{"id":"https://openalex.org/W1840513699","doi":"https://doi.org/10.1103/physrevb.60.13331","title":"Cathodoluminescent properties of pulsed-laser-deposited Eu-activated Y2O3 epitaxial films","display_name":"Cathodoluminescent properties of pulsed-laser-deposited Eu-activated Y2O3 epitaxial films","publication_year":1999,"publication_date":"1999-11-15","ids":{"openalex":"https://openalex.org/W1840513699","doi":"https://doi.org/10.1103/physrevb.60.13331","mag":"1840513699"},"language":"lv","primary_location":{"id":"doi:10.1103/physrevb.60.13331","doi":"https://doi.org/10.1103/physrevb.60.13331","is_oa":false,"landing_page_url":"https://doi.org/10.1103/physrevb.60.13331","pdf_url":null,"source":{"id":"https://openalex.org/S4210174675","display_name":"Physical review. B, Condensed matter","issn_l":"0163-1829","issn":["0163-1829","1095-3795"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","ki-jl-2"],"host_organization":"https://openalex.org/P4310320261","host_organization_name":"American Physical Society","host_organization_lineage":["https://openalex.org/P4310320261"],"host_organization_lineage_names":["American Physical Society"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Physical Review B","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012014778","display_name":"Dhananjay Kumar","orcid":"https://orcid.org/0000-0001-5131-5131","observed_orcids":["https://orcid.org/0000-0001-5131-5131"]},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. Kumar","raw_affiliation_strings":["Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611-6400"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611-6400","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054005861","display_name":"K. G. Cho","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. G. Cho","raw_affiliation_strings":["Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611-6400"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611-6400","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054123780","display_name":"Zhan Chen","orcid":"https://orcid.org/0000-0001-8687-8348","observed_orcids":["https://orcid.org/0000-0001-8687-8348"]},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhan Chen","raw_affiliation_strings":["Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611-6400"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611-6400","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082253069","display_name":"V. Cr\u0103ciun","orcid":"https://orcid.org/0000-0003-1458-8653","observed_orcids":["https://orcid.org/0000-0003-1458-8653"]},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"V. Craciun","raw_affiliation_strings":["Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611-6400"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611-6400","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086482558","display_name":"Paul H. Holloway","orcid":"https://orcid.org/0009-0002-8896-6100","observed_orcids":["https://orcid.org/0009-0002-8896-6100"]},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. H. Holloway","raw_affiliation_strings":["Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611-6400"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611-6400","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103632906","display_name":"Rajiv K. Singh","orcid":"https://orcid.org/0000-0002-7951-202X","observed_orcids":["https://orcid.org/0000-0002-7951-202X"]},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rajiv K. Singh","raw_affiliation_strings":["Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611-6400"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611-6400","institution_ids":["https://openalex.org/I33213144"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I33213144"],"apc_list":null,"apc_paid":null,"fwci":1.3426,"has_fulltext":false,"cited_by_count":43,"citation_normalized_percentile":{"value":0.77498911,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"60","issue":"19","first_page":"13331","last_page":"13334"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10097","display_name":"Luminescence Properties of Advanced Materials","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10097","display_name":"Luminescence Properties of Advanced Materials","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11127","display_name":"Solid State Laser Technologies","score":0.0010000000474974513,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11279","display_name":"Lanthanide and Transition Metal Complexes","score":0.0008999999845400453,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/europium-doped-yttrium-oxide","display_name":"europium-doped yttrium oxide","score":0.9290000200271606},{"id":"https://openalex.org/keywords/cathodoluminescence","display_name":"cathodoluminescence","score":0.9789999723434448},{"id":"https://openalex.org/keywords/epitaxial-growth","display_name":"epitaxial