{"id":"https://openalex.org/W1635995255","doi":"https://doi.org/10.1063/1.125570","title":"Effective microwave surface resistance of gold-contacted YBa2Cu3O7\u2212x thin films","display_name":"Effective microwave surface resistance of gold-contacted YBa2Cu3O7\u2212x thin films","publication_year":1999,"publication_date":"1999-12-27","ids":{"openalex":"https://openalex.org/W1635995255","doi":"https://doi.org/10.1063/1.125570","mag":"1635995255"},"language":"en","primary_location":{"id":"doi:10.1063/1.125570","doi":"https://doi.org/10.1063/1.125570","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.125570","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113726816","display_name":"A. G. Zaitsev","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"A. G. Zaitsev","raw_affiliation_strings":["Forschungszentrum Karlsruhe, Institut f\u00fcr Nukleare Festk\u00f6rperphysik, P.O. Box 3640, D-76021\u2009Karlsruhe, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Forschungszentrum Karlsruhe, Institut f\u00fcr Nukleare Festk\u00f6rperphysik, P.O. Box 3640, D-76021\u2009Karlsruhe, Germany","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101473686","display_name":"R. Schneider","orcid":"https://orcid.org/0000-0003-2563-8185","observed_orcids":["https://orcid.org/0000-0003-2563-8185"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"R. Schneider","raw_affiliation_strings":["Forschungszentrum Karlsruhe, Institut f\u00fcr Nukleare Festk\u00f6rperphysik, P.O. Box 3640, D-76021\u2009Karlsruhe, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Forschungszentrum Karlsruhe, Institut f\u00fcr Nukleare Festk\u00f6rperphysik, P.O. Box 3640, D-76021\u2009Karlsruhe, Germany","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010864661","display_name":"Jochen Geerk","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. Geerk","raw_affiliation_strings":["Forschungszentrum Karlsruhe, Institut f\u00fcr Nukleare Festk\u00f6rperphysik, P.O. Box 3640, D-76021\u2009Karlsruhe, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Forschungszentrum Karlsruhe, Institut f\u00fcr Nukleare Festk\u00f6rperphysik, P.O. Box 3640, D-76021\u2009Karlsruhe, Germany","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090027428","display_name":"G. Linker","orcid":"https://orcid.org/0000-0001-9416-3588","observed_orcids":["https://orcid.org/0000-0001-9416-3588"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"G. Linker","raw_affiliation_strings":["Forschungszentrum Karlsruhe, Institut f\u00fcr Nukleare Festk\u00f6rperphysik, P.O. Box 3640, D-76021\u2009Karlsruhe, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Forschungszentrum Karlsruhe, Institut f\u00fcr Nukleare Festk\u00f6rperphysik, P.O. Box 3640, D-76021\u2009Karlsruhe, Germany","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080170092","display_name":"F. Ratzel","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"F. Ratzel","raw_affiliation_strings":["Forschungszentrum Karlsruhe, Institut f\u00fcr Nukleare Festk\u00f6rperphysik, P.O. Box 3640, D-76021\u2009Karlsruhe, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Forschungszentrum Karlsruhe, Institut f\u00fcr Nukleare Festk\u00f6rperphysik, P.O. Box 3640, D-76021\u2009Karlsruhe, Germany","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029088609","display_name":"R. Smithey","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"R. Smithey","raw_affiliation_strings":["Forschungszentrum Karlsruhe, Institut f\u00fcr Nukleare Festk\u00f6rperphysik, P.O. Box 3640, D-76021\u2009Karlsruhe, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Forschungszentrum Karlsruhe, Institut f\u00fcr Nukleare Festk\u00f6rperphysik, P.O. Box 3640, D-76021\u2009Karlsruhe, Germany","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.5328,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.87329551,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":95},"biblio":{"volume":"75","issue":"26","first_page":"4165","last_page":"4167"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11803","display_name":"Superconducting and THz Device Technology","score":0.49559998512268066,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11803","display_name":"Superconducting and THz Device Technology","score":0.49559998512268066,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10037","display_name":"Physics of Superconductivity and Magnetism","score":0.3125,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11808","display_name":"Superconducting Materials and Applications","score":0.039000000804662704,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microwave-surface-resistance","display_name":"microwave surface resistance","score":0.9110000133514404},{"id":"https://openalex.org/keywords/ybco-thin-films","display_name":"YBCO thin films","score":0.9390000104904175},{"id":"https://openalex.org/keywords/gold-contacts","display_name":"gold contacts","score":0.7279999852180481},{"id":"https://openalex.org/keywords/disk-resonators","display_name":"disk resonators","score":0.7289999723434448},{"id":"https://openalex.org/keywords/sapphire-substrate","display_name":"sapphire