{"id":"https://openalex.org/W158586138","doi":null,"title":"Industrial Test Selection based on Test Time and Defect Coverage","display_name":"Industrial Test Selection based on Test Time and Defect Coverage","publication_year":1999,"publication_date":"1999-11-24","ids":{"openalex":"https://openalex.org/W158586138","mag":"158586138"},"language":"en","primary_location":{"id":"pmh:oai:ris.utwente.nl:openaire_cris_publications/416148f5-05f7-45ee-8929-cc17f71b4e0b","doi":null,"is_oa":false,"landing_page_url":"https://research.utwente.nl/en/publications/416148f5-05f7-45ee-8929-cc17f71b4e0b","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Engin, N & Kerkhoff, H G 1999, Industrial Test Selection based on Test Time and Defect Coverage. in ProRISC99. Mierlo, pp. 139-142.","raw_type":"info:eu-repo/semantics/conferenceObject"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015621274","display_name":"Nur Engin","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"N. Engin","raw_affiliation_strings":["Univ. of Twente#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. of Twente#TAB#","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063280452","display_name":"Hans G. Kerkhoff","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hans G. Kerkhoff","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.02065885,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"139","last_page":"142"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test-case-selection","display_name":"test selection","score":0.6669999957084656},{"id":"https://openalex.org/keywords/defect-coverage","display_name":"defect coverage","score":0.6610000133514404},{"id":"https://openalex.org/keywords/testing-cost","display_name":"test cost","score":0.8510000109672546},{"id":"https://openalex.org/keywords/frequency-domain-testing","display_name":"frequency-domain testing","score":0.8410000205039978},{"id":"https://openalex.org/keywords/total-harmonic-distortion","display_name":"total harmonic distortion","score":0.6669999957084656},{"id":"https://openalex.org/keywords/dc-testing","display_name":"DC testing","score":0.7850000262260437},{"id":"https://openalex.org/keywords/mixed-signal-testing","display_name":"mixed-signal testing","score":0.7039999961853027},{"id":"https://openalex.org/keywords/digital-signal-processor","display_name":"digital signal processor","score":0.6499999761581421},{"id":"https://openalex.org/keywords/production-testing","display_name":"production testing","score":0.4059999883174896}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6508028507232666},{"id":"https://openalex.org/C189430467","wikidata":"https://www.wikidata.org/wiki/Q7293293","display_name":"Ranking (information retrieval)","level":2,"score":0.5886402130126953},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5351221561431885},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.529888927936554},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4779253602027893},{"id":"https://openalex.org/C42156128","wikidata":"https://www.wikidata.org/wiki/Q162641","display_name":"Total harmonic distortion","level":3,"score":0.4559609591960907},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4502703845500946},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.4419749975204468},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.42000916600227356},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.18320953845977783},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.13682255148887634},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"pmh:oai:ris.utwente.nl:openaire_cris_publications/416148f5-05f7-45ee-8929-cc17f71b4e0b","doi":null,"is_oa":false,"landing_page_url":"https://research.utwente.nl/en/publications/416148f5-05f7-45ee-8929-cc17f71b4e0b","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Engin, N & Kerkhoff, H G 1999, Industrial Test Selection based on Test Time and Defect Coverage. in ProRISC99. Mierlo, pp. 139-142.","raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.40.4147","doi":null,"is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.40.4147","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.stw.nl/prorisc/prorisc99/proceedings/engin.pdf","raw_type":"text"},{"id":"pmh:ut:oai:ris.utwente.nl:publications/416148f5-05f7-45ee-8929-cc17f71b4e0b","doi":null,"is_oa":false,"landing_page_url":"https://research.utwente.nl/en/publications/industrial-test-selection-based-on-test-time-and-defect-coverage(416148f5-05f7-45ee-8929-cc17f71b4e0b).html","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ProRISC99, 139 - 142","raw_type":"info:eu-repo/semantics/conferencepaper"},{"id":"mag:158586138","doi":null,"is_oa":false,"landing_page_url":"https://utwente-staging.elsevierpure.com/en/publications/industrial-test-selection-based-on-test-time-and-defect-coverage","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.428600013256073}],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W5693441","https://openalex.org/W177946546","https://openalex.org/W2138186805","https://openalex.org/W2147268379"],"related_works":["https://openalex.org/W1958501220","https://openalex.org/W2137167850","https://openalex.org/W2103937473","https://openalex.org/W2147823627","https://openalex.org/W2119163801","https://openalex.org/W2170093219","https://openalex.org/W7095727541","https://openalex.org/W3035722655","https://openalex.org/W1531696936","https://openalex.org/W2291869705"],"abstract_inverted_index":{"The":[0,84,146],"e#orts":[1],"in":[2,11,28,76,89,107],"testing":[3],"high-volume":[4],"consumer":[5],"ICs":[6,42],"are":[7],"continuously":[8],"under":[9],"pressure":[10],"terms":[12,77],"of":[13,41,67,78],"cost":[14],"and":[15,21,32,51,81,86,100],"guaranteed":[16],"quality.":[17],"Especially":[18],"the":[19,37,90,126,142],"analogue":[20],"mixed-signal":[22],"parts":[23],"often":[24],"require":[25],"complex":[26],"(e.g.":[27,131],"frequency":[29],"domain),":[30],"time-consuming,":[31],"hence":[33],"expensive":[34,111],"tests.":[35],"Moreover,":[36],"anticipated":[38],"quality":[39],"level":[40],"is":[43],"usually":[44],"not":[45],"directly":[46],"related":[47],"to":[48,115],"realistic":[49],"faults":[50],"field":[52],"returns,":[53],"but":[54],"merely":[55],"estimated":[56],"from":[57,96],"practical":[58],"experience.":[59],"In":[60],"this":[61],"paper,":[62],"several":[63],"existing":[64],"production":[65],"tests":[66,113,123,130],"a":[68,149],"commercial":[69],"car":[70],"DSP":[71],"chip":[72],"have":[73,93],"been":[74,94],"evaluated":[75],"test":[79,98],"costs":[80],"defect":[82,127,143],"coverage.":[83,128],"defects":[85],"occurrence":[87],"ranking":[88],"IC":[91],"process/design":[92],"obtained":[95],"statistical":[97],"data":[99],"simulations.":[101],"It":[102],"will":[103],"be":[104,118,135],"shown":[105],"that,":[106],"our":[108],"specific":[109],"case,":[110],"THD":[112],"can,":[114],"some":[116],"extent,":[117],"substituted":[119],"with":[120],"cheap":[121],"DC":[122,138],"without":[124],"reducing":[125],"Existing":[129],"THD)":[132],"can":[133],"also":[134],"enhanced":[136],"by":[137],"tests,":[139],"thereby":[140],"increasing":[141],"coverage":[144],"significantly.":[145],"approach":[147],"makes":[148],"structured":[150],"trad...":[151]},"counts_by_year":[],"updated_date":"2026-09-22T06:50:58.402377","created_date":"2016-06-24T00:00:00"}