{"id":"https://openalex.org/W1966523232","doi":"https://doi.org/10.1155/apec.5.91","title":"Nonlinearity Measurements Using Alternating Current","display_name":"Nonlinearity Measurements Using Alternating Current","publication_year":1978,"publication_date":"1978-01-01","ids":{"openalex":"https://openalex.org/W1966523232","doi":"https://doi.org/10.1155/apec.5.91","mag":"1966523232"},"language":"en","primary_location":{"id":"doi:10.1155/apec.5.91","doi":"https://doi.org/10.1155/apec.5.91","is_oa":true,"landing_page_url":"https://doi.org/10.1155/apec.5.91","pdf_url":"https://downloads.hindawi.com/journals/apec/1978/473873.pdf","source":{"id":"https://openalex.org/S67485347","display_name":"Active and Passive Electronic Components","issn_l":"0882-7516","issn":["0882-7516","1026-7034","1563-5031"],"is_oa":false,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-c","jufo-1","norway-1","poland-40","russia-white-list-3"],"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869","https://openalex.org/P4310320595"],"host_organization_lineage_names":["Hindawi Publishing Corporation","Wiley"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Active and Passive Electronic Components","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://downloads.hindawi.com/journals/apec/1978/473873.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000321002","display_name":"V. Ry\u0161\u00e1nek","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I44504214","display_name":"Czech Technical University in Prague","ror":"https://ror.org/03kqpb082","country_code":"CZ","type":"education","lineage":["https://openalex.org/I44504214"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"Vladim\u00edr Ry\u0161\u00e1nek","raw_affiliation_strings":["Czech Technical University Dept. of Electrical Engineering Suchbaterova 2 Prague 6, Czech Republic, cvut.cz","Czech Technical University, Dept. of Electrical Engineering, Suchbaterova 2"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Czech Technical University Dept. of Electrical Engineering Suchbaterova 2 Prague 6, Czech Republic, cvut.cz","institution_ids":["https://openalex.org/I44504214"]},{"raw_affiliation_string":"Czech Technical University, Dept. of Electrical Engineering, Suchbaterova 2","institution_ids":["https://openalex.org/I44504214"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103429094","display_name":"Carlo Corsi","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Carlo Corsi","raw_affiliation_strings":["Elettronica lnd. via Tiburtina Roma 00156, Italy","Elettronica lnd., via Tiburtina"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Elettronica lnd. via Tiburtina Roma 00156, Italy","institution_ids":[]},{"raw_affiliation_string":"Elettronica lnd., via Tiburtina","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103340456","display_name":"Arnaldo D\u2019Amico","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210155236","display_name":"National Research Council","ror":"https://ror.org/04zaypm56","country_code":"IT","type":"nonprofit","lineage":["https://openalex.org/I4210155236"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Arnaldo d\u2032Amico","raw_affiliation_strings":["Laboratorio di Elettronica dello Stato Solido del C.N.R. via Cineto Romano 42 Roma 00156, Italy","Laboratorio di Elettronica dello Stato Solido del C.N.R., via Cineto Romano 42"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratorio di Elettronica dello Stato Solido del C.N.R. via Cineto Romano 42 Roma 00156, Italy","institution_ids":[]},{"raw_affiliation_string":"Laboratorio di Elettronica dello Stato Solido del C.N.R., via Cineto Romano 42","institution_ids":["https://openalex.org/I4210155236"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1000,"currency":"USD","value_usd":1000},"apc_paid":{"value":1000,"currency":"USD","value_usd":1000},"fwci":1.284,"has_fulltext":true,"cited_by_count":13,"citation_normalized_percentile":{"value":0.77239848,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":95},"biblio":{"volume":"5","issue":"2","first_page":"91","last_page":"98"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.7250999808311462,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.7250999808311462,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.07349999994039536,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.03550000116229057,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nonlinearity-measurement","display_name":"nonlinearity measurement","score":0.9860000014305115},{"id":"https://openalex.org/keywords/alternating-current","display_name":"alternating current","score":0.6370000243186951},{"id":"https://openalex.org/keywords/lock-in-amplifier","display_name":"lock-in amplifier","score":0.9549999833106995},{"id":"https://openalex.org/keywords/1-f-noise","display_name":"1/f