{"id":"https://openalex.org/W1584875103","doi":"https://doi.org/10.1109/apede.2004.1393519","title":"A computation program of film attenuator surface resistance of UHF-energy by measured resistance","display_name":"A computation program of film attenuator surface resistance of UHF-energy by measured resistance","publication_year":2005,"publication_date":"2005-04-01","ids":{"openalex":"https://openalex.org/W1584875103","doi":"https://doi.org/10.1109/apede.2004.1393519","mag":"1584875103"},"language":"en","primary_location":{"id":"doi:10.1109/apede.2004.1393519","doi":"https://doi.org/10.1109/apede.2004.1393519","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apede.2004.1393519","pdf_url":null,"source":{"id":"https://openalex.org/S4306423216","display_name":"International Conference on Actual Problems of Electron Devices Engineering","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Conference on Actual Problems of Electron Devices Engineering, 2004. APEDE 2004.","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015216130","display_name":"Elena M. Il'ina","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"E.M. Il'ina","raw_affiliation_strings":["The Federal State Unitary Enterprise SIE Kontao, Saratov, Saratov, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Federal State Unitary Enterprise SIE Kontao, Saratov, Saratov, Russia","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017114809","display_name":"L.V. Pozdnyakov","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"L.V. Pozdnyakov","raw_affiliation_strings":["The Federal State Unitary Enterprise SIE Kontao, Saratov, Saratov, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Federal State Unitary Enterprise SIE Kontao, Saratov, Saratov, Russia","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.07386457,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"5","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.5781000256538391,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.5781000256538391,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.08420000225305557,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14311","display_name":"Electrical and Electromagnetic Research","score":0.06840000301599503,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/surface-resistance","display_name":"surface resistance","score":0.9660000205039978},{"id":"https://openalex.org/keywords/microwave-attenuation","display_name":"microwave attenuation","score":0.574999988079071},{"id":"https://openalex.org/keywords/resistance-measurement","display_name":"resistance measurement","score":0.4560000002384186}],"concepts":[{"id":"https://openalex.org/C174847166","wikidata":"https://www.wikidata.org/wiki/Q1269728","display_name":"Attenuator (electronics)","level":3,"score":0.8677287697792053},{"id":"https://openalex.org/C96122199","wikidata":"https://www.wikidata.org/wiki/Q628096","display_name":"Ultra high frequency","level":2,"score":0.7732924222946167},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5470857620239258},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.5439401268959045},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4412892460823059},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38372769951820374},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.35641956329345703},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.25654739141464233},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25626739859580994},{"id":"https://openalex.org/C184652730","wikidata":"https://www.wikidata.org/wiki/Q2357982","display_name":"Attenuation","level":2,"score":0.23570281267166138},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.21219632029533386},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/apede.2004.1393519","doi":"https://doi.org/10.1109/apede.2004.1393519","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apede.2004.1393519","pdf_url":null,"source":{"id":"https://openalex.org/S4306423216","display_name":"International Conference on Actual Problems of Electron Devices Engineering","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Conference on Actual Problems of Electron Devices Engineering, 2004. APEDE 2004.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4245145545","https://openalex.org/W2596170725","https://openalex.org/W2990126774","https://openalex.org/W4230543414","https://openalex.org/W7111856115","https://openalex.org/W2791866000","https://openalex.org/W7038324774","https://openalex.org/W2158306840","https://openalex.org/W4250696314","https://openalex.org/W6981026620"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-10-26T11:51:55.731654","created_date":"2016-06-24T00:00:00"}