growth","score":0.9300000071525574},{"id":"https://openalex.org/keywords/pulsed-laser-deposition","display_name":"pulsed laser deposition","score":0.9100000262260437},{"id":"https://openalex.org/keywords/laalo3-substrate","display_name":"LaAlO3 substrate","score":0.8759999871253967},{"id":"https://openalex.org/keywords/lattice-mismatch","display_name":"lattice mismatch","score":0.953000009059906},{"id":"https://openalex.org/keywords/rare-earth-phosphors","display_name":"rare-earth phosphors","score":0.4690000116825104},{"id":"https://openalex.org/keywords/in-situ-growth","display_name":"in situ growth","score":0.40700000524520874}],"concepts":[{"id":"https://openalex.org/C110738630","wikidata":"https://www.wikidata.org/wiki/Q1135540","display_name":"Epitaxy","level":3,"score":0.7135511040687561},{"id":"https://openalex.org/C531131001","wikidata":"https://www.wikidata.org/wiki/Q941","display_name":"Yttrium","level":3,"score":0.5749770402908325},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5320148468017578},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5131538510322571},{"id":"https://openalex.org/C37982897","wikidata":"https://www.wikidata.org/wiki/Q901321","display_name":"Pulsed laser deposition","level":3,"score":0.49605903029441833},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.4467127323150635},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.37857216596603394},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3756859004497528},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.27001965045928955},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.22650134563446045},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.08664178848266602},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1103/physrevb.60.13331","doi":"https://doi.org/10.1103/physrevb.60.13331","is_oa":false,"landing_page_url":"https://doi.org/10.1103/physrevb.60.13331","pdf_url":null,"source":{"id":"https://openalex.org/S4210174675","display_name":"Physical review. B, Condensed matter","issn_l":"0163-1829","issn":["0163-1829","1095-3795"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","ki-jl-2"],"host_organization":"https://openalex.org/P4310320261","host_organization_name":"American Physical Society","host_organization_lineage":["https://openalex.org/P4310320261"],"host_organization_lineage_names":["American Physical Society"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Physical Review B","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W237966329","https://openalex.org/W1563097994","https://openalex.org/W1674624424","https://openalex.org/W1963912119","https://openalex.org/W1971401809","https://openalex.org/W1989346375","https://openalex.org/W2053515370","https://openalex.org/W2074239078","https://openalex.org/W2145817176","https://openalex.org/W2150499413","https://openalex.org/W2200166539","https://openalex.org/W2218273778","https://openalex.org/W2514716749","https://openalex.org/W3163772931","https://openalex.org/W4232994806"],"related_works":["https://openalex.org/W2319984159","https://openalex.org/W2053515370","https://openalex.org/W1646216541","https://openalex.org/W2083416931","https://openalex.org/W2006944210","https://openalex.org/W2146804603","https://openalex.org/W1563097994","https://openalex.org/W2281433387","https://openalex.org/W1664297287","https://openalex.org/W1965996676"],"abstract_inverted_index":{"The":[0,19,48],"growth,":[1],"structural":[2],"and":[3,77],"cathodoluminescent":[4],"(CL)":[5],"properties":[6],"of":[7,51,61,67,74],"4":[8],"wt.":[9],"%":[10],"europium-doped":[11],"yttrium":[12],"oxide":[13],"$({\\mathrm{E}\\mathrm{u}:\\mathrm{Y}}_{2}{\\mathrm{O}}_{3})$":[14],"thin":[15],"films":[16,21,37,53,87,94],"are":[17,88],"reported.":[18],"${\\mathrm{E}\\mathrm{u}:\\mathrm{Y}}_{2}{\\mathrm{O}}_{3}$":[20,36,52,93],"were":[22],"grown":[23],"in":[24,71],"situ":[25],"using":[26],"a":[27,58,81],"pulsed":[28],"laser":[29],"deposition":[30,46],"technique.":[31],"Our":[32],"results":[33],"show":[34],"that":[35],"can":[38],"grow":[39],"epitaxially":[40],"on":[41,54],"$(100){\\mathrm{LaAlO}}_{3}$":[42],"substrates":[43],"under":[44],"optimized":[45],"parameters.":[47],"epitaxial":[49],"growth":[50],"${\\mathrm{LaAlO}}_{3},$":[55],"which":[56],"has":[57],"lattice":[59],"mismatch":[60],"\\ensuremath{\\sim}60%,":[62],"is":[63],"explained":[64],"by":[65],"matching":[66],"the":[68,72,75,78],"atom":[69],"positions":[70],"lattices":[73],"film":[76],"substrate":[79],"after":[80],"rotation.":[82],"CL":[83,98],"data":[84],"from":[85],"these":[86],"consistent":[89],"with":[90,95],"highly":[91],"crystalline":[92],"an":[96],"intense":[97],"emission":[99],"at":[100],"611":[101],"nm.":[102]},"counts_by_year":[{"year":2020,"cited_by_count":3},{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2012,"cited_by_count":4}],"updated_date":"2026-11-05T12:25:35.769452","created_date":"2016-06-24T00:00:00"}