substrate","score":0.6600000262260437},{"id":"https://openalex.org/keywords/london-penetration-depth","display_name":"London penetration depth","score":0.8859999775886536},{"id":"https://openalex.org/keywords/superconducting-thin-films","display_name":"superconducting thin films","score":0.5899999737739563}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8599821925163269},{"id":"https://openalex.org/C66825105","wikidata":"https://www.wikidata.org/wiki/Q354718","display_name":"Sheet resistance","level":3,"score":0.7147862911224365},{"id":"https://openalex.org/C2780064504","wikidata":"https://www.wikidata.org/wiki/Q127583","display_name":"Sapphire","level":3,"score":0.6418769359588623},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.6263589859008789},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.60043865442276},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.5894883871078491},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.5343242287635803},{"id":"https://openalex.org/C193493375","wikidata":"https://www.wikidata.org/wiki/Q1306232","display_name":"Penetration depth","level":2,"score":0.5240072011947632},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.5119696855545044},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4812297821044922},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.46659421920776367},{"id":"https://openalex.org/C97126364","wikidata":"https://www.wikidata.org/wiki/Q349669","display_name":"Resonator","level":2,"score":0.4499257802963257},{"id":"https://openalex.org/C54101563","wikidata":"https://www.wikidata.org/wiki/Q124131","display_name":"Superconductivity","level":2,"score":0.4436430335044861},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.2101646363735199},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.18553799390792847},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.1614096760749817},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07553970813751221},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.125570","doi":"https://doi.org/10.1063/1.125570","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.125570","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W329628002","https://openalex.org/W1972508613","https://openalex.org/W1981492397","https://openalex.org/W2037084185","https://openalex.org/W2055368644","https://openalex.org/W2108174370","https://openalex.org/W2151367056","https://openalex.org/W2330197081","https://openalex.org/W2788533967"],"related_works":["https://openalex.org/W2015683721","https://openalex.org/W1990471505","https://openalex.org/W2001283215","https://openalex.org/W2247050894","https://openalex.org/W3015107749","https://openalex.org/W2073382221","https://openalex.org/W2468078980","https://openalex.org/W1143342287","https://openalex.org/W2000772661","https://openalex.org/W2064620145"],"abstract_inverted_index":{"The":[0,107],"microwave":[1,73],"surface":[2],"resistance":[3],"(Rs)":[4],"of":[5,14,19,33,38,41,49,58,81,90,102,109,121,135,147,180,186,194,203,211],"YBa2Cu3O7\u2212x":[6],"(YBCO)":[7],"films":[8,174,183],"sputtered":[9],"simultaneously":[10],"on":[11,44],"both":[12],"sides":[13],"CeO2":[15],"coated":[16],"sapphire":[17],"wafers":[18],"3":[20],"in.":[21],"diameter":[22],"was":[23,67],"measured":[24],"using":[25],"the":[26,45,50,55,59,64,72,78,82,100,110,122,136,144,148,167,181,192,212],"disk":[27,51],"resonator":[28],"technique":[29],"at":[30],"a":[31,91,103,118,195,199,208],"frequency":[32],"1.92":[34],"GHz.":[35],"By":[36],"deposition":[37,101],"Au":[39,65,105,111,158,196],"layers":[40,159],"various":[42],"thicknesses":[43,161],"unpatterned":[46],"YBCO":[47,61,83,93,154,173,182],"side":[48],"resonator,":[52],"we":[53],"studied":[54],"effective":[56,79,123,145,168,213],"Rs":[57,80,124,146,169],"Au-contacted":[60],"films.":[62],"Although":[63],"layer":[66,205],"not":[68],"directly":[69],"exposed":[70],"to":[71,96,113,126,141,207],"power,":[74],"it":[75],"dramatically":[76],"increased":[77,95],"film.":[84],"For":[85],"example,":[86],"Rs(77":[87],"K)=16.5":[88],"\u03bc\u03a9":[89,98],"300-nm-thick":[92],"film":[94,155],"85":[97],"by":[99],"0.1-\u03bcm-thick":[104],"layer.":[106],"increase":[108,210],"thickness":[112],"1.2":[114],"\u03bcm":[115,164],"resulted":[116],"in":[117,133],"further":[119,209],"enhancement":[120],"up":[125],"560":[127],"\u03bc\u03a9.":[128],"We":[129],"explain":[130],"this":[131,142,204],"effect":[132,193],"terms":[134,185],"impedance":[137],"transformation":[138],"model.":[139],"According":[140],"model":[143],"Au/YBCO":[149],"bilayer":[150],"decreases":[151],"with":[152,160],"increasing":[153],"thickness.":[156],"However,":[157],"above":[162],"1":[163],"considerably":[165],"enhance":[166],"even":[170],"for":[171],"thick":[172],"(700\u2013800":[175],"nm).":[176],"A":[177],"higher":[178],"quality":[179],"(in":[184],"shorter":[187],"London":[188],"penetration":[189],"depths)":[190],"reduces":[191],"layer,":[197],"while":[198],"low":[200],"electrical":[201],"resistivity":[202],"leads":[206],"Rs.":[214]},"counts_by_year":[{"year":2020,"cited_by_count":2}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}