{"id":"https://openalex.org/W1573779398","doi":"https://doi.org/10.1109/test.2002.1041818","title":"Silicon symptoms to solutions: applying design for debug techniques","display_name":"Silicon symptoms to solutions: applying design for debug techniques","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W1573779398","doi":"https://doi.org/10.1109/test.2002.1041818","mag":"1573779398"},"language":"en","primary_location":{"id":"doi:10.1109/test.2002.1041818","doi":"https://doi.org/10.1109/test.2002.1041818","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041818","pdf_url":null,"source":{"id":"https://openalex.org/S4210209697","display_name":"IEEE International Test Conference (ITC)","issn_l":"1089-3539","issn":["1089-3539","2378-2250"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005302919","display_name":"C. Pyron","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1333370159","display_name":"Motorola (United States)","ror":"https://ror.org/01hafxd32","country_code":"US","type":"company","lineage":["https://openalex.org/I1333370159"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C. Pyron","raw_affiliation_strings":["Motorola, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Motorola, Inc., Austin, TX, USA","institution_ids":["https://openalex.org/I1333370159"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017000922","display_name":"R. Bangalore","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1333370159","display_name":"Motorola (United States)","ror":"https://ror.org/01hafxd32","country_code":"US","type":"company","lineage":["https://openalex.org/I1333370159"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Bangalore","raw_affiliation_strings":["Motorola, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Motorola, Inc., Austin, TX, USA","institution_ids":["https://openalex.org/I1333370159"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034983837","display_name":"D. Belete","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1333370159","display_name":"Motorola (United States)","ror":"https://ror.org/01hafxd32","country_code":"US","type":"company","lineage":["https://openalex.org/I1333370159"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. Belete","raw_affiliation_strings":["Motorola, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Motorola, Inc., Austin, TX, USA","institution_ids":["https://openalex.org/I1333370159"]}]},{"author_position":"middle","author":{"id":null,"display_name":"J. Goertz","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1333370159","display_name":"Motorola (United States)","ror":"https://ror.org/01hafxd32","country_code":"US","type":"company","lineage":["https://openalex.org/I1333370159"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Goertz","raw_affiliation_strings":["Motorola, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Motorola, Inc., Austin, TX, USA","institution_ids":["https://openalex.org/I1333370159"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055581027","display_name":"A. Razdan","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1333370159","display_name":"Motorola (United States)","ror":"https://ror.org/01hafxd32","country_code":"US","type":"company","lineage":["https://openalex.org/I1333370159"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Razdan","raw_affiliation_strings":["Motorola, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Motorola, Inc., Austin, TX, USA","institution_ids":["https://openalex.org/I1333370159"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024614516","display_name":"D. Younger","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1333370159","display_name":"Motorola (United States)","ror":"https://ror.org/01hafxd32","country_code":"US","type":"company","lineage":["https://openalex.org/I1333370159"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. Younger","raw_affiliation_strings":["Motorola, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Motorola, Inc., Austin, TX, USA","institution_ids":["https://openalex.org/I1333370159"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1333370159"],"apc_list":null,"apc_paid":null,"fwci":1.1382,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.75764706,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"664","last_page":"672"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.6015999913215637,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.6015999913215637,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.10719999670982361,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.10279999673366547,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/silicon-debug","display_name":"silicon debug","score":0.8550000190734863},{"id":"https://openalex.org/keywords/design-for-debug","display_name":"design for debug","score":0.9879999756813049},{"id":"https://openalex.org/keywords/logical-errors","display_name":"logical errors","score":0.6549999713897705},{"id":"https://openalex.org/keywords/process-variation","display_name":"process variation","score":0.6000000238418579},{"id":"https://openalex.org/keywords/microprocessors","display_name":"microprocessors","score":0.6610000133514404},{"id":"https://openalex.org/keywords/digital-signal-processor","display_name":"digital signal processor","score":0.8889999985694885},{"id":"https://openalex.org/keywords/time-to-market","display_name":"time to market","score":0.5640000104904175}],"concepts":[{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.9375137686729431},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6702508926391602},{"id":"https://openalex.org/C124774103","wikidata":"https://www.wikidata.org/wiki/Q4839640","display_name":"Background debug mode interface","level":3,"score":0.6335346698760986},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5438053011894226},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5396447777748108},{"id":"https://openalex.org/C2780428219","wikidata":"https://www.wikidata.org/wiki/Q16952335","display_name":"Cover (algebra)","level":2,"score":0.5187039971351624},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.4525160789489746},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.4297224283218384},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4227473735809326},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3329501748085022},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22932329773902893},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.15837684273719788},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2002.1041818","doi":"https://doi.org/10.1109/test.2002.1041818","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041818","pdf_url":null,"source":{"id":"https://openalex.org/S4210209697","display_name":"IEEE International Test Conference (ITC)","issn_l":"1089-3539","issn":["1089-3539","2378-2250"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1915537987","https://openalex.org/W1915857416","https://openalex.org/W1933373060","https://openalex.org/W1954467151","https://openalex.org/W2145314233","https://openalex.org/W2165157401"],"related_works":["https://openalex.org/W1554544607","https://openalex.org/W2144605138","https://openalex.org/W2044880808","https://openalex.org/W3140945568","https://openalex.org/W1952649965","https://openalex.org/W2133381043","https://openalex.org/W2148960378","https://openalex.org/W2067700134","https://openalex.org/W3147162234","https://openalex.org/W2587765259"],"abstract_inverted_index":{"Quick":[0],"and":[1,61,68,78,93,97],"accurate":[2],"silicon":[3,18,32,60],"debug":[4,19,43,71],"is":[5,33],"essential":[6],"for":[7,42],"short":[8],"time":[9],"to":[10,22,64,81],"market":[11],"schedules.":[12],"This":[13],"paper":[14],"describes":[15],"several":[16],"actual":[17],"test":[20,51,72,88],"cases":[21,73,89],"illustrate":[23],"both":[24],"the":[25,38,47,55,59,65,87],"range":[26,39],"of":[27,40],"issues":[28,75],"found":[29,57],"only":[30],"after":[31],"available":[34],"as":[35,37],"well":[36],"design":[41],"features":[44],"used":[45],"in":[46,86],"diagnostic":[48],"process.":[49],"Each":[50],"case":[52],"starts":[53],"with":[54],"symptoms":[56],"on":[58],"follows":[62],"through":[63],"problem":[66],"definition":[67],"resolution.":[69],"The":[70,84],"cover":[74],"from":[76],"logic":[77],"circuit":[79],"errors":[80],"process":[82],"issues.":[83],"designs":[85],"include":[90],"Motorola's":[91],"MPC7410":[92],"MPC7450":[94],"advanced":[95],"microprocessors":[96],"DSP56621":[98],"digital":[99],"signal":[100],"processor.":[101]},"counts_by_year":[{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-11-06T12:05:46.655746","created_date":"2016-06-24T00:00:00"}