{"id":"https://openalex.org/W1663081586","doi":"https://doi.org/10.1016/0022-0248(95)00315-0","title":"Study of the band offset for heterojunctions grown by hot wall epitaxy","display_name":"Study of the band offset for heterojunctions grown by hot wall epitaxy","publication_year":1996,"publication_date":"1996-02-01","ids":{"openalex":"https://openalex.org/W1663081586","doi":"https://doi.org/10.1016/0022-0248(95)00315-0","mag":"1663081586"},"language":"en","primary_location":{"id":"doi:10.1016/0022-0248(95)00315-0","doi":"https://doi.org/10.1016/0022-0248(95)00315-0","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0022-0248(95)00315-0","pdf_url":null,"source":{"id":"https://openalex.org/S10719676","display_name":"Journal of Crystal Growth","issn_l":"0022-0248","issn":["0022-0248","1873-5002"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Crystal Growth","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022629612","display_name":"Yi Yang","orcid":"https://orcid.org/0000-0003-1528-2592","observed_orcids":["https://orcid.org/0000-0003-1528-2592"]},"institutions":[{"id":"https://openalex.org/I194450716","display_name":"Jilin University","ror":"https://ror.org/00js3aw79","country_code":"CN","type":"education","lineage":["https://openalex.org/I194450716"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yi Yang","raw_affiliation_strings":["Analysis Test and Experiment Center, Jilin University, Changchun 130023, People's Republic of China","Analysis Test and Experiment Center, Jilin #N#University, #N#Changchun 130023, #N#People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analysis Test and Experiment Center, Jilin University, Changchun 130023, People's Republic of China","institution_ids":["https://openalex.org/I194450716"]},{"raw_affiliation_string":"Analysis Test and Experiment Center, Jilin #N#University, #N#Changchun 130023, #N#People's Republic of China","institution_ids":["https://openalex.org/I194450716"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040111673","display_name":"\u6768\u7389\u7428","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I194450716","display_name":"Jilin University","ror":"https://ror.org/00js3aw79","country_code":"CN","type":"education","lineage":["https://openalex.org/I194450716"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yukun Yang","raw_affiliation_strings":["Analysis Test and Experiment Center, Jilin University, Changchun 130023, People's Republic of China","Analysis Test and Experiment Center, Jilin #N#University, #N#Changchun 130023, #N#People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analysis Test and Experiment Center, Jilin University, Changchun 130023, People's Republic of China","institution_ids":["https://openalex.org/I194450716"]},{"raw_affiliation_string":"Analysis Test and Experiment Center, Jilin #N#University, #N#Changchun 130023, #N#People's Republic of China","institution_ids":["https://openalex.org/I194450716"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002446845","display_name":"Wangcheng Li","orcid":"https://orcid.org/0009-0004-7543-4791","observed_orcids":["https://orcid.org/0009-0004-7543-4791"]},"institutions":[{"id":"https://openalex.org/I194450716","display_name":"Jilin University","ror":"https://ror.org/00js3aw79","country_code":"CN","type":"education","lineage":["https://openalex.org/I194450716"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wangcheng Li","raw_affiliation_strings":["Analysis Test and Experiment Center, Jilin University, Changchun 130023, People's Republic of China","Analysis Test and Experiment Center, Jilin #N#University, #N#Changchun 130023, #N#People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analysis Test and Experiment Center, Jilin University, Changchun 130023, People's Republic of China","institution_ids":["https://openalex.org/I194450716"]},{"raw_affiliation_string":"Analysis Test and Experiment Center, Jilin #N#University, #N#Changchun 130023, #N#People's Republic of China","institution_ids":["https://openalex.org/I194450716"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5159675769","display_name":"Wenming Li","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I194450716","display_name":"Jilin University","ror":"https://ror.org/00js3aw79","country_code":"CN","type":"education","lineage":["https://openalex.org/I194450716"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenming Li","raw_affiliation_strings":["Analysis Test and Experiment Center, Jilin University, Changchun 130023, People's Republic of China","Analysis Test and Experiment Center, Jilin #N#University, #N#Changchun 130023, #N#People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analysis Test and Experiment Center, Jilin University, Changchun 130023, People's Republic of China","institution_ids":["https://openalex.org/I194450716"]},{"raw_affiliation_string":"Analysis Test and Experiment Center, Jilin #N#University, #N#Changchun 130023, #N#People's Republic of China","institution_ids":["https://openalex.org/I194450716"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101585189","display_name":"Lei Yu","orcid":"https://orcid.org/0000-0001-5642-8952","observed_orcids":["https://orcid.org/0000-0001-5642-8952"]},"institutions":[{"id":"https://openalex.org/I194450716","display_name":"Jilin University","ror":"https://ror.org/00js3aw79","country_code":"CN","type":"education","lineage":["https://openalex.org/I194450716"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Yu","raw_affiliation_strings":["Analysis Test and Experiment Center, Jilin University, Changchun 130023, People's Republic of China","Analysis Test and Experiment Center, Jilin #N#University, #N#Changchun 130023, #N#People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analysis Test and Experiment Center, Jilin University, Changchun 130023, People's Republic of China","institution_ids":["https://openalex.org/I194450716"]},{"raw_affiliation_string":"Analysis Test and Experiment Center, Jilin #N#University, #N#Changchun 130023, #N#People's Republic of China","institution_ids":["https://openalex.org/I194450716"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5159702036","display_name":"Xin Xiong","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I118803816","display_name":"Liaoning University","ror":"https://ror.org/03xpwj629","country_code":"CN","type":"education","lineage":["https://openalex.org/I118803816"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xin Xiong","raw_affiliation_strings":["Department