{"id":"https://openalex.org/W1965458161","doi":"https://doi.org/10.1109/pvsc.2014.6925020","title":"Experimental study on the role of parameters affecting surface recombination and emitter passivation","display_name":"Experimental study on the role of parameters affecting surface recombination and emitter passivation","publication_year":2014,"publication_date":"2014-06-01","ids":{"openalex":"https://openalex.org/W1965458161","doi":"https://doi.org/10.1109/pvsc.2014.6925020","mag":"1965458161"},"language":"en","primary_location":{"id":"doi:10.1109/pvsc.2014.6925020","doi":"https://doi.org/10.1109/pvsc.2014.6925020","is_oa":false,"landing_page_url":"https://doi.org/10.1109/pvsc.2014.6925020","pdf_url":null,"source":{"id":"https://openalex.org/S4210168774","display_name":"Conference record of the IEEE Photovoltaic Specialists Conference","issn_l":"0160-8371","issn":["0160-8371"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040395598","display_name":"Marshall Wilson","orcid":"https://orcid.org/0000-0002-2261-8499","observed_orcids":["https://orcid.org/0000-0002-2261-8499"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Marshall Wilson","raw_affiliation_strings":["Semilab SDI LLC, Tampa, FL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semilab SDI LLC, Tampa, FL, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038732365","display_name":"Andrew David Findlay","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Andrew Findlay","raw_affiliation_strings":["Semilab SDI LLC, Tampa, FL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semilab SDI LLC, Tampa, FL, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081979530","display_name":"John D\u2019Amico","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"John D'Amico","raw_affiliation_strings":["Semilab SDI LLC, Tampa, FL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semilab SDI LLC, Tampa, FL, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114012539","display_name":"Alexandre Savtchouk","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Alexandre Savtchouk","raw_affiliation_strings":["Semilab SDI LLC, Tampa, FL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semilab SDI LLC, Tampa, FL, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109200186","display_name":"Jacek J. Lagowski","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jacek Lagowski","raw_affiliation_strings":["Semilab SDI LLC, Tampa, FL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semilab SDI LLC, Tampa, FL, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043044174","display_name":"Zhan Xu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210100528","display_name":"ENN (China)","ror":"https://ror.org/018a8yy17","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210100528"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhan Xu","raw_affiliation_strings":["ENN Solar Energy, Langfang, P.R. China","ENN Solar Energy, Langfang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ENN Solar Energy, Langfang, P.R. China","institution_ids":["https://openalex.org/I4210100528"]},{"raw_affiliation_string":"ENN Solar Energy, Langfang, China","institution_ids":["https://openalex.org/I4210100528"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Rong Yang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210100528","display_name":"ENN (China)","ror":"https://ror.org/018a8yy17","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210100528"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rong Yang","raw_affiliation_strings":["ENN Solar Energy, Langfang, P.R. China","ENN Solar Energy, Langfang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ENN Solar Energy, Langfang, P.R. China","institution_ids":["https://openalex.org/I4210100528"]},{"raw_affiliation_string":"ENN Solar Energy, Langfang, China","institution_ids":["https://openalex.org/I4210100528"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111604417","display_name":"Ted Guo","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210100528","display_name":"ENN (China)","ror":"https://ror.org/018a8yy17","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210100528"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ted Guo","raw_affiliation_strings":["ENN Solar Energy, Langfang, P.R. China","ENN Solar Energy, Langfang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ENN Solar Energy, Langfang, P.R. China","institution_ids":["https://openalex.org/I4210100528"]},{"raw_affiliation_string":"ENN Solar Energy, Langfang, China","institution_ids":["https://openalex.org/I4210100528"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8029,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.61078145,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"0713","last_page":"0718"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/surface-recombination","display_name":"surface