CdHgTe":[79],"are":[80],"grown":[81],"by":[82,91],"molecular":[83],"beam":[84],"epitaxy":[85],"processed":[87],"into":[88],"detectors":[90],"various":[92,110,124],"techniques.":[93],"also":[95],"lot":[98],"experience":[100],"tunable":[106],"infrared":[107,118,125],"lasers":[108],"applications.":[111],"industrial":[113],"activities":[114],"include":[115],"production":[116],"homing":[119],"anti-ship":[120],"missiles,":[121],"laser":[122],"rangefinders,":[123],"gas":[126],"sensors,":[127],"hyperspectral":[128],"cameras,":[129],"fiberoptic":[131],"sensor":[132],"systems":[133],"structural":[135],"health":[136],"monitoring":[137],"offshore":[139],"oil":[140],"well":[141],"diagnostics.":[142]},"counts_by_year":[],"updated_date":"2026-11-09T13:22:03.289127","created_date":"2016-06-24T00:00:00"}