{"id":"https://openalex.org/W1551948422","doi":"https://doi.org/10.1109/mikon.2002.1017891","title":"Influence of the milling depth on the microstrip parameters in milled PCB-plates for microwave applications","display_name":"Influence of the milling depth on the microstrip parameters in milled PCB-plates for microwave applications","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W1551948422","doi":"https://doi.org/10.1109/mikon.2002.1017891","mag":"1551948422"},"language":"en","primary_location":{"id":"doi:10.1109/mikon.2002.1017891","doi":"https://doi.org/10.1109/mikon.2002.1017891","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mikon.2002.1017891","pdf_url":null,"source":{"id":"https://openalex.org/S4306419681","display_name":"International Conference on Microwaves, Radar & Wireless Communications","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"14th International Conference on Microwaves, Radar and Wireless Communications. MIKON - 2002. Conference Proceedings (IEEE Cat.No.02EX562)","raw_type":"proceedings-article"},"parent_works":[],"lineage":["https://openalex.org/W1551948422"],"child_works_count":0,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027878478","display_name":"Mario Gachev","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M. Gatchev","raw_affiliation_strings":["Sky Gate Limited, Sofia, Bulgaria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sky Gate Limited, Sofia, Bulgaria","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045656425","display_name":"Stanimir D. Kamenopolsky","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. Kamenopolsky","raw_affiliation_strings":["Sky Gate Limited, Sofia, Bulgaria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sky Gate Limited, Sofia, Bulgaria","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081963612","display_name":"V. Bojanov","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"V. Bojanov","raw_affiliation_strings":["Sky Gate Limited, Sofia, Bulgaria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sky Gate Limited, Sofia, Bulgaria","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019185168","display_name":"Plamen I. Dankov","orcid":"https://orcid.org/0000-0002-6537-3217","observed_orcids":["https://orcid.org/0000-0002-6537-3217"]},"institutions":[{"id":"https://openalex.org/I58918642","display_name":"Sofia University \"St. Kliment Ohridski\"","ror":"https://ror.org/02jv3k292","country_code":"BG","type":"education","lineage":["https://openalex.org/I58918642"]}],"countries":["BG"],"is_corresponding":false,"raw_author_name":"P. Dankov","raw_affiliation_strings":["Faculty of Physics, Sofia University, Sofia, Bulgaria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Physics, Sofia University, Sofia, Bulgaria","institution_ids":["https://openalex.org/I58918642"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":97},"biblio":{"volume":"2","issue":null,"first_page":"476","last_page":"479"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.002899999963119626,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.0020000000949949026,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/milling-depth","display_name":"milling depth","score":0.9409999847412109},{"id":"https://openalex.org/keywords/microstrip-line","display_name":"microstrip line","score":0.9210000038146973},{"id":"https://openalex.org/keywords/printed-circuit-boards","display_name":"printed circuit boards","score":0.8029999732971191},{"id":"https://openalex.org/keywords/dielectric-thickness","display_name":"dielectric thickness","score":0.6980000138282776},{"id":"https://openalex.org/keywords/attenuation","display_name":"attenuation","score":0.7870000004768372},{"id":"https://openalex.org/keywords/phase-lag","display_name":"phase lag","score":0.9860000014305115},{"id":"https://openalex.org/keywords/effective-permittivity","display_name":"effective permittivity","score":0.9980000257492065},{"id":"https://openalex.org/keywords/characteristic-impedance","display_name":"characteristic impedance","score":0.9200000166893005},{"id":"https://openalex.org/keywords/microwave-applications","display_name":"microwave applications","score":0.5770000219345093}],"concepts":[{"id":"https://openalex.org/C123657345","wikidata":"https://www.wikidata.org/wiki/Q639055","display_name":"Microstrip","level":2,"score":0.8356449604034424},{"id":"https://openalex.org/C124772163","wikidata":"https://www.wikidata.org/wiki/Q193255","display_name":"Plotter","level":2,"score":0.8088876605033875},{"id":"https://openalex.org/C184652730","wikidata":"https://www.wikidata.org/wiki/Q2357982","display_name":"Attenuation","level":2,"score":0.7608435153961182},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.7348288893699646},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7318822145462036},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.6279315948486328},{"id":"https://openalex.org/C172674978","wikidata":"https://www.wikidata.org/wiki/Q1164612","display_name":"Characteristic impedance","level":3,"score":0.49182820320129395},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.48240649700164795},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.43749913573265076},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4167027473449707},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.35016030073165894},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3427146077156067},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.3321978449821472},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.28084903955459595},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1819983422756195},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16961687803268433},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.1685594916343689},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.13522693514823914},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10370877385139465},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.06831887364387512},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mikon.2002.1017891","doi":"https://doi.org/10.1109/mikon.2002.1017891","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mikon.2002.1017891","pdf_url":null,"source":{"id":"https://openalex.org/S4306419681","display_name":"International Conference on Microwaves, Radar & Wireless Communications","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"14th International Conference on Microwaves, Radar and Wireless Communications. MIKON - 2002. Conference Proceedings (IEEE Cat.No.02EX562)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1832516285","https://openalex.org/W2021785780","https://openalex.org/W2129742637","https://openalex.org/W2164247957"],"related_works":["https://openalex.org/W2123842162","https://openalex.org/W4401322845","https://openalex.org/W1993645360","https://openalex.org/W2147572754","https://openalex.org/W2062848627","https://openalex.org/W2016300007","https://openalex.org/W3031344303","https://openalex.org/W1977738905","https://openalex.org/W2088608884","https://openalex.org/W2122613965"],"abstract_inverted_index":{"Influence":[0],"of":[1,32,54],"the":[2,6,30,33,41,55,61],"milling":[3,27,57],"depth":[4,28],"on":[5],"microstrip":[7,62],"line":[8,63],"parameters":[9],"(attenuation,":[10],"phase":[11],"delay,":[12],"effective":[13],"dielectric":[14,34],"constant":[15],"and":[16,20],"impedance)":[17],"is,":[18],"experimentally":[19],"numerically":[21],"investigated":[22],"in":[23],"this":[24],"paper.":[25],"The":[26,47],"denotes":[29],"thickness":[31],"layer,":[35],"which":[36,60],"is":[37],"removed":[38],"during":[39],"to":[40],"manufacturing":[42],"procedure":[43],"by":[44],"milling-cutter":[45],"plotter.":[46],"obtained":[48],"data":[49],"are":[50,65],"used":[51],"for":[52,59],"estimation":[53],"optimal":[56],"depth,":[58],"performances":[64],"not":[66],"strongly":[67],"affected.":[68]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":3}],"updated_date":"2026-10-26T11:51:55.731654","created_date":"2016-06-24T00:00:00"}