{"id":"https://openalex.org/W1964223103","doi":"https://doi.org/10.1117/12.323110","title":"Contribution to traceability and consistency in length measurement standards","display_name":"Contribution to traceability and consistency in length measurement standards","publication_year":1998,"publication_date":"1998-09-30","ids":{"openalex":"https://openalex.org/W1964223103","doi":"https://doi.org/10.1117/12.323110","mag":"1964223103"},"language":"en","primary_location":{"id":"doi:10.1117/12.323110","doi":"https://doi.org/10.1117/12.323110","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.323110","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067286344","display_name":"Masaji Sawabe","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2802412446","display_name":"Mitutoyo Corporation (Japan)","ror":"https://ror.org/00b43n621","country_code":"JP","type":"company","lineage":["https://openalex.org/I2802412446"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Masaji Sawabe","raw_affiliation_strings":["Mitutoyo Corp. (Japan)","MITUTOYO Corporation, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mitutoyo Corp. (Japan)","institution_ids":["https://openalex.org/I2802412446"]},{"raw_affiliation_string":"MITUTOYO Corporation, Japan","institution_ids":["https://openalex.org/I2802412446"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5067286344"],"corresponding_institution_ids":["https://openalex.org/I2802412446"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.03896104,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"3477","issue":null,"first_page":"212","last_page":"217"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.8407999873161316,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.8407999873161316,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.1574999988079071,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/traceability","display_name":"traceability","score":0.8769999742507935},{"id":"https://openalex.org/keywords/consistency","display_name":"consistency","score":0.6259999871253967},{"id":"https://openalex.org/keywords/laser-interferometer","display_name":"laser interferometer","score":0.8519999980926514},{"id":"https://openalex.org/keywords/gauge-blocks","display_name":"gauge blocks","score":0.5759999752044678},{"id":"https://openalex.org/keywords/round-robin-comparison","display_name":"round robin comparison","score":0.6320000290870667},{"id":"https://openalex.org/keywords/comparator","display_name":"comparator","score":0.7540000081062317},{"id":"https://openalex.org/keywords/calibration-accuracy","display_name":"calibration accuracy","score":0.8029999732971191}],"concepts":[{"id":"https://openalex.org/C153876917","wikidata":"https://www.wikidata.org/wiki/Q899704","display_name":"Traceability","level":2,"score":0.9509786367416382},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.7030127048492432},{"id":"https://openalex.org/C21353171","wikidata":"https://www.wikidata.org/wiki/Q6522493","display_name":"Length measurement","level":2,"score":0.6861043572425842},{"id":"https://openalex.org/C2776436953","wikidata":"https://www.wikidata.org/wiki/Q5163215","display_name":"Consistency (knowledge bases)","level":2,"score":0.5816284418106079},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.48948347568511963},{"id":"https://openalex.org/C6260449","wikidata":"https://www.wikidata.org/wiki/Q41364","display_name":"Wavelength","level":2,"score":0.46989795565605164},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.4698107838630676},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4334403872489929},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.4312286078929901},{"id":"https://openalex.org/C188087704","wikidata":"https://www.wikidata.org/wiki/Q369577","display_name":"Standardization","level":2,"score":0.42674383521080017},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.4132618308067322},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2839334011077881},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.256372332572937},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.24177846312522888},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2236766517162323},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.21183544397354126},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.15673154592514038},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.11910170316696167},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.077586829662323},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.06903043389320374},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.323110","doi":"https://doi.org/10.1117/12.323110","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.323110","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1971711153","https://openalex.org/W2085539145","https://openalex.org/W2549535455","https://openalex.org/W2040092567","https://openalex.org/W1993564281","https://openalex.org/W2011268507","https://openalex.org/W4417475763","https://openalex.org/W1617709610","https://openalex.org/W7098053831","https://openalex.org/W4390331825"],"abstract_inverted_index":{"The":[0,21,42,78],"concept":[1],"of":[2,24,36,74],"the":[3,12,33,37,55,69,72,75],"traceability":[4,14,81],"in":[5,16,84],"length":[6,85],"measurement":[7,47],"standard":[8,86],"is":[9,18,40,51,88],"described":[10,65],"and":[11,32,71,82],"present":[13],"system":[15],"Japan":[17],"discussed":[19],"first.":[20],"calibration":[22,56,76],"data":[23],"commercial":[25],"stabilized":[26],"He-Ne":[27],"laser":[28,38],"wavelength":[29],"are":[30,64],"shown":[31],"suitable":[34],"usage":[35],"interferometer":[39],"given.":[41],"round":[43],"robin":[44],"gauge":[45],"block":[46],"by":[48],"comparator":[49],"that":[50],"carried":[52],"out":[53],"among":[54],"laboratories":[57],"positioned":[58],"several":[59],"countries":[60],"inside":[61],"worldwide":[62],"corporation":[63],"with":[66],"focusing":[67],"on":[68],"consistency":[70,83],"compatibility":[73],"accuracy.":[77],"contribution":[79],"to":[80],"measurements":[87,92],"explained":[89],"through":[90],"two":[91],"mentioned":[93],"above.":[94]},"counts_by_year":[],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2016-06-24T00:00:00"}