{"id":"https://openalex.org/W1869876183","doi":"https://doi.org/10.1109/arms.1989.49573","title":"Software reliability growth process-a life cycle approach","display_name":"Software reliability growth process-a life cycle approach","publication_year":2003,"publication_date":"2003-01-07","ids":{"openalex":"https://openalex.org/W1869876183","doi":"https://doi.org/10.1109/arms.1989.49573","mag":"1869876183"},"language":"en","primary_location":{"id":"doi:10.1109/arms.1989.49573","doi":"https://doi.org/10.1109/arms.1989.49573","is_oa":false,"landing_page_url":"https://doi.org/10.1109/arms.1989.49573","pdf_url":null,"source":{"id":"https://openalex.org/S4210171523","display_name":"Annual Reliability and Maintainability Symposium (RAMS)","issn_l":"0149-144X","issn":["0149-144X","2577-0993"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings., Annual Reliability and Maintainability Symposium","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068852241","display_name":"Dev G. Raheja","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210090306","display_name":"AnywherEnergy (United States)","ror":"https://ror.org/00drdr242","country_code":"US","type":"company","lineage":["https://openalex.org/I4210090306"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"D.G. Raheja","raw_affiliation_strings":["Technology Management, Inc., Laurel, USA","Technol. Manage. Inc., Laurel, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technology Management, Inc., Laurel, USA","institution_ids":["https://openalex.org/I4210090306"]},{"raw_affiliation_string":"Technol. Manage. Inc., Laurel, MD, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5068852241"],"corresponding_institution_ids":["https://openalex.org/I4210090306"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.0907195,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"52","last_page":"55"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.002199999988079071,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.0007999999797903001,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/software-reliability-growth","display_name":"software reliability growth","score":0.9610000252723694},{"id":"https://openalex.org/keywords/software-development-lifecycle","display_name":"software development lifecycle","score":0.6359999775886536},{"id":"https://openalex.org/keywords/life-cycle-cost-reduction","display_name":"life cycle cost reduction","score":0.9599999785423279},{"id":"https://openalex.org/keywords/software-maintenance","display_name":"software maintenance","score":0.6800000071525574},{"id":"https://openalex.org/keywords/negative-growth","display_name":"negative growth","score":0.4390000104904175},{"id":"https://openalex.org/keywords/engineering-changes","display_name":"engineering changes","score":0.6499999761581421},{"id":"https://openalex.org/keywords/early-design-stage","display_name":"preliminary design","score":0.7910000085830688}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6721779108047485},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6024545431137085},{"id":"https://openalex.org/C2778514511","wikidata":"https://www.wikidata.org/wiki/Q1374194","display_name":"Programmer","level":2,"score":0.5828632116317749},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5803664326667786},{"id":"https://openalex.org/C180152950","wikidata":"https://www.wikidata.org/wiki/Q2904257","display_name":"Software development process","level":4,"score":0.5385199189186096},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.513573408126831},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.48317375779151917},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4637930989265442},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.44208788871765137},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.44084984064102173},{"id":"https://openalex.org/C109905503","wikidata":"https://www.wikidata.org/wiki/Q4828920","display_name":"Avionics software","level":5,"score":0.4203265309333801},{"id":"https://openalex.org/C135945739","wikidata":"https://www.wikidata.org/wiki/Q1211457","display_name":"Software release life cycle","level":5,"score":0.41960522532463074},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.22950094938278198},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17064249515533447},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.14852672815322876},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/arms.1989.49573","doi":"https://doi.org/10.1109/arms.1989.49573","is_oa":false,"landing_page_url":"https://doi.org/10.1109/arms.1989.49573","pdf_url":null,"source":{"id":"https://openalex.org/S4210171523","display_name":"Annual Reliability and Maintainability Symposium (RAMS)","issn_l":"0149-144X","issn":["0149-144X","2577-0993"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings., Annual Reliability and Maintainability Symposium","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2144279038","https://openalex.org/W4233231344","https://openalex.org/W1585620625","https://openalex.org/W2033108754","https://openalex.org/W4241629223","https://openalex.org/W2958957358","https://openalex.org/W2016782049","https://openalex.org/W94015702","https://openalex.org/W2392657995","https://openalex.org/W2046451536"],"abstract_inverted_index":{"The":[0,65,86],"author":[1],"presents":[2],"a":[3,49],"life-cycle":[4,95],"cost-reduction":[5],"technique":[6],"to":[7,33,68,77,90],"achieve":[8],"rapid":[9],"growth":[10,29,51,75],"rate":[11],"in":[12,21,25,37,46,81],"software":[13,38,47,71],"reliability":[14,28,72],"growth.":[15],"He":[16],"points":[17],"out":[18],"the":[19,22,26,53,63,70,82],"deficiencies":[20],"current":[23],"practices":[24],"hardware":[27],"process":[30],"and":[31,73,93],"how":[32],"overcome":[34],"such":[35],"weaknesses":[36],"engineering.":[39],"It":[40],"is":[41,76],"suggested":[42],"that":[43],"fixing":[44],"errors":[45],"introduces":[48],"negative":[50],"because":[52],"programmer":[54],"may":[55],"not":[56],"know":[57],"which":[58],"paths":[59],"are":[60],"affected":[61],"by":[62],"change.":[64],"best":[66],"way":[67],"accelerate":[69],"maintenance":[74],"identify":[78],"engineering":[79],"changes":[80],"early":[83],"design":[84],"phases.":[85],"ATAF":[87],"program":[88],"tends":[89],"minimize":[91],"risks":[92],"lower":[94],"costs":[96],"significantly.>":[97]},"counts_by_year":[],"updated_date":"2026-10-26T11:51:55.731654","created_date":"2016-06-24T00:00:00"}