{"id":"https://openalex.org/W196145244","doi":"https://doi.org/10.1016/b978-0-444-88429-9.50026-4","title":"THE INFLUENCE OF NATURE AND COMPOSITION OF III-V QUATERNARY SOLID SOLUTIONS UPON THE DISLOCATION STRUCTURE FORMATION IN EPITAXIAL HETEROCOMPOSITIONS","display_name":"THE INFLUENCE OF NATURE AND COMPOSITION OF III-V QUATERNARY SOLID SOLUTIONS UPON THE DISLOCATION STRUCTURE FORMATION IN EPITAXIAL HETEROCOMPOSITIONS","publication_year":1990,"publication_date":"1990-01-01","ids":{"openalex":"https://openalex.org/W196145244","doi":"https://doi.org/10.1016/b978-0-444-88429-9.50026-4","mag":"196145244"},"language":"en","primary_location":{"id":"doi:10.1016/b978-0-444-88429-9.50026-4","doi":"https://doi.org/10.1016/b978-0-444-88429-9.50026-4","is_oa":false,"landing_page_url":"https://doi.org/10.1016/b978-0-444-88429-9.50026-4","pdf_url":null,"source":{"id":"https://openalex.org/S4306463230","display_name":"Elsevier eBooks","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"ebook platform"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Defect Control in Semiconductors","raw_type":"book-chapter"},"volume":{"id":"https://openalex.org/W4255381800","display_name":"Defect Control in Semiconductors"},"type":"book-chapter","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023990582","display_name":"Vladimir I. Vdovin","orcid":"https://orcid.org/0000-0002-0952-5335","observed_orcids":["https://orcid.org/0000-0002-0952-5335"]},"institutions":[{"id":"https://openalex.org/I4210112865","display_name":"Giredmet (Russia)","ror":"https://ror.org/01avfbv46","country_code":"RU","type":"company","lineage":["https://openalex.org/I4210112865"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"V.I. Vdovin","raw_affiliation_strings":["Institute of Rare Metals, Moscow, USSR"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Rare Metals, Moscow, USSR","institution_ids":["https://openalex.org/I4210112865"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038886564","display_name":"V. S. Krasilnikov","orcid":"https://orcid.org/0000-0002-8592-0396","observed_orcids":["https://orcid.org/0000-0002-8592-0396"]},"institutions":[{"id":"https://openalex.org/I4210112865","display_name":"Giredmet (Russia)","ror":"https://ror.org/01avfbv46","country_code":"RU","type":"company","lineage":["https://openalex.org/I4210112865"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"V.S. Krasilnikov","raw_affiliation_strings":["Institute of Rare Metals, Moscow, USSR"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Rare Metals, Moscow, USSR","institution_ids":["https://openalex.org/I4210112865"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063312031","display_name":"Tatyana G. Yugova","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210112865","display_name":"Giredmet (Russia)","ror":"https://ror.org/01avfbv46","country_code":"RU","type":"company","lineage":["https://openalex.org/I4210112865"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"T.G. Yugova","raw_affiliation_strings":["Institute of Rare Metals, Moscow, USSR"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Rare Metals, Moscow, USSR","institution_ids":["https://openalex.org/I4210112865"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210112865"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1107","last_page":"1109"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.9204000234603882,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.9204000234603882,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12309","display_name":"solar cell performance optimization","score":0.03999999910593033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.007300000172108412,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/lattice-mismatch","display_name":"lattice mismatch","score":0.878000020980835},{"id":"https://openalex.org/keywords/solid-solution-composition","display_name":"solid solution composition","score":0.8320000171661377},{"id":"https://openalex.org/keywords/ingaasp","display_name":"InGaAsP","score":0.9390000104904175},{"id":"https://openalex.org/keywords/gainassb","display_name":"GaInAsSb","score":0.9990000128746033},{"id":"https://openalex.org/keywords/dislocation-generation","display_name":"dislocation generation","score":0.8870000243186951},{"id":"https://openalex.org/keywords/dislocation-multiplication","display_name":"dislocation multiplication","score":0.7950000166893005},{"id":"https://openalex.org/keywords/dislocation-motion","display_name":"dislocation motion","score":0.5720000267028809}],"concepts":[{"id":"https://openalex.org/C138999460","wikidata":"https://www.wikidata.org/wiki/Q787619","display_name":"Solid solution","level":2,"score":0.8719859719276428},{"id":"https://openalex.org/C110738630","wikidata":"https://www.wikidata.org/wiki/Q1135540","display_name":"Epitaxy","level":3,"score":0.7919390797615051},{"id":"https://openalex.org/C159122135","wikidata":"https://www.wikidata.org/wiki/Q737571","display_name":"Dislocation","level":2,"score":0.6994324922561646},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5380797386169434},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.5216308236122131},{"id":"https://openalex.org/C160464908","wikidata":"https://www.wikidata.org/wiki/Q26185","display_name":"Quaternary","level":2,"score":0.4777626097202301},{"id":"https://openalex.org/C40231798","wikidata":"https://www.wikidata.org/wiki/Q1333743","display_name":"Composition (language)","level":2,"score":0.4669296145439148},{"id":"https://openalex.org/C2781204021","wikidata":"https://www.wikidata.org/wiki/Q6497091","display_name":"Lattice (music)","level":2,"score":0.43392032384872437},{"id":"https://openalex.org/C199289684","wikidata":"https://www.wikidata.org/wiki/Q83353","display_name":"Mineralogy","level":1,"score":0.32019180059432983},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.31991326808929443},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.1828305423259735},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.13419455289840698},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.12964484095573425},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08995142579078674},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/b978-0-444-88429-9.50026-4","doi":"https://doi.org/10.1016/b978-0-444-88429-9.50026-4","is_oa":false,"landing_page_url":"https://doi.org/10.1016/b978-0-444-88429-9.50026-4","pdf_url":null,"source":{"id":"https://openalex.org/S4306463230","display_name":"Elsevier eBooks","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"ebook platform"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Defect Control in Semiconductors","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W1964350287","https://openalex.org/W2012390591"],"related_works":["https://openalex.org/W2331770209","https://openalex.org/W2330674501","https://openalex.org/W2072286047","https://openalex.org/W1634937482","https://openalex.org/W1977178297","https://openalex.org/W2998893343","https://openalex.org/W3124243777","https://openalex.org/W2555278095","https://openalex.org/W2021106949","https://openalex.org/W2079610353"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-11-05T12:25:35.769452","created_date":"2016-06-24T00:00:00"}