{"id":"https://openalex.org/W1968236582","doi":"https://doi.org/10.1117/12.462804","title":"Influence of process variation on the functionality of a high-pressure sensor","display_name":"Influence of process variation on the functionality of a high-pressure sensor","publication_year":2002,"publication_date":"2002-04-19","ids":{"openalex":"https://openalex.org/W1968236582","doi":"https://doi.org/10.1117/12.462804","mag":"1968236582"},"language":"en","primary_location":{"id":"doi:10.1117/12.462804","doi":"https://doi.org/10.1117/12.462804","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.462804","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113523883","display_name":"Joerg Muchow","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I889804353","display_name":"Robert Bosch (Germany)","ror":"https://ror.org/01fe0jt45","country_code":"DE","type":"company","lineage":["https://openalex.org/I889804353"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Joerg Muchow","raw_affiliation_strings":["Robert Bosch GmbH (Germany)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Robert Bosch GmbH (Germany)","institution_ids":["https://openalex.org/I889804353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084449585","display_name":"Andre Kretschmann","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I889804353","display_name":"Robert Bosch (Germany)","ror":"https://ror.org/01fe0jt45","country_code":"DE","type":"company","lineage":["https://openalex.org/I889804353"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Andre Kretschmann","raw_affiliation_strings":["Robert Bosch GmbH (Germany)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Robert Bosch GmbH (Germany)","institution_ids":["https://openalex.org/I889804353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063566135","display_name":"Ralf Henn","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I889804353","display_name":"Robert Bosch (Germany)","ror":"https://ror.org/01fe0jt45","country_code":"DE","type":"company","lineage":["https://openalex.org/I889804353"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Ralf Henn","raw_affiliation_strings":["Robert Bosch GmbH (Germany)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Robert Bosch GmbH (Germany)","institution_ids":["https://openalex.org/I889804353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037705073","display_name":"Klaus Skrobanek","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I889804353","display_name":"Robert Bosch (Germany)","ror":"https://ror.org/01fe0jt45","country_code":"DE","type":"company","lineage":["https://openalex.org/I889804353"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Klaus Skrobanek","raw_affiliation_strings":["Robert Bosch GmbH (Germany)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Robert Bosch GmbH (Germany)","institution_ids":["https://openalex.org/I889804353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057532881","display_name":"Stefan Finkbeiner","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I889804353","display_name":"Robert Bosch (Germany)","ror":"https://ror.org/01fe0jt45","country_code":"DE","type":"company","lineage":["https://openalex.org/I889804353"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Stefan Finkbeiner","raw_affiliation_strings":["Robert Bosch GmbH (Germany)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Robert Bosch GmbH (Germany)","institution_ids":["https://openalex.org/I889804353"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005776549","display_name":"Hans-Reiner Krau\u00df","orcid":"https://orcid.org/0000-0002-2279-6551","observed_orcids":["https://orcid.org/0000-0002-2279-6551"]},"institutions":[{"id":"https://openalex.org/I889804353","display_name":"Robert Bosch (Germany)","ror":"https://ror.org/01fe0jt45","country_code":"DE","type":"company","lineage":["https://openalex.org/I889804353"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hans R. Krauss","raw_affiliation_strings":["Robert Bosch GmbH (Germany)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Robert Bosch GmbH (Germany)","institution_ids":["https://openalex.org/I889804353"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I889804353"],"apc_list":null,"apc_paid":null,"fwci":1.8772,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.84903605,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"4755","issue":null,"first_page":"143","last_page":"148"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.2741999924182892,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.2741999924182892,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.12229999899864197,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.08649999648332596,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/process-variation","display_name":"process variation","score":0.9929999709129333},{"id":"https://openalex.org/keywords/high-pressure-sensors","display_name":"high-pressure sensors","score":0.9039999842643738},{"id":"https://openalex.org/keywords/sensor-design","display_name":"sensor design","score":0.5709999799728394},{"id":"https://openalex.org/keywords/yield-prediction","display_name":"yield prediction","score":0.9340000152587891},{"id":"https://openalex.org/keywords/process-parameters","display_name":"process parameters","score":0.7059999704360962},{"id":"https://openalex.org/keywords/sensor-modeling","display_name":"sensor modeling","score":0.734000027179718},{"id":"https://openalex.org/keywords/reliability","display_name":"reliability","score":0.5239999890327454},{"id":"https://openalex.org/keywords/cost","display_name":"cost","score":0.39800000190734863}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7197796702384949},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.713348925113678},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.7009913921356201},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6278005838394165},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.5761333107948303},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5678184032440186},{"id":"https://openalex.org/C41325743","wikidata":"https://www.wikidata.org/wiki/Q1261040","display_name":"Pressure sensor","level":2,"score":0.5425750017166138},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.527513325214386},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.526370108127594},{"id":"https://openalex.org/C2778334786","wikidata":"https://www.wikidata.org/wiki/Q1586270","display_name":"Variation (astronomy)","level":2,"score":0.45166826248168945},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.35716432332992554},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28938934206962585},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13110369443893433},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.09275564551353455},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.08915039896965027},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.07378610968589783},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C44870925","wikidata":"https://www.wikidata.org/wiki/Q37547","display_name":"Astrophysics","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.462804","doi":"https://doi.org/10.1117/12.462804","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.462804","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2519052924","https://openalex.org/W1997146247","https://openalex.org/W2367091550","https://openalex.org/W2090214886","https://openalex.org/W2952902008","https://openalex.org/W2160741644","https://openalex.org/W2089637571","https://openalex.org/W7221043873","https://openalex.org/W4231940510","https://openalex.org/W2135819990"],"abstract_inverted_index":{"A":[0],"sensor":[1,63],"designer":[2],"has":[3],"to":[4,43,70,74],"keep":[5],"in":[6],"mind":[7],"a":[8,13,29,47,62,84],"couple":[9],"of":[10,31,83],"things":[11],"developing":[12],"new":[14,48],"product.":[15],"These":[16],"are":[17],"performance,":[18],"reliability":[19],"and":[20],"last":[21],"but":[22],"not":[23],"least":[24],"cost.":[25],"Cost":[26],"is":[27,40],"mainly":[28],"function":[30],"yield.":[32],"To":[33],"be":[34,57,78],"successful":[35],"on":[36,51,65],"the":[37,71,81],"market,":[38],"it":[39],"therefore":[41],"necessary":[42],"predict":[44],"yield":[45],"for":[46,80],"design,":[49],"based":[50,64],"its":[52],"process":[53,66],"steps.":[54],"This":[55],"can":[56],"done":[58],"only":[59],"by":[60],"modeling":[61],"parameters":[67],"as":[68],"input":[69],"models.":[72],"How":[73],"realize":[75],"this,":[76],"will":[77],"shown":[79],"design":[82],"high":[85],"pressure":[86],"sensor.":[87]},"counts_by_year":[],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}
