{"id":"https://openalex.org/W1746904668","doi":"https://doi.org/10.1016/0304-3991(84)90201-8","title":"Development of a 500 \u00c5 spatial resolution light microscope","display_name":"Development of a 500 \u00c5 spatial resolution light microscope","publication_year":1984,"publication_date":"1984-01-01","ids":{"openalex":"https://openalex.org/W1746904668","doi":"https://doi.org/10.1016/0304-3991(84)90201-8","mag":"1746904668"},"language":"en","primary_location":{"id":"doi:10.1016/0304-3991(84)90201-8","doi":"https://doi.org/10.1016/0304-3991(84)90201-8","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0304-3991(84)90201-8","pdf_url":null,"source":{"id":"https://openalex.org/S27731274","display_name":"Ultramicroscopy","issn_l":"0304-3991","issn":["0304-3991","1879-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-a","jufo-1","ki-jl-1","medline","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Ultramicroscopy","raw_type":"journal-article"},"parent_works":[],"lineage":["https://openalex.org/W1746904668"],"child_works_count":0,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024264517","display_name":"A. Lewis","orcid":"https://orcid.org/0009-0005-2944-8962","observed_orcids":["https://orcid.org/0009-0005-2944-8962"]},"institutions":[{"id":"https://openalex.org/I205783295","display_name":"Cornell University","ror":"https://ror.org/05bnh6r87","country_code":"US","type":"education","lineage":["https://openalex.org/I205783295"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Lewis","raw_affiliation_strings":["School of Applied and Engineering Physics and the National Research and Resource Facility for Submicron Structures, Cornell University, Ithaca, New York 14853, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Applied and Engineering Physics and the National Research and Resource Facility for Submicron Structures, Cornell University, Ithaca, New York 14853, USA","institution_ids":["https://openalex.org/I205783295"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066199408","display_name":"M. S. Isaacson","orcid":"https://orcid.org/0000-0002-5648-9023","observed_orcids":["https://orcid.org/0000-0002-5648-9023"]},"institutions":[{"id":"https://openalex.org/I205783295","display_name":"Cornell University","ror":"https://ror.org/05bnh6r87","country_code":"US","type":"education","lineage":["https://openalex.org/I205783295"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Isaacson","raw_affiliation_strings":["School of Applied and Engineering Physics and the National Research and Resource Facility for Submicron Structures, Cornell University, Ithaca, New York 14853, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Applied and Engineering Physics and the National Research and Resource Facility for Submicron Structures, Cornell University, Ithaca, New York 14853, USA","institution_ids":["https://openalex.org/I205783295"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112555170","display_name":"Alec T. Harootunian","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I205783295","display_name":"Cornell University","ror":"https://ror.org/05bnh6r87","country_code":"US","type":"education","lineage":["https://openalex.org/I205783295"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Harootunian","raw_affiliation_strings":["School of Applied and Engineering Physics and the National Research and Resource Facility for Submicron Structures, Cornell University, Ithaca, New York 14853, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Applied and Engineering Physics and the National Research and Resource Facility for Submicron Structures, Cornell University, Ithaca, New York 14853, USA","institution_ids":["https://openalex.org/I205783295"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067735064","display_name":"Andrew J. Muray","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I205783295","display_name":"Cornell University","ror":"https://ror.org/05bnh6r87","country_code":"US","type":"education","lineage":["https://openalex.org/I205783295"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Muray","raw_affiliation_strings":["School of Applied and Engineering Physics and the National Research and Resource Facility for Submicron Structures, Cornell University, Ithaca, New York 14853, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Applied and Engineering Physics and the National Research and Resource Facility for Submicron Structures, Cornell University, Ithaca, New York 14853, USA","institution_ids":["https://openalex.org/I205783295"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I205783295"],"apc_list":{"value":3760,"currency":"USD","value_usd":3760},"apc_paid":null,"fwci":4.0163,"has_fulltext":false,"cited_by_count":765,"citation_normalized_percentile":{"value":0.93779226,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":100},"biblio":{"volume":"13","issue":"3","first_page":"227","last_page":"231"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12466","display_name":"Near-Field Optical Microscopy","score":0.9887999892234802,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12466","display_name":"Near-Field Optical Microscopy","score":0.9887999892234802,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10295","display_name":"Plasmonic and Surface Plasmon Research","score":0.006800000090152025,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","score":0.0005000000237487257,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/near-field-optical-microscopy","display_name":"near-field optical microscopy","score":0.7509999871253967},{"id":"https://openalex.org/keywords/scanning-optical-microscope","display_name":"scanning optical microscope","score":0.9160000085830688},{"id":"https://openalex.org/keywords/nanoscale-imaging","display_name":"nanoscale imaging","score":0.5799999833106995}],"concepts":[{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.7930774688720703},{"id":"https://openalex.org/C67649825","wikidata":"https://www.wikidata.org/wiki/Q196538","display_name":"Microscope","level":2,"score":0.748529314994812},{"id":"https://openalex.org/C6260449","wikidata":"https://www.wikidata.org/wiki/Q41364","display_name":"Wavelength","level":2,"score":0.6024702787399292},{"id":"https://openalex.org/C77017923","wikidata":"https://www.wikidata.org/wiki/Q912313","display_name":"Optical microscope","level":3,"score":0.5191304087638855},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.49771884083747864},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.4946078956127167},{"id":"https://openalex.org/C205372480","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"Image resolution","level":2,"score":0.4904584586620331},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.47705143690109253},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3048991858959198},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.11567452549934387},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.09538969397544861},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0304-3991(84)90201-8","doi":"https://doi.org/10.1016/0304-3991(84)90201-8","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0304-3991(84)90201-8","pdf_url":null,"source":{"id":"https://openalex.org/S27731274","display_name":"Ultramicroscopy","issn_l":"0304-3991","issn":["0304-3991","1879-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-a","jufo-1","ki-jl-1","medline","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Ultramicroscopy","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2023178948","https://openalex.org/W2030386167","https://openalex.org/W2041521150","https://openalex.org/W2048301834"],"related_works":["https://openalex.org/W4235895367","https://openalex.org/W2049553438","https://openalex.org/W2076207486","https://openalex.org/W2590304456","https://openalex.org/W2067174599","https://openalex.org/W1972861889","https://openalex.org/W1978200017","https://openalex.org/W3035453824","https://openalex.org/W3038587449","https://openalex.org/W1970528721"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":8},{"year":2025,"cited_by_count":10},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":9},{"year":2021,"cited_by_count":11},{"year":2020,"cited_by_count":17},{"year":2019,"cited_by_count":11},{"year":2018,"cited_by_count":15},{"year":2017,"cited_by_count":20},{"year":2016,"cited_by_count":13},{"year":2015,"cited_by_count":26},{"year":2014,"cited_by_count":35},{"year":2013,"cited_by_count":27},{"year":2012,"cited_by_count":45}],"updated_date":"2026-11-10T11:39:43.021295","created_date":"2016-06-24T00:00:00"}