{"id":"https://openalex.org/W1964101202","doi":"https://doi.org/10.1049/el:19780281","title":"Impact ionisation ratio in In 0.73 Ga 0.27 As 0.57 P 0.43","display_name":"Impact ionisation ratio in In 0.73 Ga 0.27 As 0.57 P 0.43","publication_year":1978,"publication_date":"1978-07-06","ids":{"openalex":"https://openalex.org/W1964101202","doi":"https://doi.org/10.1049/el:19780281","mag":"1964101202"},"language":"en","primary_location":{"id":"doi:10.1049/el:19780281","doi":"https://doi.org/10.1049/el:19780281","is_oa":false,"landing_page_url":"https://doi.org/10.1049/el:19780281","pdf_url":null,"source":{"id":"https://openalex.org/S149016011","display_name":"Electronics Letters","issn_l":"0013-5194","issn":["0013-5194","1350-911X"],"is_oa":false,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-d","jufo-1","norway-1","oarl","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronics Letters","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref","doaj"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084495158","display_name":"Masanori Ito","orcid":"https://orcid.org/0000-0001-6202-3185","observed_orcids":["https://orcid.org/0000-0001-6202-3185"]},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masanori Ito","raw_affiliation_strings":["Fujitsu Laboratories Ltd., 1015 Kamikodanaka, Nakahara-ku, Kawasaki, Kanagawa 211, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Ltd., 1015 Kamikodanaka, Nakahara-ku, Kawasaki, Kanagawa 211, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026972621","display_name":"Takao Kaneda","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takao Kaneda","raw_affiliation_strings":["Fujitsu Laboratories Ltd., 1015 Kamikodanaka, Nakahara-ku, Kawasaki, Kanagawa 211, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Ltd., 1015 Kamikodanaka, Nakahara-ku, Kawasaki, Kanagawa 211, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102116980","display_name":"Kazuo Nakajima","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazuo Nakajima","raw_affiliation_strings":["Fujitsu Laboratories Ltd., 1015 Kamikodanaka, Nakahara-ku, Kawasaki, Kanagawa 211, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Ltd., 1015 Kamikodanaka, Nakahara-ku, Kawasaki, Kanagawa 211, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038163623","display_name":"Yoshikazu Toyoma","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yoshikazu Toyoma","raw_affiliation_strings":["Fujitsu Laboratories Ltd., 1015 Kamikodanaka, Nakahara-ku, Kawasaki, Kanagawa 211, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Ltd., 1015 Kamikodanaka, Nakahara-ku, Kawasaki, Kanagawa 211, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065002937","display_name":"Toyoshi Yamaoka","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toyoshi Yamaoka","raw_affiliation_strings":["Fujitsu Laboratories Ltd., 1015 Kamikodanaka, Nakahara-ku, Kawasaki, Kanagawa 211, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Ltd., 1015 Kamikodanaka, Nakahara-ku, Kawasaki, Kanagawa 211, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109035110","display_name":"Tsuyoshi Kotani","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tsuyoshi Kotani","raw_affiliation_strings":["Fujitsu Laboratories Ltd., 1015 Kamikodanaka, Nakahara-ku, Kawasaki, Kanagawa 211, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Ltd., 1015 Kamikodanaka, Nakahara-ku, Kawasaki, Kanagawa 211, Japan","institution_ids":["https://openalex.org/I2252096349"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I2252096349"],"apc_list":{"value":2590,"currency":"USD","value_usd":2590},"apc_paid":null,"fwci":14.7659,"has_fulltext":false,"cited_by_count":36,"citation_normalized_percentile":{"value":0.99162437,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"14","issue":"14","first_page":"418","last_page":"419"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.9531000256538391,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.9531000256538391,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.013399999588727951,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12309","display_name":"solar cell performance optimization","score":0.006800000090152025,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ingaasp","display_name":"InGaAsP","score":0.9409999847412109},{"id":"https://openalex.org/keywords/avalanche-photodiode","display_name":"avalanche