{"id":"https://openalex.org/W1768536601","doi":"https://doi.org/10.1007/978-3-319-23413-7_49","title":"Fast Fault Simulation to Identify Subcircuits Involving Faulty Components","display_name":"Fast Fault Simulation to Identify Subcircuits Involving Faulty Components","publication_year":2016,"publication_date":"2016-01-01","ids":{"openalex":"https://openalex.org/W1768536601","doi":"https://doi.org/10.1007/978-3-319-23413-7_49","mag":"1768536601"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-319-23413-7_49","doi":"https://doi.org/10.1007/978-3-319-23413-7_49","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-23413-7_49","pdf_url":null,"source":{"id":"https://openalex.org/S4210219233","display_name":"Mathematics in industry","issn_l":"1612-3956","issn":["1612-3956","2198-3283"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Mathematics in Industry","raw_type":"book-chapter"},"volume":{"id":"https://openalex.org/W2750710526","display_name":"Progress in Industrial Mathematics at ECMI 2014"},"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://research.tue.nl/en/publications/16a3980b-6a8b-4a88-856e-4ec357643bf9","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050826704","display_name":"Bratislav Tasi\u0107","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]},{"id":"https://openalex.org/I4210123704","display_name":"NXP (Germany)","ror":"https://ror.org/0268h4j55","country_code":"DE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210123704"]}],"countries":["DE","NL"],"is_corresponding":true,"raw_author_name":"B. Tasi\u0107","raw_affiliation_strings":["NXP Semiconductors, High Tech Campus 46, 5656 AE, Eindhoven, The Netherlands","[NXP Semiconductors]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, High Tech Campus 46, 5656 AE, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I109147379"]},{"raw_affiliation_string":"[NXP Semiconductors]","institution_ids":["https://openalex.org/I4210123704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054070138","display_name":"Jos J. Dohmen","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]},{"id":"https://openalex.org/I4210123704","display_name":"NXP (Germany)","ror":"https://ror.org/0268h4j55","country_code":"DE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210123704"]}],"countries":["DE","NL"],"is_corresponding":false,"raw_author_name":"J. J. Dohmen","raw_affiliation_strings":["NXP Semiconductors, High Tech Campus 46, 5656 AE, Eindhoven, The Netherlands","[NXP Semiconductors]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, High Tech Campus 46, 5656 AE, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I109147379"]},{"raw_affiliation_string":"[NXP Semiconductors]","institution_ids":["https://openalex.org/I4210123704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035491183","display_name":"E. Jan W. ter Maten","orcid":"https://orcid.org/0000-0001-5054-1102","observed_orcids":["https://orcid.org/0000-0001-5054-1102"]},"institutions":[{"id":"https://openalex.org/I167360494","display_name":"University of Wuppertal","ror":"https://ror.org/00613ak93","country_code":"DE","type":"education","lineage":["https://openalex.org/I167360494"]},{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["DE","NL"],"is_corresponding":false,"raw_author_name":"E. J. W. ter Maten","raw_affiliation_strings":["Bergische Universit\u00e4t Wuppertal, Gau\u00dfstra\u00dfe 20, D-42219, Wuppertal, Germany","Eindhoven University of Technology, P.O. Box 513, 5600 MB, Eindhoven, The Netherlands","Bergische Universit\u00e4t Wuppertal","Eindhoven University of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bergische Universit\u00e4t Wuppertal, Gau\u00dfstra\u00dfe 20, D-42219, Wuppertal, Germany","institution_ids":["https://openalex.org/I167360494"]},{"raw_affiliation_string":"Eindhoven University of Technology, P.O. Box 513, 5600 MB, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I83019370"]},{"raw_affiliation_string":"Bergische Universit\u00e4t Wuppertal","institution_ids":["https://openalex.org/I167360494"]},{"raw_affiliation_string":"Eindhoven University of Technology","institution_ids":["https://openalex.org/I83019370"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108528533","display_name":"Theo G. J. Beelen","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]},{"id":"https://openalex.org/I4210123704","display_name":"NXP (Germany)","ror":"https://ror.org/0268h4j55","country_code":"DE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210123704"]},{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["DE","NL"],"is_corresponding":false,"raw_author_name":"T. G. J. Beelen","raw_affiliation_strings":["Eindhoven University of Technology, P.O. Box 513, 5600 MB, Eindhoven, The Netherlands","NXP Semiconductors, High Tech Campus 46, 5656 AE, Eindhoven, The Netherlands","Eindhoven University of Technology","NXP Semiconductors"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology, P.O. Box 513, 5600 MB, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I83019370"]},{"raw_affiliation_string":"NXP Semiconductors, High Tech Campus 46, 5656 AE, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I109147379"]},{"raw_affiliation_string":"Eindhoven University of Technology","institution_ids":["https://openalex.org/I83019370"]},{"raw_affiliation_string":"NXP Semiconductors","institution_ids":["https://openalex.org/I4210123704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103461144","display_name":"H. H. J. M. Janssen","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]},{"id":"https://openalex.org/I4210123704","display_name":"NXP (Germany)","ror":"https://ror.org/0268h4j55","country_code":"DE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210123704"]}],"countries":["DE","NL"],"is_corresponding":false,"raw_author_name":"H. H. J. M. Janssen","raw_affiliation_strings":["NXP Semiconductors, High Tech Campus 46, 5656 AE, Eindhoven, The Netherlands","[NXP Semiconductors]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, High Tech Campus 46, 5656 AE, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I109147379"]},{"raw_affiliation_string":"[NXP Semiconductors]","institution_ids":["https://openalex.org/I4210123704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057699287","display_name":"W.H.A. Schilders","orcid":"https://orcid.org/0000-0001-5838-8579","observed_orcids":["https://orcid.org/0000-0001-5838-8579"]},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"W. H. A. Schilders","raw_affiliation_strings":["Eindhoven