recombination","score":0.9729999899864197},{"id":"https://openalex.org/keywords/emitter-passivation","display_name":"emitter passivation","score":0.9890000224113464},{"id":"https://openalex.org/keywords/silicon-solar-cells","display_name":"silicon solar cells","score":0.8220000267028809},{"id":"https://openalex.org/keywords/interface-trap-density","display_name":"interface trap density","score":0.8659999966621399},{"id":"https://openalex.org/keywords/al2o3-passivation","display_name":"Al2O3 passivation","score":0.8140000104904175},{"id":"https://openalex.org/keywords/field-effect-passivation","display_name":"field-effect passivation","score":0.8709999918937683},{"id":"https://openalex.org/keywords/wafer-mapping","display_name":"wafer mapping","score":0.7250000238418579}],"concepts":[{"id":"https://openalex.org/C33574316","wikidata":"https://www.wikidata.org/wiki/Q917260","display_name":"Passivation","level":3,"score":0.8369742631912231},{"id":"https://openalex.org/C46918542","wikidata":"https://www.wikidata.org/wiki/Q1648344","display_name":"Common emitter","level":2,"score":0.5206129550933838},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.4690917730331421},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.4226093590259552},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3920706510543823},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.35337328910827637},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.34898847341537476},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.327748566865921},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29727309942245483},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.26863837242126465},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15119147300720215},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/pvsc.2014.6925020","doi":"https://doi.org/10.1109/pvsc.2014.6925020","is_oa":false,"landing_page_url":"https://doi.org/10.1109/pvsc.2014.6925020","pdf_url":null,"source":{"id":"https://openalex.org/S4210168774","display_name":"Conference record of the IEEE Photovoltaic Specialists Conference","issn_l":"0160-8371","issn":["0160-8371"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W74408125","https://openalex.org/W2015348449","https://openalex.org/W2040357196","https://openalex.org/W2042271251","https://openalex.org/W2061978769","https://openalex.org/W2086103622","https://openalex.org/W2089855674"],"related_works":["https://openalex.org/W1990673374","https://openalex.org/W3207609991","https://openalex.org/W2131644118","https://openalex.org/W1510050845","https://openalex.org/W2894772455","https://openalex.org/W2464900808","https://openalex.org/W2168354700","https://openalex.org/W2160724514","https://openalex.org/W2624403724","https://openalex.org/W2074605743"],"abstract_inverted_index":{"A":[0],"multifunction":[1],"metrology":[2],"platform":[3],"for":[4,35,59,64],"silicon":[5,90],"photovoltaics":[6],"introduced":[7],"about":[8],"3":[9],"years":[10],"ago":[11],"has":[12],"helped":[13],"generate":[14],"experimental":[15],"data":[16,56,71],"demonstrating":[17],"the":[18,26,86,89,103,107,114,117,157],"importance":[19],"of":[20,32,49,68,88,109,116,137],"different":[21],"electrical":[22,51],"parameters":[23],"that":[24,76],"affect":[25],"surface":[27,77],"recombination":[28,78],"and":[29,97,113,173],"corresponding":[30,69],"passivation":[31,112],"PV":[33],"emitters":[34],"advanced":[36],"solar":[37],"cells.":[38],"In":[39,154],"this":[40,126,155],"paper":[41,127],"we":[42],"outline":[43],"unique":[44],"capabilities":[45],"provided":[46],"by":[47,135],"mapping":[48,159],"multiple":[50],"properties.":[52],"Interface":[53],"trap":[54],"density":[55],"are":[57],"presented":[58],"Si":[60],"passivated":[61],"with":[62,141,144],"Al2O3and":[63],"a-Si/SiNxheterointerfaces.":[65],"Using":[66],"examples":[67],"multi-parameter":[70],"it":[72],"is":[73],"also":[74],"shown":[75],"can":[79],"be":[80],"increased":[81],"or":[82],"decreased":[83],"depending":[84],"on":[85],"value":[87,115],"space":[91],"charge":[92,96,146],"barrier,":[93],"interface":[94],"trapped":[95],"dielectric":[98,145],"charge.":[99],"For":[100],"emitter":[101,118],"structures":[102],"latter":[104],"effect":[105,111,152],"determines":[106],"effectiveness":[108],"field":[110],"saturation":[119],"current,":[120],"J0.":[121],"The":[122],"results":[123],"reviewed":[124],"in":[125],"illustrate":[128],"potential":[129],"paths":[130],"to":[131,167],"cell":[132],"efficiency":[133],"improvements":[134],"elimination":[136],"defective":[138],"wafer":[139,158],"areas":[140],"high":[142],"Ditor":[143],"values":[147],"away":[148],"from":[149],"low":[150],"J0field":[151],"saturation.":[153],"respect,":[156],"approach":[160],"offers":[161],"significant":[162],"practical":[163],"advantages":[164],"as":[165],"compared":[166],"a":[168],"study":[169],"involving":[170],"multi-sample":[171],"preparation":[172],"single":[174],"point":[175],"measurements.":[176]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}