photodiode","score":0.9229999780654907},{"id":"https://openalex.org/keywords/window-structure","display_name":"window structure","score":0.7609999775886536},{"id":"https://openalex.org/keywords/low-noise-photodetectors","display_name":"low-noise photodetectors","score":0.7760000228881836},{"id":"https://openalex.org/keywords/liquid-phase-epitaxy","display_name":"liquid phase epitaxy","score":0.7710000276565552},{"id":"https://openalex.org/keywords/inp-substrate","display_name":"InP substrate","score":0.753000020980835}],"concepts":[{"id":"https://openalex.org/C109679912","wikidata":"https://www.wikidata.org/wiki/Q175932","display_name":"Avalanche photodiode","level":3,"score":0.8156127333641052},{"id":"https://openalex.org/C32921249","wikidata":"https://www.wikidata.org/wiki/Q2001256","display_name":"Impact ionization","level":4,"score":0.7104721665382385},{"id":"https://openalex.org/C198291218","wikidata":"https://www.wikidata.org/wiki/Q190382","display_name":"Ionization","level":3,"score":0.6714586019515991},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.5591327548027039},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5453822016716003},{"id":"https://openalex.org/C2780595030","wikidata":"https://www.wikidata.org/wiki/Q3860309","display_name":"Multiplication (music)","level":2,"score":0.5339651703834534},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.530013918876648},{"id":"https://openalex.org/C110738630","wikidata":"https://www.wikidata.org/wiki/Q1135540","display_name":"Epitaxy","level":3,"score":0.508112907409668},{"id":"https://openalex.org/C751236","wikidata":"https://www.wikidata.org/wiki/Q175943","display_name":"Photodiode","level":2,"score":0.46962761878967285},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.41063809394836426},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.39215633273124695},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.261709064245224},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.10948726534843445},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.09790176153182983},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.06608855724334717},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.0},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1049/el:19780281","doi":"https://doi.org/10.1049/el:19780281","is_oa":false,"landing_page_url":"https://doi.org/10.1049/el:19780281","pdf_url":null,"source":{"id":"https://openalex.org/S149016011","display_name":"Electronics Letters","issn_l":"0013-5194","issn":["0013-5194","1350-911X"],"is_oa":false,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-d","jufo-1","norway-1","oarl","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronics Letters","raw_type":"journal-article"},{"id":"mag:3023973252","doi":null,"is_oa":false,"landing_page_url":"https://ui.adsabs.harvard.edu/abs/1978ElL....14..418I/abstract","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1971008757","https://openalex.org/W2128129265","https://openalex.org/W3034969371"],"related_works":["https://openalex.org/W2085534749","https://openalex.org/W2065463815","https://openalex.org/W1995241301","https://openalex.org/W2088910231","https://openalex.org/W2014314879","https://openalex.org/W4415636061","https://openalex.org/W2022184509","https://openalex.org/W2061049467","https://openalex.org/W2053781387","https://openalex.org/W1679281590"],"abstract_inverted_index":{"A":[0,43],"window":[1],"structure":[2,51],"InGaAsP":[3],"avalanche":[4],"photodiode":[5],"(a.p.d.)":[6],"has":[7],"been":[8],"fabricated":[9],"by":[10,49],"using":[11],"liquid-phase":[12],"epitaxy":[13],"on":[14],"(111B)":[15],"InP.":[16],"Multiplication":[17],"characteristics":[18],"show":[19],"that":[20,30],"the":[21],"impact":[22],"ionisation":[23,35],"rate":[24],"for":[25,31],"electrons":[26],"is":[27],"larger":[28],"than":[29],"holes":[32],"(\u03b1>\u03b2).":[33],"The":[34],"ratio":[36],"\u03b1/\u03b2":[37],"was":[38],"estimated":[39],"to":[40],"be":[41,47],"3\u20134.":[42],"low-noise":[44],"a.p.d.":[45],"will":[46],"realised":[48],"a":[50],"with":[52],"electron-initiated":[53],"multiplication.":[54]},"counts_by_year":[{"year":2016,"cited_by_count":1}],"updated_date":"2026-11-05T12:25:35.769452","created_date":"2016-06-24T00:00:00"}