{"id":"https://openalex.org/W1645150767","doi":"https://doi.org/10.1117/12.49521","title":"Study of electronic shearing speckle technique","display_name":"Study of electronic shearing speckle technique","publication_year":1991,"publication_date":"1991-12-01","ids":{"openalex":"https://openalex.org/W1645150767","doi":"https://doi.org/10.1117/12.49521","mag":"1645150767"},"language":"en","primary_location":{"id":"doi:10.1117/12.49521","doi":"https://doi.org/10.1117/12.49521","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.49521","pdf_url":null,"source":{"id":"https://openalex.org/S7407097117","display_name":"International Conference on Photomechanics and Speckle Metrology","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Second International Conference on Photomechanics and Speckle Metrology: Speckle Techniques, Birefringence Methods, and Applications to Solid Mechanics; Moir\u00e9 Techniques, Holographic Interferometry, Optical NDT, and Applications to Fluid Mechanics","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Xinhua Ji","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinhua Ji","raw_affiliation_strings":["Tianjin Univ. (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tianjin Univ. (China)","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101546087","display_name":"Yuwen Qin","orcid":"https://orcid.org/0000-0001-9879-1514","observed_orcids":["https://orcid.org/0000-0001-9879-1514"]},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuwen Qin","raw_affiliation_strings":["Tianjin Univ. (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tianjin Univ. (China)","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5115694908","display_name":"Jinqi Wang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinqi Wang","raw_affiliation_strings":["Tianjin Univ. (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tianjin Univ. (China)","institution_ids":["https://openalex.org/I162868743"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I162868743"],"apc_list":null,"apc_paid":null,"fwci":0.904,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.66685022,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"78","last_page":"78"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11897","display_name":"Digital Holography and Microscopy","score":0.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fringe-visibility","display_name":"fringe visibility","score":0.902999997138977}],"concepts":[{"id":"https://openalex.org/C102290492","wikidata":"https://www.wikidata.org/wiki/Q7575045","display_name":"Speckle pattern","level":2,"score":0.912690281867981},{"id":"https://openalex.org/C152279782","wikidata":"https://www.wikidata.org/wiki/Q13583542","display_name":"Shearing (physics)","level":2,"score":0.8695695996284485},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.637921154499054},{"id":"https://openalex.org/C172991262","wikidata":"https://www.wikidata.org/wiki/Q5358427","display_name":"Electronic speckle pattern interferometry","level":3,"score":0.5127852559089661},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.4212297797203064},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.34417086839675903},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.31017446517944336},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.27997785806655884},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10138970613479614},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.49521","doi":"https://doi.org/10.1117/12.49521","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.49521","pdf_url":null,"source":{"id":"https://openalex.org/S7407097117","display_name":"International Conference on Photomechanics and Speckle Metrology","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Second International Conference on Photomechanics and Speckle Metrology: Speckle Techniques, Birefringence Methods, and Applications to Solid Mechanics; Moir\u00e9 Techniques, Holographic Interferometry, Optical NDT, and Applications to Fluid Mechanics","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2389987211","https://openalex.org/W1632682214","https://openalex.org/W2014064175","https://openalex.org/W1992338788","https://openalex.org/W2021815539","https://openalex.org/W2032985305","https://openalex.org/W2347752154","https://openalex.org/W2069852763","https://openalex.org/W2016704083","https://openalex.org/W2081569137"],"abstract_inverted_index":{"In":[0],"the":[1,3,7,16,19,24,30,33,62,71,74],"paper,":[2],"feasibility":[4],"of":[5,32,44,70,73],"realizing":[6],"electronic":[8,37,45,65],"shearing":[9,46,66],"speckle":[10,67],"interference":[11,38],"was":[12,27,39],"analysed":[13],"in":[14],"theory,":[15],"formula":[17],"describing":[18],"light":[20],"intensity":[21],"received":[22],"through":[23],"camera":[25],"target":[26],"deduced":[28],"and":[29,52,59],"visibility":[31],"fringes":[34],"formed":[35],"from":[36],"analysed.":[40],"The":[41,64],"three":[42],"methods":[43],"speckle,":[47],"real":[48,53],"time,":[49],"double":[50],"exposure":[51],"time":[54],"interval":[55],"method,":[56],"are":[57],"proposed":[58],"realized":[60],"by":[61],"authors.":[63],"fringe":[68],"patterns":[69],"contours":[72],"displacement":[75],"gradient":[76],"were":[77],"obtained":[78],"too.":[79]},"counts_by_year":[],"updated_date":"2026-10-26T11:51:55.731654","created_date":"2016-06-24T00:00:00"}