{"id":"https://openalex.org/W1808409018","doi":"https://doi.org/10.1109/ceidp.1993.378982","title":"Energy released during space charge relaxation induced breakdown","display_name":"Energy released during space charge relaxation induced breakdown","publication_year":2002,"publication_date":"2002-12-30","ids":{"openalex":"https://openalex.org/W1808409018","doi":"https://doi.org/10.1109/ceidp.1993.378982","mag":"1808409018"},"language":"en","primary_location":{"id":"doi:10.1109/ceidp.1993.378982","doi":"https://doi.org/10.1109/ceidp.1993.378982","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ceidp.1993.378982","pdf_url":null,"source":{"id":"https://openalex.org/S4363608173","display_name":"IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048516570","display_name":"Denise Moya-Siesse","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"D. Moya-Siesse","raw_affiliation_strings":["Fac des Sci. de Marseille St. Jerome, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fac des Sci. de Marseille St. Jerome, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113785927","display_name":"G. Moya","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"G. Moya","raw_affiliation_strings":["Fac des Sci. de Marseille St. Jerome, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fac des Sci. de Marseille St. Jerome, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072853373","display_name":"C. Le Gressus","orcid":"https://orcid.org/0000-0002-4563-7609","observed_orcids":["https://orcid.org/0000-0002-4563-7609"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"C. LeGressus","raw_affiliation_strings":["Fac des Sci. de Marseille St. Jerome, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fac des Sci. de Marseille St. Jerome, France","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111993405","display_name":"G. Blaise","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"G. Blaise","raw_affiliation_strings":["Fac des Sci. de Marseille St. Jerome, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fac des Sci. de Marseille St. Jerome, France","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3756,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.44922587,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"146","last_page":"149"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.8848000168800354,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.8848000168800354,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.05689999833703041,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14311","display_name":"Electrical and Electromagnetic Research","score":0.007499999832361937,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/space-charge-relaxation","display_name":"space charge relaxation","score":0.9549999833106995},{"id":"https://openalex.org/keywords/breakdown","display_name":"breakdown","score":0.5450000166893005},{"id":"https://openalex.org/keywords/charge-detrapping","display_name":"charge detrapping","score":0.8970000147819519},{"id":"https://openalex.org/keywords/energy-release","display_name":"energy release","score":0.6470000147819519},{"id":"https://openalex.org/keywords/dielectric-breakdown","display_name":"dielectric breakdown","score":0.5210000276565552},{"id":"https://openalex.org/keywords/electron-beam-charging","display_name":"electron beam charging","score":0.8740000128746033},{"id":"https://openalex.org/keywords/scanning-electron-microscopy","display_name":"scanning electron microscopy","score":0.7120000123977661},{"id":"https://openalex.org/keywords/in-situ-measurement","display_name":"in situ measurement","score":0.492000013589859}],"concepts":[{"id":"https://openalex.org/C45119746","wikidata":"https://www.wikidata.org/wiki/Q205949","display_name":"Exothermic reaction","level":2,"score":0.6614139080047607},{"id":"https://openalex.org/C103132145","wikidata":"https://www.wikidata.org/wiki/Q1669228","display_name":"Space charge","level":3,"score":0.6273460984230042},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.6103107929229736},{"id":"https://openalex.org/C2779058145","wikidata":"https://www.wikidata.org/wiki/Q6294583","display_name":"Joule (programming language)","level":3,"score":0.5904983282089233},{"id":"https://openalex.org/C2776029896","wikidata":"https://www.wikidata.org/wiki/Q3935810","display_name":"Relaxation (psychology)","level":2,"score":0.525640606880188},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.5167076587677002},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5064963102340698},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.4959190785884857},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.48890724778175354},{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.4886470437049866},{"id":"https://openalex.org/C117926987","wikidata":"https://www.wikidata.org/wiki/Q210009","display_name":"Joule heating","level":2,"score":0.4306425452232361},{"id":"https://openalex.org/C168834538","wikidata":"https://www.wikidata.org/wiki/Q3705329","display_name":"Beam (structure)","level":2,"score":0.42974111437797546},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4145532548427582},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.41071659326553345},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.40192553400993347},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3978504538536072},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3561975359916687},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.297951877117157},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.25094687938690186},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.175936758518219},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.13318902254104614},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.1238783597946167},{"id":"https://openalex.org/C77805123","wikidata":"https://www.wikidata.org/wiki/Q161272","display_name":"Social psychology","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ceidp.1993.378982","doi":"https://doi.org/10.1109/ceidp.1993.378982","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ceidp.1993.378982","pdf_url":null,"source":{"id":"https://openalex.org/S4363608173","display_name":"IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1967268268","https://openalex.org/W2037911416","https://openalex.org/W2161747839"],"related_works":["https://openalex.org/W2069274241","https://openalex.org/W4416184127","https://openalex.org/W2171134912","https://openalex.org/W1613245429","https://openalex.org/W1987217070","https://openalex.org/W2893891663","https://openalex.org/W1916235662","https://openalex.org/W2161747839","https://openalex.org/W2120087276","https://openalex.org/W1659976869"],"abstract_inverted_index":{"A":[0],"system":[1],"able":[2],"to":[3,58],"measure":[4],"in":[5,13],"situ,":[6],"after":[7],"charging":[8],"by":[9,35,40,81,106],"an":[10,56,59,97],"electron":[11,84],"beam":[12,85],"a":[14,41,63,112],"SEM,":[15],"the":[16,27,36,48,51,72,83,87,103,107],"energy":[17],"released":[18],"for":[19],"small-sized":[20],"dielectrics":[21],"is":[22],"described.":[23],"The":[24,69],"device":[25,52],"observe":[26],"phenomena":[28],"of":[29,50,65,71],"breakdown":[30],"during":[31,102],"detrapping.":[32],"Preliminary":[33,93],"calibration":[34],"Joule":[37],"effect":[38],"and":[39],"laser":[42],"irradiation":[43],"technique":[44],"has":[45],"shown":[46],"that":[47,96],"sensitivity":[49],"presently":[53],"corresponds,":[54],"through":[55],"amplifier,":[57],"analog":[60],"signal,":[61],"giving":[62],"deviation":[64],"0.70":[66],"/spl":[67],"mu/Watt/mm.":[68],"nature":[70],"thermal":[73],"event":[74,104],"(endothermic":[75],"or":[76],"exothermic)":[77],"can":[78],"be":[79,116],"established":[80],"focusing":[82],"on":[86],"grounded":[88],"steel":[89],"sheet":[90],"before":[91],"implantation.":[92],"results":[94],"show":[95],"exothermic":[98],"signal":[99],"may":[100],"occur":[101],"produced":[105],"charge":[108],"detrapping":[109,114],"breakdown,":[110],"whereas":[111],"slow":[113],"cannot":[115],"detected.>":[117]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-10-12T09:40:04.860316","created_date":"2016-06-24T00:00:00"}