of Electronic Science and Engineering, Liaoning University, Shenyang 110036, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Science and Engineering, Liaoning University, Shenyang 110036, People's Republic of China","institution_ids":["https://openalex.org/I118803816"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5159670403","display_name":"Shanli Wang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I118803816","display_name":"Liaoning University","ror":"https://ror.org/03xpwj629","country_code":"CN","type":"education","lineage":["https://openalex.org/I118803816"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shanli Wang","raw_affiliation_strings":["Department of Electronic Science and Engineering, Liaoning University, Shenyang 110036, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Science and Engineering, Liaoning University, Shenyang 110036, People's Republic of China","institution_ids":["https://openalex.org/I118803816"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109844914","display_name":"Helan Huang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I118803816","display_name":"Liaoning University","ror":"https://ror.org/03xpwj629","country_code":"CN","type":"education","lineage":["https://openalex.org/I118803816"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Helan Huang","raw_affiliation_strings":["Department of Electronic Science and Engineering, Liaoning University, Shenyang 110036, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Science and Engineering, Liaoning University, Shenyang 110036, People's Republic of China","institution_ids":["https://openalex.org/I118803816"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5022629612"],"corresponding_institution_ids":["https://openalex.org/I194450716"],"apc_list":{"value":3110,"currency":"USD","value_usd":3110},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"158","issue":"4","first_page":"455","last_page":"458"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.9804999828338623,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.9804999828338623,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","score":0.011099999770522118,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.002099999925121665,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/band-offset","display_name":"band offset","score":0.9909999966621399},{"id":"https://openalex.org/keywords/hot-wall-epitaxy","display_name":"hot wall epitaxy","score":0.949999988079071},{"id":"https://openalex.org/keywords/znse-epilayers","display_name":"ZnSe epilayers","score":0.8330000042915344},{"id":"https://openalex.org/keywords/gaas-100-substrate","display_name":"GaAs(100) substrate","score":0.8759999871253967},{"id":"https://openalex.org/keywords/ii-vi-semiconductors","display_name":"II-VI semiconductors","score":0.7200000286102295},{"id":"https://openalex.org/keywords/iii-v-semiconductors","display_name":"III-V semiconductors","score":0.7770000100135803},{"id":"https://openalex.org/keywords/interface-energetics","display_name":"interface energetics","score":0.44999998807907104}],"concepts":[{"id":"https://openalex.org/C79794668","wikidata":"https://www.wikidata.org/wiki/Q1616270","display_name":"Heterojunction","level":2,"score":0.842303454875946},{"id":"https://openalex.org/C175708663","wikidata":"https://www.wikidata.org/wiki/Q899559","display_name":"X-ray photoelectron spectroscopy","level":2,"score":0.8015453815460205},{"id":"https://openalex.org/C110738630","wikidata":"https://www.wikidata.org/wiki/Q1135540","display_name":"Epitaxy","level":3,"score":0.7170900106430054},{"id":"https://openalex.org/C85080765","wikidata":"https://www.wikidata.org/wiki/Q614893","display_name":"Photoluminescence","level":2,"score":0.7086660265922546},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5942597389221191},{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.5070021152496338},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.48671725392341614},{"id":"https://openalex.org/C47592295","wikidata":"https://www.wikidata.org/wiki/Q4854276","display_name":"Band offset","level":4,"score":0.4441341161727905},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.43851983547210693},{"id":"https://openalex.org/C73922627","wikidata":"https://www.wikidata.org/wiki/Q754943","display_name":"Single crystal","level":2,"score":0.4192578196525574},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.37323758006095886},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3291109800338745},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.3056125044822693},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3046227693557739},{"id":"https://openalex.org/C181966813","wikidata":"https://www.wikidata.org/wiki/Q806352","display_name":"Band gap","level":2,"score":0.19826465845108032},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.13460519909858704},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.08785662055015564},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0800582766532898},{"id":"https://openalex.org/C103272658","wikidata":"https://www.wikidata.org/wiki/Q528769","display_name":"Valence band","level":3,"score":0.07154130935668945},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.06866365671157837},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0022-0248(95)00315-0","doi":"https://doi.org/10.1016/0022-0248(95)00315-0","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0022-0248(95)00315-0","pdf_url":null,"source":{"id":"https://openalex.org/S10719676","display_name":"Journal of Crystal Growth","issn_l":"0022-0248","issn":["0022-0248","1873-5002"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Crystal Growth","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W616143378","https://openalex.org/W1555006166","https://openalex.org/W2004967694","https://openalex.org/W2037705859","https://openalex.org/W2041342224","https://openalex.org/W2066036304","https://openalex.org/W2120397207","https://openalex.org/W2561710857","https://openalex.org/W6633356692"],"related_works":["https://openalex.org/W1985985067","https://openalex.org/W2012725325","https://openalex.org/W1808147330","https://openalex.org/W2094179849","https://openalex.org/W1968216669","https://openalex.org/W2001024924","https://openalex.org/W2041342224","https://openalex.org/W2022299623","https://openalex.org/W1927273039","https://openalex.org/W2003130482"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-10-27T15:51:10.671819","created_date":"2016-06-24T00:00:00"}