noise","score":0.8960000276565552},{"id":"https://openalex.org/keywords/resistors","display_name":"resistors","score":0.753000020980835},{"id":"https://openalex.org/keywords/semiconductor-devices","display_name":"semiconductor devices","score":0.765999972820282},{"id":"https://openalex.org/keywords/conductors","display_name":"conductors","score":0.7760000228881836},{"id":"https://openalex.org/keywords/wide-frequency-range","display_name":"wide frequency range","score":0.5559999942779541}],"concepts":[{"id":"https://openalex.org/C2779876028","wikidata":"https://www.wikidata.org/wiki/Q124164","display_name":"Alternating current","level":3,"score":0.8855089545249939},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.6295953989028931},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.5799919962882996},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4171919524669647},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.33282649517059326},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3016592860221863},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.163213849067688},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.13404017686843872},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.1324814260005951},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1155/apec.5.91","doi":"https://doi.org/10.1155/apec.5.91","is_oa":true,"landing_page_url":"https://doi.org/10.1155/apec.5.91","pdf_url":"https://downloads.hindawi.com/journals/apec/1978/473873.pdf","source":{"id":"https://openalex.org/S67485347","display_name":"Active and Passive Electronic Components","issn_l":"0882-7516","issn":["0882-7516","1026-7034","1563-5031"],"is_oa":false,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-c","jufo-1","norway-1","poland-40","russia-white-list-3"],"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869","https://openalex.org/P4310320595"],"host_organization_lineage_names":["Hindawi Publishing Corporation","Wiley"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Active and Passive Electronic Components","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:a8ee44c054a9434e8107d73e43b11185","doi":null,"is_oa":true,"landing_page_url":"https://doaj.org/article/a8ee44c054a9434e8107d73e43b11185","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Active and Passive Electronic Components, Vol 5, Iss 2, Pp 91-98 (1978)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1155/apec.5.91","doi":"https://doi.org/10.1155/apec.5.91","is_oa":true,"landing_page_url":"https://doi.org/10.1155/apec.5.91","pdf_url":"https://downloads.hindawi.com/journals/apec/1978/473873.pdf","source":{"id":"https://openalex.org/S67485347","display_name":"Active and Passive Electronic Components","issn_l":"0882-7516","issn":["0882-7516","1026-7034","1563-5031"],"is_oa":false,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-c","jufo-1","norway-1","poland-40","russia-white-list-3"],"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869","https://openalex.org/P4310320595"],"host_organization_lineage_names":["Hindawi Publishing Corporation","Wiley"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Active and Passive Electronic Components","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W1966523232.pdf","grobid_xml":"https://content.openalex.org/works/W1966523232.grobid-xml"},"referenced_works_count":1,"referenced_works":["https://openalex.org/W1990678223"],"related_works":["https://openalex.org/W3156577363","https://openalex.org/W1973059012","https://openalex.org/W2030916530","https://openalex.org/W2079180424","https://openalex.org/W2521948867","https://openalex.org/W1984427688","https://openalex.org/W2035339869","https://openalex.org/W2032708208","https://openalex.org/W123144990","https://openalex.org/W169989747"],"abstract_inverted_index":{"The":[0],"nonlinearity":[1],"measurement":[2,31],"technique":[3,11],"described":[4],"uses":[5,45],"an":[6],"adapted":[7],"conventional":[8],"lock\u2010in\u2010amplifier.":[9],"This":[10],"enables":[12],"us":[13],"to":[14,33],"measure":[15],"small":[16],"nonlinearities":[17],"over":[18],"a":[19],"wide":[20],"frequency":[21],"band":[22],"and":[23,40,56],"is":[24],"more":[25],"sensitive":[26],"than":[27],"the":[28],"1/f":[29],"noise":[30],"used":[32],"detect":[34],"non\u2010homogeneous":[35],"structures":[36],"in":[37],"conductors,":[38],"resistors":[39],"semiconductor":[41,57],"components.":[42],"Results":[43],"illustrating":[44],"of":[46,54],"this":[47],"method":[48],"are":[49],"presented":[50],"for":[51],"different":[52],"types":[53],"resistor":[55],"structures.":[58]},"counts_by_year":[{"year":2020,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-10-02T10:15:12.560889","created_date":"2016-06-24T00:00:00"}