{"id":"https://openalex.org/W1584783710","doi":null,"title":"Dynamic fault tree models: techniques for analysis of advanced fault tolerant computer systems","display_name":"Dynamic fault tree models: techniques for analysis of advanced fault tolerant computer systems","publication_year":1992,"publication_date":"1992-01-01","ids":{"openalex":"https://openalex.org/W1584783710","mag":"1584783710"},"language":"en","primary_location":{"id":"mag:1584783710","doi":null,"is_oa":false,"landing_page_url":"http://dl.acm.org/citation.cfm?id=144077","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103357255","display_name":"Mark Allen Boyd","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Mark Allen Boyd","raw_affiliation_strings":["Duke University Durham NC"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Duke University Durham NC","institution_ids":["https://openalex.org/I170897317"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5103357255"],"corresponding_institution_ids":["https://openalex.org/I170897317"],"apc_list":null,"apc_paid":null,"fwci":2.1526,"has_fulltext":false,"cited_by_count":46,"citation_normalized_percentile":{"value":0.84798061,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.6923999786376953,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.6923999786376953,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.13179999589920044,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.053599998354911804,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dynamic-fault-trees","display_name":"dynamic fault trees","score":0.9779999852180481},{"id":"https://openalex.org/keywords/fault-tree-analysis","display_name":"fault tree analysis","score":0.7929999828338623},{"id":"https://openalex.org/keywords/markov-chains","display_name":"Markov chains","score":0.8629999756813049},{"id":"https://openalex.org/keywords/fault-tolerant-computer-systems","display_name":"fault-tolerant computer systems","score":0.8519999980926514},{"id":"https://openalex.org/keywords/non-repairable-systems","display_name":"non-repairable systems","score":0.8650000095367432},{"id":"https://openalex.org/keywords/system-reliability-analysis","display_name":"system reliability analysis","score":0.6430000066757202},{"id":"https://openalex.org/keywords/model-size-reduction","display_name":"model size reduction","score":0.8460000157356262},{"id":"https://openalex.org/keywords/catastrophic-failure","display_name":"catastrophic failure","score":0.46399998664855957}],"concepts":[{"id":"https://openalex.org/C107094494","wikidata":"https://www.wikidata.org/wiki/Q428453","display_name":"Fault tree analysis","level":2,"score":0.8276927471160889},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7233170866966248},{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.5881507992744446},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.4977248013019562},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.43778643012046814},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.42595288157463074},{"id":"https://openalex.org/C113174947","wikidata":"https://www.wikidata.org/wiki/Q2859736","display_name":"Tree (set theory)","level":2,"score":0.4234333634376526},{"id":"https://openalex.org/C163836022","wikidata":"https://www.wikidata.org/wiki/Q6771326","display_name":"Markov model","level":3,"score":0.41150689125061035},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3281826078891754},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.3000020384788513},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1735665500164032},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.13935816287994385},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11646997928619385},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:1584783710","doi":null,"is_oa":false,"landing_page_url":"http://dl.acm.org/citation.cfm?id=144077","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W7096660844","https://openalex.org/W2542523650","https://openalex.org/W2129588774","https://openalex.org/W1826950235","https://openalex.org/W7097424869","https://openalex.org/W2009942763","https://openalex.org/W2478259543","https://openalex.org/W2120157453","https://openalex.org/W2372476196","https://openalex.org/W1867089059"],"abstract_inverted_index":{"There":[0],"is":[1,31,101,129,164],"a":[2,45,72,125,152],"need":[3],"for":[4,9,27,42,93,132,175],"the":[5,11,25,63,80,108,113,145,157,169,182],"development":[6,57],"of":[7,15,51,58,78,83,111,171,184],"methods":[8,60,174],"evaluating":[10],"vulnerability":[12],"to":[13,35,55],"failure":[14,47],"goods":[16],"or":[17],"systems":[18,26,40],"produced":[19],"using":[20],"advanced":[21],"technology.":[22],"In":[23],"particular,":[24],"which":[28,156],"this":[29,56],"evaluation":[30,59,68],"most":[32],"critical":[33],"tend":[34],"be":[36,88,160],"complex":[37],"fault":[38,66,104,114,147],"tolerant":[39],"intended":[41],"applications":[43],"where":[44],"catastrophic":[46],"can":[48,87,159],"mean":[49],"loss":[50],"life.":[52],"We":[53],"contribute":[54],"by":[61,139],"extending":[62],"traditionally":[64],"combinatorial":[65],"tree":[67,115,148],"method":[69,123],"in":[70,155],"such":[71],"way":[73],"that":[74,86,128],"it":[75,163],"becomes":[76],"capable":[77],"modeling":[79,99,119,122,134],"full":[81],"range":[82],"system":[84],"behavior":[85],"expressed":[89],"with":[90],"Markov":[91,117],"chains":[92],"non-repairable":[94],"systems.":[95],"The":[96],"resulting":[97],"new":[98],"technique":[100],"called":[102],"dynamic":[103,146],"trees":[105],"and":[106,116,179],"combines":[107],"best":[109],"characteristics":[110],"both":[112],"chain":[118],"methods.":[120],"This":[121,166],"requires":[124],"two-step":[126],"procedure":[127],"usually":[130],"needed":[131],"analytical":[133],"methods:":[135],"model":[136,140,158,177],"generation":[137],"followed":[138],"solution.":[141],"To":[142],"further":[143],"extend":[144],"method,":[149],"we":[150],"develop":[151],"one-step":[153],"algorithm":[154],"solved":[161],"as":[162],"generated.":[165],"helps":[167,180],"ease":[168],"use":[170,183],"certain":[172],"approximation":[173],"reducing":[176],"size":[178],"optimize":[181],"computation":[185],"resources.":[186]},"counts_by_year":[{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}