University of Technology, P.O. Box 513, 5600 MB, Eindhoven, The Netherlands","EINDHOVEN UNIVERSITY OF TECHNOLOGY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology, P.O. Box 513, 5600 MB, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I83019370"]},{"raw_affiliation_string":"EINDHOVEN UNIVERSITY OF TECHNOLOGY","institution_ids":["https://openalex.org/I83019370"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080524539","display_name":"Michael G\u00fcnther","orcid":"https://orcid.org/0000-0002-2195-4300","observed_orcids":["https://orcid.org/0000-0002-2195-4300"]},"institutions":[{"id":"https://openalex.org/I167360494","display_name":"University of Wuppertal","ror":"https://ror.org/00613ak93","country_code":"DE","type":"education","lineage":["https://openalex.org/I167360494"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"M. G\u00fcnther","raw_affiliation_strings":["Bergische Universit\u00e4t Wuppertal, Gau\u00dfstra\u00dfe 20, D-42219, Wuppertal, Germany","Bergische Universit\u00e4t                     Wuppertal"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bergische Universit\u00e4t Wuppertal, Gau\u00dfstra\u00dfe 20, D-42219, Wuppertal, Germany","institution_ids":["https://openalex.org/I167360494"]},{"raw_affiliation_string":"Bergische Universit\u00e4t                     Wuppertal","institution_ids":["https://openalex.org/I167360494"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5050826704"],"corresponding_institution_ids":["https://openalex.org/I109147379","https://openalex.org/I4210123704"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.00047773,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"369","last_page":"376"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.0027000000700354576,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.0010000000474974513,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-simulation","display_name":"fault simulation","score":0.8190000057220459},{"id":"https://openalex.org/keywords/electronic-circuit-testing","display_name":"electronic circuit testing","score":0.47699999809265137},{"id":"https://openalex.org/keywords/manufacturing-defects","display_name":"manufacturing defects","score":0.4830000102519989},{"id":"https://openalex.org/keywords/open-faults","display_name":"open faults","score":0.7009999752044678},{"id":"https://openalex.org/keywords/faulty-component-identification","display_name":"faulty component identification","score":0.5220000147819519},{"id":"https://openalex.org/keywords/transient-simulation","display_name":"transient simulation","score":0.8199999928474426},{"id":"https://openalex.org/keywords/fault-detection","display_name":"fault detection","score":0.4180000126361847}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6651015281677246},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5190201997756958},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.5178173184394836},{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.5094278454780579},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.49041032791137695},{"id":"https://openalex.org/C179254644","wikidata":"https://www.wikidata.org/wiki/Q13222844","display_name":"Moment (physics)","level":2,"score":0.43308448791503906},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4200739860534668},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.41896921396255493},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35612842440605164},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07415038347244263},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C74650414","wikidata":"https://www.wikidata.org/wiki/Q11397","display_name":"Classical mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/978-3-319-23413-7_49","doi":"https://doi.org/10.1007/978-3-319-23413-7_49","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-23413-7_49","pdf_url":null,"source":{"id":"https://openalex.org/S4210219233","display_name":"Mathematics in industry","issn_l":"1612-3956","issn":["1612-3956","2198-3283"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Mathematics in Industry","raw_type":"book-chapter"},{"id":"pmh:oai:pure.tue.nl:openaire/16a3980b-6a8b-4a88-856e-4ec357643bf9","doi":null,"is_oa":true,"landing_page_url":"https://research.tue.nl/en/publications/16a3980b-6a8b-4a88-856e-4ec357643bf9","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Tasic, B, Dohmen, J J, Maten, ter, E J W, Beelen, T G J, Janssen, H H J M, Schilders, W H A & G\u00fcnther, M 2015, Fast fault simulation to identify subcircuits involving faulty components. CASA-report, vol. 1506, Technische Universiteit Eindhoven, Eindhoven.","raw_type":"info:eu-repo/semantics/report"}],"best_oa_location":{"id":"pmh:oai:pure.tue.nl:openaire/16a3980b-6a8b-4a88-856e-4ec357643bf9","doi":null,"is_oa":true,"landing_page_url":"https://research.tue.nl/en/publications/16a3980b-6a8b-4a88-856e-4ec357643bf9","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Tasic, B, Dohmen, J J, Maten, ter, E J W, Beelen, T G J, Janssen, H H J M, Schilders, W H A & G\u00fcnther, M 2015, Fast fault simulation to identify subcircuits involving faulty components. CASA-report, vol. 1506, Technische Universiteit Eindhoven, Eindhoven.","raw_type":"info:eu-repo/semantics/report"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W105972687","https://openalex.org/W156354643","https://openalex.org/W611479614","https://openalex.org/W1980151347","https://openalex.org/W1981745143","https://openalex.org/W1992382363","https://openalex.org/W2091658423","https://openalex.org/W2107792107","https://openalex.org/W2133855938","https://openalex.org/W2150641364","https://openalex.org/W2154718965","https://openalex.org/W2162658196","https://openalex.org/W2171992729","https://openalex.org/W3217167116"],"related_works":["https://openalex.org/W2808846839","https://openalex.org/W2896392495","https://openalex.org/W2983258159","https://openalex.org/W2162723567","https://openalex.org/W2151989067","https://openalex.org/W2130878771","https://openalex.org/W1981782019","https://openalex.org/W3048010635","https://openalex.org/W4239431781","https://openalex.org/W2148020081"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}