{"id":"https://openalex.org/W1557789337","doi":null,"title":"Multiple-beam interferometry of surfaces and films","display_name":"Multiple-beam interferometry of surfaces and films","publication_year":1948,"publication_date":"1948-01-01","ids":{"openalex":"https://openalex.org/W1557789337","mag":"1557789337"},"language":"en","primary_location":{"id":"mag:1557789337","doi":null,"is_oa":false,"landing_page_url":"http://ci.nii.ac.jp/ncid/BA12204624","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},"volume":null,"type":"book","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025545692","display_name":"Samuel Tolansky","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"S. Tolansky","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":["https://openalex.org/A5025545692"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":10.0,"has_fulltext":false,"cited_by_count":740,"citation_normalized_percentile":{"value":1.0,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.926800012588501,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.926800012588501,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.058400001376867294,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.006300000008195639,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/multiple-beam-interferometry","display_name":"multiple-beam interferometry","score":0.9959999918937683},{"id":"https://openalex.org/keywords/surface-measurement","display_name":"surface measurement","score":0.5059999823570251},{"id":"https://openalex.org/keywords/thin-film-thickness-measurement","display_name":"thin film thickness measurement","score":0.656000018119812},{"id":"https://openalex.org/keywords/optical-interferometry","display_name":"optical interferometry","score":0.656000018119812}],"concepts":[{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.7600345611572266},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5389121174812317},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5007803440093994},{"id":"https://openalex.org/C168834538","wikidata":"https://www.wikidata.org/wiki/Q3705329","display_name":"Beam (structure)","level":2,"score":0.4444270133972168},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2528190612792969}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:1557789337","doi":null,"is_oa":false,"landing_page_url":"http://ci.nii.ac.jp/ncid/BA12204624","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4231059347","https://openalex.org/W2582446340","https://openalex.org/W3184789364","https://openalex.org/W644116616","https://openalex.org/W4245590814","https://openalex.org/W2049678644","https://openalex.org/W2315054596","https://openalex.org/W4247524362","https://openalex.org/W2983539914","https://openalex.org/W4256365683"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":9},{"year":2019,"cited_by_count":14},{"year":2018,"cited_by_count":14},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":11},{"year":2015,"cited_by_count":9},{"year":2014,"cited_by_count":14},{"year":2013,"cited_by_count":11},{"year":2012,"cited_by_count":14}],"updated_date":"2026-11-03T10:50:19.383937","created_date":"2016-06-24T00:00:00"}